Method and apparatus for improving the performance of an aperture monitoring system

• US 6,157,024 A
• Filed: 06/03/1999
• Issued: 12/05/2000
• Est. Priority Date: 06/03/1999
• Status: Expired due to Term

• Current Assignee: Prospects Corp.
• Original Assignee: Prospects Corp.
• Inventors: Chapdelaine, Eugene R., O'Connor, Christopher J., Hawley, Stephen A., Burger, Robert J.
• Primary Examiner(s): Allen, Stephone B.
• Application Number:
  US09/325,115
• Time in Patent Office: 551 Days
• Field of Search: 250/221, 250/222.1, 340/555-557, 340/565, 340/541, 340/545.2, 340/545.3, 340/545.7, 340/545.1, 318/264-266, 318/466, 318/565, 180/167
• US Class Current: 250/221
• CPC Class Codes: E05F 15/431 specially adapted for vehicle windows or roofs
• CPC Class Codes: E05Y 2400/452 for saving energy, e.g. sleep or wake-up
• CPC Class Codes: E05Y 2900/55 Windows
• CPC Class Codes: G01V 13/00 Manufacturing, calibrating, cleaning, or repairing instruments or devices covered by groups G01V1/00 – G01V11/00
• CPC Class Codes: G01V 8/12 using one transmitter and one receiver

Abstract

A monitoring system for use in detecting the presence of an obstacle in or proximate to an aperture. Materials are applied to one or more reflecting surfaces adjacent the aperture, enabling the improvement of the signal-to-noise ratio in the system without requiring tuning the system for the particular environment. The choice of specific material depends upon the type of radiation used for aperture monitoring and whether an obstacle is detected as an increase or decrease in reflected radiation. A calibration LED within the monitoring system enables predictable performance over a range of temperatures. The monitoring system is also provided with the capacity to adjust to variations in the background-reflected radiation, either automatically by monitoring trends in system performance or by external command. The latter case includes the use of a further element for communicating to the monitoring system directly or indirectly.

Claims

1. A method of improving the performance of a monitoring system associated with an aperture, said monitoring system comprising an emitter for emitting radiation adjacent said aperture and a receiver for receiving reflected radiation, said method comprising the steps of:

applying a material to a surface adjacent said aperture for altering the intensity of said emitted radiation as reflected from said surface, said material covering at least a portion of said surface;

emitting said radiation adjacent said aperture by said emitter;

receiving, by said receiver, at least a portion of said reflected radiation from said material; and

comparing, by said monitoring system, said received radiation to a threshold value.

2. The method of claim 1, wherein said step of applying further comprises the step of applying a material for increasing said intensity of said reflected radiation at said receiver, and wherein said step of comparing further comprises determining whether said intensity of said received, reflected radiation is equal to or below said threshold value.

3. The method of claim 1, wherein said step of applying further comprises the step of applying a material for decreasing said intensity of said reflected radiation at said receiver, and wherein said step of comparing further comprises determining whether said intensity of said received, reflected radiation is equal to or above said threshold value.

4. The method of claim 1, wherein said step of applying further comprises the step of using a pressurized spray to apply said material to said surface.

5. The method of claim 1, wherein said step of applying further comprises the step of using an adhesive to apply said material to said surface.

6. A system for monitoring a space within or proximate to an aperture, said system comprising:

an emitter for emitting radiation adjacent said aperture;

a surface adjacent said aperture for reflecting a portion of said emitted radiation;

a material applied to said surface for altering an intensity of said reflected radiation;

a receiver adapted to receive at least a portion of said reflected radiation; and

a processing element for determining if an intensity of said reflected radiation received by said receiver equals or exceeds a threshold level,

wherein said material improves a signal-to-noise ratio of said receiver as compared to a monitoring system not comprising said material.

7. The system of claim 6, wherein said material increases said intensity of said reflected radiation.

8. The system of claim 7, wherein said material is selected from the group consisting of reflective tape, selectively embossed appliques, and an array of defractive optical reflectors.

