Gated transmission and scatter detection for x-ray imaging
First Claim
1. An inspection system for inspecting an enclosure having contents, the system comprising:
- a. a first source for producing an intermittent first beam of penetrating radiation having a duration of inactivity,b. at least one detector for generating a transmission signal based on at least the penetrating radiation transmitted through the enclosure;
c. a second source for producing a second beam of penetrating radiation,d. at least one detector for generating a scatter signal based on at least the penetrating radiation scattered by the contents of the enclosure during the duration of inactivity of the first source; and
e. a processor for deriving properties of the contents of the enclosure on the basis of the transmission signal and the scatter signal.
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Accused Products
Abstract
An inspection system for inspecting an enclosure and its contents using temporally gated sources of penetrating radiation. A first source produces an intermittent first beam having a duration of inactivity while a second sources produces a second beam, which may have an energy spectrum differing from that of the first beam, during the inactivity of the first beam. One detector generates a transmission signal based on penetrating radiation transmitted through the enclosure while a scatter detector generates a scatter signal based on penetrating radiation scattered by the contents of the enclosure. The scatter detector may be gated for non-detection during the pulsing of the transmission beam. A processor derives properties of the contents of the enclosure on the basis of the transmission signal and the scatter signal.
303 Citations
18 Claims
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1. An inspection system for inspecting an enclosure having contents, the system comprising:
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a. a first source for producing an intermittent first beam of penetrating radiation having a duration of inactivity, b. at least one detector for generating a transmission signal based on at least the penetrating radiation transmitted through the enclosure; c. a second source for producing a second beam of penetrating radiation, d. at least one detector for generating a scatter signal based on at least the penetrating radiation scattered by the contents of the enclosure during the duration of inactivity of the first source; and e. a processor for deriving properties of the contents of the enclosure on the basis of the transmission signal and the scatter signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 16, 17)
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15. A method for inspecting an enclosure, the method comprising:
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a. periodically illuminating the enclosure with a pulsed beam of penetrating radiation, b. generating a transmission signal based on at least the penetrating radiation transmitted through the enclosure; c. scanning the enclosure with a continuous beam of penetrating radiation, d. generating a scatter signal based on at least the penetrating radiation scattered by the contents of the enclosure; and e. deriving properties of the contents of the enclosure on the basis of the transmission signal and the scatter signal.
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18. A method for inspecting an enclosure, the method comprising:
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a. periodically illuminating the enclosure with a first intermittent beam of penetrating radiation having a duration of inactivity; b. generating a transmission signal based on at least the penetrating radiation transmitted through the enclosure; c. scanning the enclosure with a second beam of penetrating radiation, d. generating a scatter signal based on at least the penetrating radiation scattered by the contents of the enclosure during the duration of inactivity of the first intermittent beam; and e. deriving properties of the contents of the enclosure on the basis of the transmission signal and the scatter signal.
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Specification