Input sampling structure for delta-sigma modulator

• US 6,147,631 A
• Filed: 12/09/1998
• Issued: 11/14/2000
• Est. Priority Date: 12/09/1998
• Status: Expired due to Term

• Current Assignee: Cirrus Logic Incorporated
• Original Assignee: Cirrus Logic Incorporated
• Inventors: Crawley, Philip John, Maulik, Prabir C.
• Primary Examiner(s): YOUNG, BRIAN K
• Application Number:
  US09/208,712
• Time in Patent Office: 706 Days
• Field of Search: 341/143, 341/172, 341/122, 341/123
• US Class Current: 341/122
• CPC Class Codes: H03M 3/35 using redundancy
• CPC Class Codes: H03M 3/43 the quantiser being a single bit one
• CPC Class Codes: H03M 3/452 with weighted feedforward summation, i.e. with feedforward paths from more than one filter stage to the quantiser input
• CPC Class Codes: H03M 3/496 Details of sampling arrangements or methods

Abstract

A signal processing circuit includes a main input sampling structure with an integrator operational amplifier and input lines including a switched capacitor. The input lines have switched connections to input signal lines and reference signal lines. A replica sampling structure is used in combination with the main input sampling structure to eliminate or reduce signal-dependent current that is drawn from the input signal line and the reference signal line. The replica sampler includes buffered input lines and switched capacitor of the input sampling structure but the capacitors have switched connections to the reference signal lines such that the connections have opposite polarity to the connections of the reference signal line to the input sampling structure. The replica sampler eliminates or reduces signal-dependent current from the reference signal lines. Buffering of the input lines in the replica sampler eliminates or reduces the signal-dependent current drawn from the input signal lines. The structure efficiently allows the use of a smaller capacitance for the same performance.

Claims

1. An input sampling circuit comprising:

main input sampling structure comprising;

an integrator having a positive input terminal and a negative input terminal;

a first capacitor; and

a first plurality of switches for selectively connecting the first capacitor to a common mode voltage, the negative input terminal, a first input signal line, a first reference line, and a second reference line; and

a first replica input sampling structure coupled to the main input sampling structure, the first replica input sampling structure comprising;

a first buffer connected to the first input signal line, the first buffer reducing the signal dependent current from the first input signal thereby reducing gain error;

a second capacitor; and

a second plurality of switches for selectively connecting the second capacitor to the common mode voltage, the first buffer, and the first and second reference lines such that a signal-dependent current that is drawn from the reference signal lines is cancelled in the main input sampler.

2. The input sampling structure of claim 1, wherein the main input sampling structure further comprises:

a third capacitor; and

a third plurality of switches selectively connecting the third capacitor to a common mode voltage, the positive input terminal, a second input signal line, the first reference line, and the second reference line.

3. The input sampling structure of claim 2 further comprises:

a second replica input sampling structure coupled to the main input sampling structure, the second replica input sampling structure comprising;

a second buffer connected to the second input signal line, the second buffer reducing the signal dependent current from the second input signal thereby reducing gain error;

a fourth capacitor;

a fourth plurality of switches selectively connecting the second capacitor to the common mode voltage, the second buffer, and the first and second reference lines such that a signal-dependent current that is drawn from the reference signal lines is cancelled in the main input sampler.

4. The input sampling structure of claim 3, wherein the first plurality of switches comprises:

a first switch connected between the common mode voltage and the first capacitor, the first switch is controlled using a Φ

₁ control signal;

a second switch connected between the negative input terminal of the integrator and the first capacitor, the second switch is controlled using a Φ

₂ control signal that is approximately 180 degree out of phase relative to the Φ

₁ control signal;

a third switch connected between the first input signal line and the first capacitor, the third switch is controlled using a Φ

_1D control signal, wherein the Φ

_1D control signal is slightly delayed in phase relative to the Φ

₁ control signal;

a fourth switch connected between the first reference line and the first capacitor, the fourth switch is controlled using a Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with a B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal; and

a fifth switch connected between the second reference line and the first capacitor, the fifth switch is controlled using a Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with a B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal and the B signal is the inverse of the B signal.

5. The input sampling structure of claim 4, wherein the second plurality of switches comprises:

a sixth switch connected between the common mode voltage and the second capacitor, the sixth switch is controlled using the Φ

₁ control signal;

a seventh switch connected between the common mode voltage and the second capacitor, the seventh switch is controlled using the Φ

₂ control signal that is approximately 180 degree out of phase relative to the Φ

₁ control signal;

an eighth switch connected between the first buffer and the second capacitor, the eighth switch is controlled using the Φ

_1D control signal, wherein the Φ

_1D control signal is slightly delayed in phase relative to the Φ

₁ control signal;

a ninth switch connected between the first reference line and the second capacitor, the ninth switch is controlled using the Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with the B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal and the B signal is the inverse of the B signal; and

a tenth switch connected between the second reference line and the second capacitor, the tenth switch is controlled using the Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with the B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal.