9. The system of claim 6, wherein said material decreases said intensity of said reflected radiation.

10. The system of claim 9, wherein said material is selected from the group consisting of light absorbing paint, felt, and optical gratings.

11. The system of claim 6, wherein said material is deposited on said surface by a pressurized spray.

12. The system of claim 6, wherein said material has an adhesive backing for adhesion to said surface.

13. The system of claim 6, wherein said material is affixed to said surface by interference fit.

14. The system of claim 6, wherein said material comprises a plurality of features each having a radiation reflecting geometry.

15. The system of claim 14, wherein said features are embossed into said material.

16. The system of claim 6, wherein said material is an adhesive-backed tape.

17. A system for monitoring a space within or proximate to an aperture, said system comprising:

an emitter for emitting radiation adjacent said aperture;

a receiver adapted to receive said radiation as reflected from said space and to generate an output signal based upon said received radiation;

a reference source for providing a reference signal to said receiver; and

a processing element for comparing said output signal to a threshold value.

18. The system of claim 17 wherein said emitter comprises at least one light emitting diode.

19. The system of claim 18 wherein said reference source comprises a light emitting diode.

20. The system of claim 19, wherein said at least one emitter light emitting diode and said reference source light emitting diode have substantially equivalent temperature-response characteristics.

21. The system of claim 17, wherein said reference source provides an electrical signal of known characteristics.

22. The system of claim 17, wherein said receiver further comprises a photodiode in communication with said processing element.

23. The system of claim 17, further comprising a memory element for storing data correlating a drive signal value required for said reference source and a gain signal value required for said receiver to result in a desired value for said output signal.

24. The system of claim 17, further comprising a memory element for storing data correlating a drive signal value required for said reference source and a drive signal value required for said emitter to result in a desired value for said output signal.

25. The system of claim 17, further comprising a temperature sensor for detecting the environmental temperature for said emitter and said reference source and for providing an output utilized in adjusting at least one of a drive signal for said reference source and a drive signal for said emitter to compensate for said environmental temperature.

26. The system of claim 17, further comprising a temperature sensor for detecting the environmental temperature for said receiver and for providing an output utilized in adjusting a gain control for said receiver to compensate for said environmental temperature.

27. The system of claim 17, wherein said emitter and said reference source have substantially the same temperature response characteristic, and wherein said receiver has an inverse temperature response characteristic relative to that of said emitter and said reference source.

28. A method of monitoring a space adjacent to or within an aperture comprising the steps of:

generating first reference radiation by applying a first reference drive signal to a reference emitter;

receiving said reference radiation by a receiver;

generating a first receiver output signal based upon said received reference radiation;

adjusting said first reference drive signal until a desired value for said output signal is generated by said receiver;

generating measurement radiation by applying a first measurement drive signal, based upon said first reference drive signal, to a measurement emitter;

receiving reflected measurement radiation by said receiver; and

generating a second receiver output signal based upon said received, reflected, measurement radiation.

29. The method of claim 28, further comprising the step of comparing said second output signal to a threshold value.

30. The method of claim 28, further comprising the steps of:

generating second reference radiation by applying a second reference drive signal to said reference emitter;

receiving said second reference radiation by said receiver;

setting a receiver gain level;

generating a third receiver output signal based upon said second reference radiation and said receiver gain level; and

recording said receiver gain level and said third receiver output signal.

31. The method of claim 30, further comprising the steps of:

changing said receiver gain level and repeating said steps of

generating said third receiver output signal based upon said second reference radiation and said receiver gain level, and

recording said receiver gain level and said third receiver output signal.

32. The method of claim 28, further comprising the steps of:

generating third reference radiation by applying a third reference drive signal to said reference emitter;

receiving said reference radiation by said receiver;

generating from said receiver a third output signal based upon said received reference radiation;

generating measurement radiation by applying a second measurement drive signal to said measurement emitter which is substantially equal to said third reference drive signal;

receiving reflected measurement radiation by said receiver;

generating a fourth output signal based upon said received, reflected, measurement radiation;

adjusting said second measurement drive signal until said fourth output signal substantially equals said third output signal; and

recording said adjustment in said second measurement drive signal.

