Method of calibrating temperature-measuring resistors on a glass, glass-ceramic, or similar substrate

• US 6,155,711 A
• Filed: 08/05/1997
• Issued: 12/05/2000
• Est. Priority Date: 08/09/1996
• Status: Expired due to Fees

• Current Assignee: Schott AG (Carl-Zeiss-Stiftung)
• Original Assignee: Schott Glas
• Inventors: Engelmann, Harry, Schaupert, Kurt
• Primary Examiner(s): Bennett, G. Bradley
• Assistant Examiner(s): VERBITSKY, GAIL KAPLAN
• Application Number:
  US08/906,570
• Time in Patent Office: 1,218 Days
• Field of Search: 338/22 R, 338/25, 431/328, 374/1, 219/464
• US Class Current: 374/1
• CPC Class Codes: G01K 15/00 Testing or calibrating of thermometers
• CPC Class Codes: H05B 3/746 Protection, e.g. overheat cutoff, hot plate indicator

Abstract

The method of calibrating temperature-measuring resistors on substrates made of glass, glass-ceramics or similar materials, especially conductor strip resistors on glass-ceramic cooking surfaces, includes measuring a temperature associated with a measured resistance value obtained using the temperature-measuring resistor by determining a temperature-dependent electrical resistance of the substrate material, in order to obtain a temperature-resistance characteristic curve for the temperature-measuring resistor.

Claims

1. A method of calibrating a temperature-measuring resistor applied to a substrate made of glass or glass-ceramic material, said temperature-measuring resistor consisting of a conductor strip resistor whose resistive properties change with time in operation, said method of calibrating said temperature-measuring resistor comprising the steps of:

a) measuring a resistance value of the temperature-dependent resistor to obtain a measured resistance value for the temperature-dependent resistor; and

b) determining a temperature of the temperature-dependent resistor at which said measured resistance value was obtained during step a) by measuring a temperature-dependent electrical resistance of said substrate, whereby a temperature-resistance characteristic curve is obtained for the temperature-measuring resistor.

2. The method as defined in claim 1, wherein said conductor strip resistor is made of gold or platinum.

3. The method as defined in claim 1, wherein said temperature, at which the resistance value of the temperature-measuring resistor is measured, is determined at temperatures between 250°

C. to 600°

C. in order to perform the calibrating.

4. The method as defined in claim 1, wherein said temperature, at which the resistance value of the temperature-measuring resistor is measured, is determined in order to perform the calibrating when a deviation in a temperature value obtained with the temperature-measuring resistor from that obtained by said measuring of said electrical resistance of said substrate material is more than 5°

C.

5. The method as defined in claim 1, wherein said substrate with said temperature-measuring resistor is mounted on a cooking surface of a cooking unit and said temperature, at which the resistance value of the temperature-measuring resistor is measured, is determined in order to perform the calibrating after operating said cooking unit for ten hours after manufacture of said cooking unit.

6. The method as defined in claim 1, wherein said temperature, at which the resistance value of the temperature-measuring resistor is measured, is determined in order to perform the calibrating by measuring the temperature-dependent electrical resistance of the substrate material directly bordering the temperature-dependent resistor.

7. The method as defined in claim 1, wherein said measuring of the resistance value of the temperature-measuring resistor and the measuring of the electrical resistance of the substrate occur at temperatures between 250°

C. to 600°

C. in order to perform the calibrating.

8. A method of calibrating a temperature-measuring resistor applied to a substrate made of glass or glass-ceramic material, said temperature-measuring resistor consisting of a first conductor strip resistor whose resistive properties change with time in operation, said method of calibrating said temperature-measuring resistor comprising the steps of:

a) applying a second conductor strip resistor to said substrate so that said second conductor strip is spaced from said first conductor strip resistor;

b) applying a glass-ceramic temperature-measuring resistor to the substrate between said first and second conductor strip resistors so as to contact both of said first and second conductor strip resistors;

c) measuring a resistance value of the temperature-measuring resistor to obtain a measured resistance value for the temperature-measuring resistor; and

d) determining a temperature of the temperature-measuring resistor at which said measured resistance value was obtained during step c) by measuring a temperature-dependent electrical resistance of said glass-ceramic temperature-measuring resistor, whereby a temperature-resistance characteristic curve is obtained for the temperature-measuring resistor.

9. A method of calibrating a temperature-measuring resistor applied to a substrate made of glass or glass-ceramic material, said temperature-measuring resistor consisting of a conductor strip resistor whose resistive properties change with time in operation, said method of calibrating said temperature-measuring resistor comprising the steps of:

a) providing a mathematical equation expressing a linear relationship between resistance of the temperature-measuring resistor and temperature of the temperature-measuring resistor and including a number of temperature-independent parameters, wherein said mathematical equation is;

space="preserve" listing-type="equation">R.sub.LB =R.sub.20 ·

(1+α

.sub.20 (T.sub.LB -20)),

and wherein said R₂₀ and α

₂₀ are said temperature-independent parameters, R_LB is the resistance of the temperature-measuring resistor and T_LB is the temperature of the temperature-measuring resistor;

b) measuring resistance values (R_LB) of said temperature-measuring resistor at two calibration temperatures (T_LB) above 250°

C.;

c) determining each of said calibration temperatures (T_LB) from measured resistance values of said substrate at said calibration temperatures and a predetermined relationship between substrate resistance and substrate temperature in a temperature range above 250°

C.;

d) inserting respective ones of said resistance values (R_LB) measured in step b) and corresponding ones of said calibration temperatures (T_LB) determined in step c) in said mathematical equation to obtain a system of equations for said temperature-independent parameters R₂₀ and α

₂₀ ; and

e) solving said system of equations for said temperature-independent parameters R₂₀ and α

₂₀ ;

so that said temperature of the temperature-measuring resistor is obtained from said resistance of the temperature-measuring resistor under 250°

C. by solving said mathematical equation with said resistance of the temperature-measuring resistor and said temperature-independent parameters obtained in step e) inserted in said mathematical equation.