6. The input sampling structure of claim 5, wherein the third plurality of switches comprises:

an eleventh switch connected between the common mode voltage and the third capacitor, the first switch is controlled using the Φ

₁ control signal;

a twelfth switch connected between the positive input terminal of the integrator and the third capacitor, the twelfth switch is controlled using the Φ

₂ control signal that is approximately 180 degree out of phase relative to the Φ

₁ control signal;

a thirteenth switch connected between the second input signal line and the third capacitor, the thirteenth switch is controlled using the Φ

_1D control signal, wherein the Φ

_1D control signal is slightly delayed in phase relative to the Φ

₁ control signal;

a fourteenth switch connected between the first reference line and the third capacitor, the fourteenth switch is controlled using the Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with the B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal and the B signal is the inverse of the B signal; and

a fifteenth switch connected between the second reference line and the third capacitor, the fifteenth switch is controlled using the Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with the B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal.

7. The input sampling structure of claim 6, wherein the fourth plurality of switches comprises:

a sixteenth switch connected between the common mode voltage and the fourth capacitor, the sixteenth switch is controlled using the Φ

₁ control signal

a seventeenth switch connected between the common mode voltage and the fourth capacitor, the seventh switch is controlled using the Φ

₂ control signal that is approximately 180 degree out of phase relative to the Φ

_1D control signal;

an eighteenth switch connected between the second buffer and the fourth capacitor, the eighteenth switch is controlled using the Φ

_1D control signal, wherein the Φ

_1D control signal is slightly delayed in phase relative to the Φ

₁ control signal;

a nineteenth switch connected between the first reference line and the fourth capacitor, the nineteenth switch is controlled the Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with the B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal; and

a twentieth switch connected between the second reference line and the fourth capacitor, the twentieth switch is controlled using the Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with the B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal and the B signal is the inverse of the B signal.

8. The input sampling structure of claim 1, wherein the integrator is an integrator operational amplifier.

9. An analog-to-digital converter (ADC) comprising:

a digital filter;

a delta-sigma modulator coupled to the digital filter, the delta-sigma modulator comprising;

a main input sampling structure comprising;

an integrator having a positive input terminal and a negative input terminal;

a first capacitor; and

a first plurality of switches for selectively connecting the first capacitor to a common mode voltage, the negative input terminal, a first input signal line, a first reference line, and a second reference line; and

a first replica input sampling structure coupled to the main input sampling structure, the first replica input sampling structure comprising;

a first buffer connected to the first input signal line, the first buffer reducing the signal dependent current from the first input signal thereby reducing gain error;

a second capacitor; and

a second plurality of switches for selectively connecting the second capacitor to the common mode voltage, the first buffer, and the first and second reference lines such that a signal-dependent current that is drawn from the reference signal lines is cancelled in the main input sampler.

10. The ADC of claim 9, wherein the main input sampling structure further comprises:

a third capacitor; and

a third plurality of switches selectively connecting the third capacitor to a common mode voltage, the positive input terminal, a second input signal line, the first reference line, and the second reference line.

11. The ADC of claim 10 further comprises:

a second replica input sampling structure coupled to the main input sampling structure, the second replica input sampling structure comprising;

a second buffer connected to the second input signal line, the second buffer reducing the signal dependent current from the second input signal thereby reducing gain error;

a fourth capacitor;

a fourth plurality of switches selectively connecting the second capacitor to the common mode voltage, the second buffer, and the first and second reference lines such that a signal-dependent current that is drawn from the reference signal lines is cancelled in the main input sampler.

12. The ADC of claim 11, wherein the first plurality of switches comprises:

a first switch connected between the common mode voltage and the first capacitor, the first switch is controlled using a Φ

₁ control signal;

a second switch connected between the negative input terminal of the integrator and the first capacitor, the second switch is controlled using a Φ

₂ control signal that is approximately 180 degree out of phase relative to the Φ

₁ control signal;

a third switch connected between the first input signal line and the first capacitor, the third switch is controlled using a Φ

_1D control signal, wherein the Φ

_1D control signal is slightly delayed in phase relative to the Φ

₁ control signal;

a fourth switch connected between the first reference line and the first capacitor, the fourth switch is controlled using a Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with a B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal and the B signal is an output from the delta-sigma modulator; and

a fifth switch connected between the second reference line and the first capacitor, the fifth switch is controlled using a Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with a B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal and the B signal is the inverse of the B signal.

