Plasma processing device and a method of plasma process
First Claim
1. A plasma process apparatus which permits generating microwaves and a magnetic field so as to bring about electron cyclotron resonance and, thus, to generate a plasma which is applied to an object to be processed, comprising:
- microwave generating means for generating said microwaves;
microwave transmitting means for transmitting the microwaves;
a process chamber having said object arranged therein, the microwaves being introduced into said process chamber through said microwave transmitting means;
process gas supply means for supplying a process gas into said process chamber; and
magnetic field generating means for generating a magnetic field within the process chamber,wherein the frequency of the microwave falls within a range between a lower limit of a cutoff frequency determined by the inner diameter of the process chamber and an upper limit of a maximum frequency at which a standing wave of the microwave does not occur on the surface of the object,wherein the upper limit and the lower limit in the frequency range of the microwave are 1.5 GHz and 580 MHz, respectively, where the diameter of the object to be processed is 8 inches and the microwave oscillates in TE 11 mode within the process chamber,wherein the microwave transmitting means is provided with matching means for freely varying the impedance of the microwaves in the microwave transmitting means, andwherein said matching means comprises first and second adjustment pipes connected to said transmitting means having adjustable respective first and second plates disposed perpendicular to each other.
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Accused Products
Abstract
Disclosed is a plasma process apparatus which permits generating microwaves and a magnetic field so as to bring about electron cyclotron resonance and, thus, to generate a plasma which is applied to a semiconductor wafer, comprising microwave generating means for generating said microwaves, microwave transmitting means for transmitting the microwaves, a process chamber having said semiconductor wafer arranged therein, the microwaves being introduced into said process chamber through said microwave transmitting means, process gas supply means for supplying a process gas into said process chamber, and magnetic field generating means for generating a magnetic field within the process chamber. The frequency of the microwave falls within a range between a lower limit of a cutoff frequency determined by the inner diameter of the process chamber and an upper limit of a maximum frequency at which a standing wave of the microwave does not occur on the surface of the object.
36 Citations
24 Claims
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1. A plasma process apparatus which permits generating microwaves and a magnetic field so as to bring about electron cyclotron resonance and, thus, to generate a plasma which is applied to an object to be processed, comprising:
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microwave generating means for generating said microwaves; microwave transmitting means for transmitting the microwaves; a process chamber having said object arranged therein, the microwaves being introduced into said process chamber through said microwave transmitting means; process gas supply means for supplying a process gas into said process chamber; and magnetic field generating means for generating a magnetic field within the process chamber, wherein the frequency of the microwave falls within a range between a lower limit of a cutoff frequency determined by the inner diameter of the process chamber and an upper limit of a maximum frequency at which a standing wave of the microwave does not occur on the surface of the object, wherein the upper limit and the lower limit in the frequency range of the microwave are 1.5 GHz and 580 MHz, respectively, where the diameter of the object to be processed is 8 inches and the microwave oscillates in TE 11 mode within the process chamber, wherein the microwave transmitting means is provided with matching means for freely varying the impedance of the microwaves in the microwave transmitting means, and wherein said matching means comprises first and second adjustment pipes connected to said transmitting means having adjustable respective first and second plates disposed perpendicular to each other. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A plasma process apparatus which permits generating microwaves and a magnetic field so as to bring about electron cyclotron resonance and, thus, to generate a plasma which is applied to an object to be processed, comprising:
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microwave generating means for generating said microwaves;
microwave transmitting means for transmitting the microwaves;a process chamber having said object arranged therein, the microwaves being introduced into said process chamber through said microwave transmitting means; process gas supply means for supplying a process gas into said process chamber; and magnetic field generating means for generating a magnetic field within the process chamber, wherein the frequency of the microwave falls within a range between a lower limit of a cutoff frequency determined by the inner diameter of the process chamber and an upper limit of a maximum frequency at which a standing wave of the microwave does not occur on the surface of the object, wherein the upper limit and the lower limit in the frequency range of the microwave are 1.5 GHz and 770 MHz, respectively, where the diameter of the object to be processed is 8 inches and the microwave oscillates in TM 01 mode within the process chamber, wherein the microwave transmitting means is provided with matching means for freely varying the impedance of the microwaves in the microwave transmitting means, and wherein said matching means comprises first and second adjustment pipes connected to said transmitting means having adjustable respective first and second plates disposed perpendicular to each other. - View Dependent Claims (8, 9, 10, 11, 12)
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13. A plasma process apparatus which permits generating microwaves and a magnetic field so as to bring about electron cyclotron resonance and, thus, to generate a plasma which is applied to an object to be processed, comprising:
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microwave generating means for generating said microwaves;
microwave transmitting means for transmitting the microwaves;a process chamber having said object arranged therein, the microwaves being introduced into said process chamber through said microwave transmitting means; process gas supply means for supplying a process gas into said process chamber; and magnetic field generating means for generating a magnetic field within the process chamber, wherein the frequency of the microwave falls within a range between a lower limit of a cutoff frequency determined by the inner diameter of the process chamber and an upper limit of a maximum frequency at which a standing wave of the microwave does not occur on the surface of the object, wherein the upper limit and the lower limit in the frequency range of the microwave are 1.0 GHz and 440 MHz, respectively, where the diameter of the object to be processed is 12 inches and the microwave oscillates in TE 11 mode within the process chamber, wherein the microwave transmitting means is provided with matching means for freely varying the impedance of the microwaves in the microwave transmitting means, and wherein said matching means comprises first and second adjustment pipes connected to said transmitting means having adjustable respective first and second plates disposed perpendicular to each other. - View Dependent Claims (14, 15, 16, 17, 18)
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19. A plasma process apparatus which permits generating microwaves and a magnetic field so as to bring about electron cyclotron resonance and, thus, to generate a plasma which is applied to an object to be processed, comprising:
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microwave generating means for generating said microwaves;
microwave transmitting means for transmitting the microwaves;a process chamber having said object arranged therein, the microwaves being introduced into said process chamber through said microwave transmitting means; process gas supply means for supplying a process gas into said process chamber; and magnetic field generating means for generating a magnetic field within the process chamber, wherein the frequency of the microwave falls within a range between a lower limit of a cutoff frequency determined by the inner diameter of the process chamber and an upper limit of a maximum frequency at which a standing wave of the microwave does not occur on the surface of the object, wherein the upper limit and the lower limit in the frequency range of the microwave are 1.0 GHz and 570 MHz, respectively, where the diameter of the object to be processed is 12 inches and the microwave oscillates in TM 01 mode within the process chambers wherein the microwave transmitting means is provided with matching means for freely varying the impedance of the microwaves in the microwave transmitting means, and wherein said matching means comprises first and second adjustment pipes connected to said transmitting means having a adjustable respective first and second plates disposed perpendicular to each other. - View Dependent Claims (20, 21, 22, 23, 24)
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Specification