33. The method of claim 28, further comprising the steps of:

obtaining an indication of the operating temperature for the environment of said reference and measurement emitters; and

adjusting said first reference drive signal based upon said indication.

34. The method of claim 28, further comprising the steps of:

obtaining an indication of the operating temperature for the environment of said receiver; and

adjusting said a gain control for said receiver based upon said indication.

35. The method of claim 28, further comprising the steps of:

selecting said reference emitter and said measurement emitter to have substantially similar temperature response characteristics; and

selecting said receiver to have an inverse temperature response to that of said reference emitter and said measurement emitter.

36. A system for monitoring a space adjacent to or within an aperture, comprising:

an emitter for emitting radiation adjacent said aperture;

a receiver adapted to receive said radiation as reflected from said space;

a processing element for determining if an intensity of said reflected radiation received by said receiver equals or exceeds a threshold level; and

a calibrating element for calibrating said system based upon said intensity of said reflected radiation.

37. The system of claim 36, wherein said processing element is communicable via a data network, and said calibrating element further comprises a data network interface for communicating with said processing element via said data network.

38. The system of claim 37, wherein said calibrating element is adapted for communicating directly with said processing element via said data network.

39. The system of claim 37, wherein said calibrating element is adapted for communicating indirectly with said processing element via said data network and at least one other device communicating over said data network.

40. The system of claim 37, wherein said calibrating element further comprises a portable computer.

41. The system of claim 36, wherein said calibrating element further comprises a mechanical signaling device in communication with said processing element.

42. The system of claim 36, wherein said calibrating element further comprises a calibration emitter for emitting a predetermined radiation pattern for receipt by said receiver.

43. The system of claim 42, wherein said processing element is adapted to adjust characteristics of said emitter and/or said receiver based upon said receipt of said predetermined recognition pattern by said receiver.

44. The system of claim 36, wherein said calibrating comprises adjusting characteristics of said emitter and/or receiver in response to said intensity of said reflected radiation.

45. The system of claim 36, wherein said calibration element is further adapted for calibrating said system only under predefined aperture environmental conditions.

46. A method of calibrating a system for monitoring a space adjacent to or within an aperture, said system comprising an emitter for emitting a radiation field adjacent said aperture, a receiver for receiving at least a reflected portion of said radiation field and for generating an output signal indicative of an intensity of said reflected radiation field, and a processing element for comparing said output signal with a threshold value, said method comprising the steps of:

providing a calibration signal to said processing element;

emitting said radiation field by said emitter;

receiving said reflected portion of said radiation field by said receiver and generating said output signal; and

adjusting, by said processing element, characteristics of said emitter and/or said receiver in response to said output signal.

47. The method of claim 46, wherein said step of providing further comprises interfacing a calibration signal generator to a data network to which said processing element is connected.

48. The method of claim 47, wherein said step of interfacing further comprises interfacing a portable computer to said data network to which said processing element is connected.

49. The method of claim 46, wherein said step of providing further comprises manipulating a mechanical interface to said processing element for generating said calibration signal.

50. The method of claim 46, wherein said step of providing further comprises generating a predetermined radiation signal by a calibration element for receipt by said receiver and for generation of said calibration signal by said receiver in response thereto.

51. The method of claim 50, wherein said step of generating further comprises activating a portable source of radiation compatible with said receiver for said generation of said predetermined radiation signal.

52. The method of claim 46, further comprising the step of waiting for a predefined set of aperture environmental conditions prior to performing said steps of emitting, receiving and adjusting.

53. A system for monitoring a space within or proximate to an aperture, comprising:

an emitter for emitting radiation adjacent said aperture;

a receiver for receiving said radiation as reflected from said space and for generating an output signal based upon said received radiation; and

a processing element for calculating a difference between said output signal and a first threshold value and for controlling one or both of said emitter and said receiver based upon said calculated difference.

