Method and apparatus for testing electronic systems using electromagnetic emissions profiles

• US 6,160,517 A
• Filed: 01/20/1998
• Issued: 12/12/2000
• Est. Priority Date: 01/20/1998
• Status: Expired due to Term

• Current Assignee: Dell USA LP (Dell Technologies Inc.)
• Original Assignee: Dell USA LP (Dell Technologies Inc.)
• Inventors: Bell, James S., Staggs, David
• Primary Examiner(s): De Cady, Albert
• Assistant Examiner(s): LAMARRE, GUY J
• Application Number:
  US09/009,398
• Time in Patent Office: 1,057 Days
• Field of Search: 714/724, 714/726, 324/95, 324/96, 324/750, 340/647, 343/703
• US Class Current: 343/703
• CPC Class Codes: G01R 29/0892 Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value
• CPC Class Codes: G01R 31/002 where the device under test is an electronic circuit

Abstract

A printed circuit board assembly testing device includes a LISN device connected to a power source and to a test enclosure. The test enclosure includes a power supply and a communication port. A signal analyzer is interfaced to the LISN device. A circuit board assembly unit under test is positioned in the test enclosure. A controlling computer is interfaced to the communication port. The controlling computer includes a hard disk storage device having benchmark data stored therein. A communication bus interconnects the controlling computer to the signal analyzer. The unit under test is powered up and emissions data is observed which correlates to activity in the unit under test. The emissions data is compared to the benchmark data and a determination can be made as to whether the observed data meets the benchmark data within an acceptable tolerance.

Claims

1. A device for testing electronic assemblies comprising:

an electromagnetic emissions compliance testing device connected to a power supply;

a test enclosure for housing a UUT to be tested for RF emissions, the test enclosure including a power supply and a communication port;

a PC system coupled to the test enclosure;

a signal analyzer coupled to the PC system including stored spectral data;

a constant impedance LISN device coupled to the test enclosure and to the signal analyzer;

a test BIOS controlled by the PC system for single stepping through a POST routine issued to the UUT;

each POST step including an RF emission signature;

the PC system being provided to look for a POST step completion signal from the BIOS;

the signal analyzer being provided to capture an RF emission signal from the UUT and the RF emission signature of each POST step; and

the test enclosure being coupled to the signal analyzer for external control by the PC using the stored spectral data to compare the RF emission signal from the UUT and the RF emission signature of each POST step to determine pass/fail test compliance.

2. The device as defined in claim 1 wherein the power source is an AC power source which is filtered and shielded.

3. The device as defined in claim 1 wherein the testing device passes AC power through an AC filter to the power supply.

4. The device as defined in claim 1 wherein the testing device interfaces via shielded RF signal wire to the signal analyzer.

5. The device as defined in claim 1 wherein the testing device interfaces with the power supply via a shielded connection.

6. The device as defined in claim 1 wherein the test enclosure interfaces with the testing device via a shielded connection.

7. The device as defined in claim 1 wherein the power supply is programmable.

8. The device as defined in claim 7 wherein the power supply is coupled to a communication bus connecting the PC system to the signal analyzer.

9. The device as defined in claim 1 wherein the PC system is coupled to another computer system via a computer network.

10. The device as defined in claim 1 wherein the PC system is coupled to a remote computer system.

11. A printed circuit board assembly testing device comprising:

an electromagnetic emissions compliance testing device connected to a power supply;

a test enclosure for housing a UUT to be tested for RF emissions;

the test enclosure including a power supply and a communication port;

a PC system coupled to the test enclosure;

a signal analyzer coupled to the PC system including stored spectral data;

a communication bus connecting the PC system to the signal analyzer;

a software program coupled to control the PC system;

a constant impedance LISN device coupled to the test enclosure and to the signal analyzer;

a test BIOS controlled by the PC system for single stepping through a POST routine issued to the UUT;

a software delay after completion of each POST step;

the PC system being provided to look for a POST step completion signal from the BIOS;

the signal analyzer being provided to capture an RF emission signal from the UUT and an RF emission signature of each POST step; and

the enclosure being coupled to the signal analyzer for external control by the PC system using the software program and the stored spectral data to compare the RF emission signal from the UUT and the RF emission signature of each POST step to determine whether the UUT passes a go/no-go test.

12. The device as defined in claim 11 wherein the power source is an AC power source which is filtered and shielded.

13. The device as defined in claim 11 wherein the testing device passes AC power through an AC filter to the power supply.

14. The device as defined in claim 11 wherein the testing device interfaces via shielded RF signal wire to the signal analyzer.

15. The device as defined in claim 11 wherein the testing device interfaces with the power supply via a shielded connection.

16. The devices as defined in claim 11 wherein the test enclosure interfaces with the testing device via a shielded connection.

17. The device as defined in claim 11 wherein the power supply is programmable.

18. The device as defined in claim 11 wherein the power supply is coupled to the communication bus.

19. The device as defined in claim 11 wherein the PC system is coupled to another computer system via a computer network.

20. The device as defined in claim 11 wherein the PC system is coupled to a remote computer system.

21. A method of testing electronic assemblies, comprising the steps of:

connecting a test enclosure to an electromagnetic emissions compliance testing device, the test enclosure housing a UUT to be tested for RF emissions;

the test enclosure including a power supply and a communication port and being connected to a power supply;

interfacing a PC system to the test enclosure;

interconnecting the PC system with a signal analyzer via a communication bus;

providing a software program coupled to control the PC system;

loading the UUT to be tested, into the test enclosure;

coupling the UUT to the signal analyzer and the test enclosure for external control by the PC system using the software program;

powering up the UUT;

single stepping a test BIOS, controlled by the PC system, through a POST routine issued to the UUT;

delaying after each POST step for a known time duration;

providing the PC system to look for a POST step completion signal from the BIOS;

capturing an RF emission signal from the UUT and an RF emission signature of each POST step by the signal analyzer;

connecting the signal analyzer to a constant impedance LISN device;

observing the RF emission signal correlating to activity in the powered up UUT;

comparing the observed RF emission signal from the UUT with the RF emission signature from each POST step; and

determining whether the RF emission signal from the UUT meets an acceptable tolerance.