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Method of forming a trench capacitor using a rutile dielectric material

  • US 6,156,606 A
  • Filed: 11/17/1998
  • Issued: 12/05/2000
  • Est. Priority Date: 11/17/1998
  • Status: Expired due to Fees
First Claim
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1. A method of forming semiconductor devices comprising the steps of:

  • providing a deep trench in a substrate, the deep trench having a lower portion; and

    forming a dielectric layer in the deep trench by lining the lower portion of the deep trench with the dielectric layer, the dielectric layer including a rutile titanuium dioxide layer.

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