13. The ADC of claim 12, wherein the second plurality of switches comprises:

a sixth switch connected between the common mode voltage and the second capacitor, the sixth switch is controlled using the Φ

₁ control signal;

a seventh switch connected between the common mode voltage and the second capacitor, the seventh switch is controlled using the Φ

₂ control signal that is approximately 180 degree out of phase relative to the Φ

₁ control signal;

an eighth switch connected between the first buffer and the second capacitor, the eighth switch is controlled using the Φ

_1D control signal, wherein the Φ

_1D control signal is slightly delayed in phase relative to the Φ

₁ control signal;

a ninth switch connected between the first reference line and the second capacitor, the ninth switch is controlled using the Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with the B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal and the B signal is the inverse of the B signal; and

a tenth switch connected between the second reference line and the second capacitor, the tenth switch is controlled using the Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with the B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal and the B signal is an output from the delta-sigma modulator.

14. The ADC of claim 13, wherein the third plurality of switches comprises:

an eleventh switch connected between the common mode voltage and the third capacitor, the first switch is controlled using the Φ

₁ control signal;

a twelfth switch connected between the positive input terminal of the integrator and the third capacitor, the twelfth switch is controlled using the Φ

₂ control signal that is approximately 180 degree out of phase relative to the Φ

₁ control signal;

a thirteenth switch connected between the second input signal line and the third capacitor, the thirteenth switch is controlled using the Φ

_1D control signal, wherein the Φ

_1D control signal is slightly delayed in phase relative to the Φ

₁ control signal;

a fourteenth switch connected between the first reference line and the third capacitor, the fourteenth switch is controlled using the Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with the B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal and the B signal is the inverse of the B signal; and

a fifteenth switch connected between the second reference line and the third capacitor, the fifteenth switch is controlled using the Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with the B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal and the B signal is an output from the delta-sigma modulator.

15. The ADC of claim 14, wherein the fourth plurality of switches comprises:

a sixteenth switch connected between the common mode voltage and the fourth capacitor, the sixteenth switch is controlled using the Φ

₁ control signal

a seventeenth switch connected between the common mode voltage and the fourth capacitor, the seventh switch is controlled using the Φ

₂ control signal that is approximately 180 degree out of phase relative to the Φ

₁ control signal;

an eighteenth switch connected between the second buffer and the fourth capacitor, the eighteenth switch is controlled using the Φ

_1D control signal, wherein the Φ

_1D control signal is slightly delayed in phase relative to the Φ

₁ control signal;

a nineteenth switch connected between the first reference line and the fourth capacitor, the nineteenth switch is controlled the Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with the B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal and the B signal is an output from the delta-sigma modulator; and

a twentieth switch connected between the second reference line and the fourth capacitor, the twentieth switch is controlled using the Φ

_2D. B control signal generated by ANDing the Φ

_2D signal with the B signal, wherein the Φ

_2D control signal is slightly delayed in phase relative to the Φ

₂ control signal and the B signal is the inverse of the B signal.

16. The ADC of claim 9, wherein the integrator is an integrator operational amplifier.

17. A method for reducing distortion and gain errors in an input sampling circuit having a main input sampling structure comprising an integrator having a positive input terminal and a negative input terminal, a first capacitor, and a first plurality of switches for selectively connecting the first capacitor to a common mode voltage, the negative input terminal, a first input signal line, a first reference line, and a second reference line, the method comprising:

coupling a first replica input sampling structure to the main input sampling structure, the first replica input sampling structure comprising a first buffer, a second capacitor, and a second plurality of switches for selectively connecting the second capacitor to the common mode voltage, the first buffer, and the first and second reference lines;

buffering the first input signal line using the first buffer to reduce signal dependent current from the first input signal line; and

controlling connections of the first and second reference signal lines to the second capacitor in the first replica input sampling structure such that a signal-dependent current that is drawn from the reference signal lines is cancelled in the main input sampler.

18. The method of claim 17, wherein the main input sampling structure further comprising a third capacitor and a third plurality of switches selectively connecting the third capacitor to a common mode voltage, the positive input terminal, a second input signal line, the first reference line, and the second reference line, the method further comprising the steps of:

coupling a second replica input sampling structure to the main input sampling structure, the replica input sampling structure comprising a second buffer, a fourth capacitor, and a fourth plurality of switches for selectively connecting the fourth capacitor to the common mode voltage, the second buffer, and the first and second reference lines;

buffering the second input signal line using the second buffer to reduce signal dependent current from the second input signal line; and

controlling connections of the first and second reference signal lines to the fourth capacitor in the second replica input sampling structure such that a signal-dependent current that is drawn from the reference signal lines is cancelled in the main input sampler.