54. The system of claim 53, further comprising a reference source for providing a reference signal to said receiver.

55. The system of claim 53, wherein said emitter is further for emitting said radiation in response to an applied drive control signal, and wherein said receiver is further for generating said output signal in response to an applied gain control signal.

56. The system of claim 53, wherein said processing element is further for controlling based upon said calculated difference and based upon a calculated difference from at least one prior use of said monitoring system.

57. The system of claim 56, wherein said at least one prior use of said monitoring system is defined by at least one condition associated with said aperture environment.

58. The system of claim 53, wherein said processing element is further for controlling one or both of said emitter and said receiver to alter said calculated difference by a desired percentage of said calculated difference.

59. The system of claim 53, wherein said processing element is further for controlling based upon an average difference based upon said calculated difference for the present use of said monitoring system and x prior use(s) of said monitoring system, where x is an integer greater than zero.

60. The system of claim 59, wherein said processing element is further for controlling one or both of said emitter and said receiver to alter said average calculated difference by a desired percentage of said calculated difference.

61. The system of claim 60, wherein said processing element is further for controlling one or both of said emitter and said receiver to alter said average calculated difference by a desired percentage of said calculated difference, wherein said percentage is determined by said processing element based upon a rate of change of said calculated difference for said present use of said monitoring system and x prior use(s) of said monitoring system.

62. The system of claim 53, wherein said processing element is further for controlling one or both of said emitter and said receiver if said calculated difference exceeds a second threshold.

63. The system of claim 62, wherein said processing system is further for controlling one or both of said emitter and said receiver if said calculated difference for said present use of said monitoring system and x out of y prior uses of said monitoring system exceeds said second threshold, wherein x is an integer greater than zero, and y is an integer greater than or equal to x.

64. A method of monitoring a spatial volume proximate an aperture, said method comprising the steps of:

emitting radiation adjacent said aperture;

receiving a portion of said radiation reflected from a surface in said aperture environment;

generating an output signal based upon said received radiation;

calculating a difference between said output signal and a first threshold value; and

controlling one or both of said emitting and said generating steps based upon said calculated difference to effect said calculated difference.

65. The method of claim 64, wherein said step of emitting further comprises emitting said radiation in response to a drive signal, and wherein said step of generating said output signal further comprises generating said output signal in response to an applied gain control signal.

66. The method of claim 64, wherein said step of controlling further comprises controlling one or both of said emitting and said generating steps based upon said calculated difference and a calculated difference from at least one prior use of said method.

67. The method of claim 66, wherein said at least one prior use of said controlling step is defined by at least one condition associated with said aperture environment.

68. The method of claim 64, wherein said step of controlling further comprises controlling one or both of said emitting and said generating steps to alter said calculated difference by a desired percentage of said calculated difference.

69. The method of claim 64, wherein said step of controlling further comprises controlling one or both of said emitting and said generating steps based upon an average difference from said calculated difference and a calculated difference from x prior use(s) of said method, where x is an integer greater than zero.

70. The method of claim 69, wherein said step of controlling further comprises controlling one or both of said emitting and generating steps to alter said average difference by a desired percentage of said average difference.

71. The method of claim 70, wherein said step of controlling further comprises controlling one or both of said emitting and generating steps to alter said average difference by a desired percentage of said average difference, wherein said percentage is based upon a rate of change of said calculated difference for said present use of said method and x prior use(s) of said method.

72. The method of claim 64, wherein said step of controlling further comprises controlling one or both of said emitting and generating steps if said calculated difference exceeds a second threshold value.

73. The method of claim 72, wherein said step of controlling further comprises controlling one or both of said emitting and generating steps if said calculated difference for the present use of said method and x out of y prior uses of said monitoring system exceeds said second threshold, wherein x is an integer greater than zero and y is an integer greater than or equal to x.