Method and system for testing the accuracy of a thermocouple probe used to measure the temperature of molten steel

• US 6,139,180 A
• Filed: 03/27/1998
• Issued: 10/31/2000
• Est. Priority Date: 03/27/1998
• Status: Expired due to Fees

• Current Assignee: Vesuvius Crucible Company (Vesuvius Plc)
• Original Assignee: Vesuvius Crucible Company (Vesuvius Plc)
• Inventors: Usher, John D., Kirkpatrick, Todd A.
• Primary Examiner(s): Berhane, Adolf Deneke
• Assistant Examiner(s): TIBBITS, PIA FLORENCE
• Application Number:
  US09/049,154
• Time in Patent Office: 949 Days
• Field of Search: 374/1, 374/139, 374/140, 374/179, 702/99
• US Class Current: 374/1
• CPC Class Codes: G01K 7/026 Arrangements for signalling failure or disconnection of thermocouples

Abstract

A method and system for testing the accuracy of a thermocouple probe exposed to a medium having a temperature of between about 2200° F. and 3400° F. is provided that includes the step of measuring the rate of change of the temperature readings of the probe after a temperature of at least 2000° F. is read, and comparing the measured rate of change with a standard rate of change obtained from a properly operating probe. Both the method and the system are advantageously capable of determining whether the temperature readings of a thermocouple in use in a steel production plant are accurate without the need for comparative readings from other thermocouple probes.

Claims

1. A method for testing the accuracy of a temperature probe exposed to a medium having a temperature of between about 2200°

F. and 3400°

F., comprising the steps of

measuring the rate of change of the temperature readings of the probe after a temperature of at least 2000°

F. is read,

comparing the measured rate of change with a standard rate of change obtained from a properly operating probe, and

declaring the temperature probe to be inaccurate whenever the rate of change deviates significantly from the standard rate of change.

2. The method for testing the accuracy of a temperature probe as defined in claim 1, wherein said rate of change of the temperature readings is measured from at least about the last 400°

F. of an expected final temperature reading.

3. The method for testing the accuracy of a temperature probe as defined in claim 2, wherein said rate of change of the temperature readings is measured from about the last 300°

F. of an expected final temperature reading.

4. The method for testing the accuracy of a temperature probe as defined in claim 1, wherein said rate of change of temperature readings is measured after a temperature of about 2300°

F. is read.

5. The method for testing the accuracy of a temperature probe as defined in claim 1, wherein said medium is liquid steel, and said rate of change of the temperature readings is measured after a temperature of about 2500°

F. is read.

6. The method for testing the accuracy of a temperature probe as defined in claim 1, wherein said medium is liquid metal, and said probe includes a thermocouple encased in a ceramic jacket.

7. The method for testing the accuracy of a temperature probe as defined in claim 1, wherein the rate of change of said temperature readings is measured by periodically computing the value of τ

from the following expression;

space="preserve" listing-type="equation">τ

=t/(ln((T.sub.1 -T.sub.0)/(T.sub.1 -T))

where T equals the temperature displayed by the probe t seconds after the temperature of a medium surrounding the probe changes from an ambient temperature T₀ to a temperature T₁ between about 2200°

F. and 3400°

F. of said medium.

8. The method for testing the accuracy of a temperature probe as defined in claim 7, wherein the value of τ

is computed at least every 30 seconds after T≧

2000°

F.

9. The method for testing the accuracy of a temperature probe as defined in claim 7, wherein the temperature of the medium is between about 2700°

F. and 3000°

F., and wherein the value of τ

is computed at least every 30 seconds after T=2500°

F.

10. The method for testing the accuracy of a temperature probe as defined in claim 7 further comprising the steps of determining whether the value of τ

diminishes or increases over time, and declaring unreliable a probe having increasing values of τ

over time.

11. A method for testing the accuracy of a thermocouple probe exposed to liquid metal having a temperature of between about 2200°

F. and 3400°

F., comprising the steps of;

measuring the rate of change of the temperature readings of the probe after a temperature of at least 2000°

F. is read, and

comparing the measured rate of change with a standard rate of change obtained from a properly operating probe.

12. The method for testing the accuracy of a thermocouple probe as defined in claim 11, wherein said rate of change is measured after the probe reads a temperature of between 2000°

F. and 2500°

F.

13. The method for testing the accuracy of a thermocouple probe as defined in claim 11, wherein said rate of change of the temperature readings is measured from about the last 400°

F., from an expected final temperature reading.

14. The method for testing the accuracy of a thermocouple probe as defined in claim 11, wherein said rate of change of said temperature readings is measured by periodically computing the value of τ

from the following expression;

space="preserve" listing-type="equation">τ

=t/(ln((T.sub.1 -T.sub.0)/(T.sub.1 -T))

wherein T equals the temperature displayed by the probe t seconds after the probe has been taken from an ambient temperature T₀ to immersion in said liquid metal at a temperature T₁ at a temperature between about 2600°

F. and 3100°

F.

15. The method for testing the accuracy of a thermocouple probe as defined in claim 14, wherein the value of τ

is computed at least every 30 seconds after T equals 2500°

F.

16. A system for testing the accuracy of a temperature probe exposed to a medium having a temperature of between about 2200°

F. and 3400°

F., comprising;

a temperature probe, and

means for measuring the rate of change of temperature readings of the probe after said probe reads a temperature of at least 2000°

F.;

comparing the measured rate of change with a standard rate of change obtained from a properly operating probe, wherein the rate of change is determined by periodically computing a value of τ

from the following expression;

space="preserve" listing-type="equation">τ

=t/(ln((T.sub.1 -T.sub.0)/(T.sub.1 -T)))

where T equals the temperature displayed by the probe t seconds after displaying a temperature of T₀ when immersed in a medium of a temperature T₁ ; and

declaring the temperature probe to be inaccurate whenever the rate of change deviates significantly from the standard rate of change.

17. The system for testing the accuracy of a temperature probe as defined in claim 16, wherein said means for measuring and comparing includes the combination of microprocessor means and a timing circuit.

18. The system for testing the accuracy of a temperature probe as defined in claim 17, wherein T₀ is at least 2200°

F.

19. The system for testing the accuracy of a temperature probe as defined in claim 17, wherein said microprocessor means includes a means for generating comparative graphs of said rate of change of the temperature readings of the probe being tested and said standard rate of change.

20. The system for testing the accuracy of a temperature probe as defined in claim 16, wherein said temperature probe is a thermocouple contained within a ceramic jacket.