Direct temperature sensing of a semiconductor device semiconductor device
First Claim
1. An apparatus for measuring the temperature of a device of interest, comprising:
- a first substrate on which is formed the device of interest;
a temperature sensor formed on the first substrate, the temperature sensor including a first junction diode and a second junction diode; and
a temperature sensor signal processing circuit formed on a second substrate and configured to have as an input a signal provided by the temperature sensor, wherein the temperature sensor signal processing circuit further comprises;
a circuit operable to provide a first current level to the temperature sensor and to measure a first output voltage at an output node of the temperature sensor, and to provide a second current level to the temperature sensor and to measure a second output voltage at the output node of the temperature sensor; and
a switch operable to selectively route the first current level through the first junction diode and the second current level through the second junction diode, and to selectively route the first current level through the second junction diode and the second current level through the first junction diode.
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Accused Products
Abstract
An apparatus and method for directly measuring the operating temperature of a semiconductor device. A temperature sensor is placed directly on the substrate containing the device whose temperature is of interest. The circuitry used to process the sensor signals is on a separate substrate. Because the sensor is on the same substrate as the device of interest, noise is produced in the sensor signals as a result of electrons injected into the substrate by the device. The present invention includes methods for cancelling the noise and error in the temperature measurements to provide a very accurate determination of the device'"'"'s operating temperature.
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Citations
16 Claims
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1. An apparatus for measuring the temperature of a device of interest, comprising:
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a first substrate on which is formed the device of interest; a temperature sensor formed on the first substrate, the temperature sensor including a first junction diode and a second junction diode; and a temperature sensor signal processing circuit formed on a second substrate and configured to have as an input a signal provided by the temperature sensor, wherein the temperature sensor signal processing circuit further comprises; a circuit operable to provide a first current level to the temperature sensor and to measure a first output voltage at an output node of the temperature sensor, and to provide a second current level to the temperature sensor and to measure a second output voltage at the output node of the temperature sensor; and a switch operable to selectively route the first current level through the first junction diode and the second current level through the second junction diode, and to selectively route the first current level through the second junction diode and the second current level through the first junction diode. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method of measuring the temperature of a device formed on a first substrate, comprising the steps of:
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arranging a temperature sensor on the first substrate by forming a first junction diode and a second juction diode; arranging a temperature sensor signal processing circuit on a second substrate, the signal processing circuit configured to have as an input a signal provided by the temperature sensor; providing a first current level to the temperature sensor; measuring a first output voltage at an output node of the temperature sensor; providing a second current level to the temperature sensor; measuring a second output voltage at the output node of the temperature sensor; selectively routing either the first current level or the second current level through either the first junction diode or the second junction diode; differencing the first and second output voltages; and determining a temperature of the device based on the difference between the first and second output voltages. - View Dependent Claims (9)
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10. A method of measuring the temperature of a device, the method comprising the steps of:
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forming a first junction diode and a second juction diode on the device; arranging a temperature sensor signal processing circuit configured to have as an input a signal provided by the first and second junction diodes; providing and selectively routing a first current level through the first junction diode and a second current level through the second juction diode; measuring a first output voltage at an output node of the first junction diode and measuring the second output voltage at an output node of the second juction diode; selectively routing the first current level through the second juction diode and the second current level through the first junction diode; and measuring the first output voltage at the output node of the second juction diode and measuring the second output voltage at the output node of the first junction diode; differencing the first and second output voltages; and determining a temperature of the device based on the difference between the first and second output voltages. - View Dependent Claims (11, 12)
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13. An apparatus for measuring the temperature of a device comprising:
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a temperature sensor formed on the device, the temperature sensor having a first juction diode and a second junction diode; and a temperature sensor signal processing circuit formed on the device and configured to have as an input a signal provided by the temperature sensor, the temperature sensor signal processing circuit having a circuit operable to provide a first current level to the temperature sensor and to measure a first output voltage at an output node of the temperature sensor, and to provide a second current level to the temperature sensor and to measure a second output voltage at the output node of the temperature sensor; and a switch operable to selectively route the first current level through the first junction diode and the second current level through the second junction diode, and to selectively route the first current level through the second juction diode and the second current level through the first junction diode. - View Dependent Claims (14, 15, 16)
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Specification