Method and device for analogue to digital conversion

• US 6,160,508 A
• Filed: 12/28/1998
• Issued: 12/12/2000
• Est. Priority Date: 12/29/1997
• Status: Expired due to Term

• Current Assignee: Infineon Technologies AG
• Original Assignee: Telefonaktiebolaget LM Ericsson
• Inventors: Gustavsson, Mikael, Tan, Nianxiong
• Primary Examiner(s): PHAN, TRONG Q
• Application Number:
  US09/220,765
• Time in Patent Office: 715 Days
• Field of Search: 341/155, 341/159, 341/172
• US Class Current: 341/155
• CPC Class Codes: H03M 1/0624 by synchronisation
• CPC Class Codes: H03M 1/0836 of phase error, e.g. jitter
• CPC Class Codes: H03M 1/1215 using time-division multiplexing

Abstract

A parallel SC ADC (switched capacitor analog-to-digital converter) includes a passive sampling technique controlled by a global clock phase to reduce the influence of the sampling phase skew. Since it does not require operational amplifiers for sampling, it is very suitable for high speed applications, and yet it can reduce the sampling-phase-skew-related distortion by 20-40 dB in a high speed, parallel SC ADC.

Claims

1. A parallel analog-to-digital converter having a number of parallel channels between an input terminal and a multiplexer, each channel having sampling means controlled by a channel clock phase to in turn sample a signal on the input terminal, and converter means connected between the sampling means and the multiplexer to convert samples from the sampling means, wherein a switch, common to all channels, is connected in series with the respective sampling means to ground, the switch being controlled by a global clock phase adapted to change its state slightly before the respective channel clock phase changes its state to provide samples to the converter means.

2. A parallel analog-to-digital converter according to claim 1, wherein the repetition frequency of the global clock phase is M times higher than the repetition frequency of the channel clock phase.

3. A parallel analog-to-digital converter according to claim 2, wherein the global clock phase changes state slightly before the channel clock phase.

4. A parallel analog-to-digital converter according to claim 3, further comprising active holding means.

5. A parallel analog-to-digital converter according to claim 4, wherein said active holding means comprises at least one operational amplifier.

6. A parallel analog-to-digital converter according to claim 4, wherein said sampling means comprises at least one capacitor included in a feedback loop of said holding means.

7. A method for parallel analog-to-digital conversion using a number of parallel channels between an input terminal and a multiplexer, comprising the steps of:

sampling, in each channel, of a signal on the input terminal, under the control of a channel clock phase; and

converting the samples before they are input to the multiplexer, wherein said sampling in each channel is controlled by, in addition to the channel clock phase a switch common to all channels, the switch being controlled by a global clock phase adapted to change its state slightly before the respective channel clock phase changes its state to provide samples for the conversion.

8. A method for parallel analog-to-digital conversion according to claim 7, wherein the repetition frequency of the global clock phase is M times higher than the repetition frequency of the channel clock phase.

9. A method for parallel analog-to-digital conversion according to claim 8 wherein the global clock phase changes state slightly before the channel clock phase.

10. A method for parallel analog-to-digital conversion according to claim 9, wherein said sampling is capacitive.

11. A method for sampling an analog signal in parallel using a number of parallel channels between an input terminal and a multiplexer, comprising switching capacitors in each channel controlled by a channel clock phase to in turn sample a signal on the input terminal, wherein said switching is executed depending on a global clock phase adapted to change its state slightly before the respective channel clock phase changes its state to provide samples for conversion.

12. A method for sampling according to claim 11, wherein the repetition frequency of the global clock phase is M times higher than the repetition frequency of the channel clock phase.

13. A method for sampling according to claim 12, wherein the global clock phase changes state slightly before the channel clock phase.