Method for manufacturing a micromechanical relay
First Claim
1. A method of producing a micromechanical relay comprising the steps of:
- a) providing a substrate including a conductive fixed electrode in or on said substrate;
b) applying a sacrificial layer;
c) applying a conductive layer and structuring said conductive layer so as to define a beam structure as a movable counterelectrode opposite said fixed electrode, and applying a contact area, the conductive layer extending between an anchoring region and the contact area and being insulated from said contact area; and
d) removing the sacrificial layer by means of etching so as to produce the beam structure comprising a movable area and an area secured to the anchoring region on the substrate, whereinthe beam structure is defined such that etch access openings in said beam structure are structured such that the size of the area covered by the etch access openings used for etching the sacrificial layer increases from the area of the beam structure secured to the substrate to the movable area of the beam structure so that the etching of the sacrificial layer is controlled in such a way that the portion of the sacrificial layer arranged below the movable area of the beam structure is etched faster than the portion of the sacrificial layer arranged in the area of the anchoring region.
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Accused Products
Abstract
A method of producing a micromechanical relay comprises the steps of providing a substrate including a conductive fixed electrode in or on said substrate. A sacrificial layer and a conductive layer are applied and the conductive layer is structured so as to define a beam structure as a movable counterelectrode opposite said fixed electrode. A contact area is applied, the conductive layer extending between an anchoring region and the contact area and being insulated from said contact area. Subsequently, the sacrificial layer is removed by means of etching so as to produce the beam structure comprising a movable area and an area secured to the anchoring region on the substrate. The beam structure is defined such that etch access openings in said beam structure are structured such that the size of the area covered by the etch access openings used for etching the sacrificial layer increases from the area of the beam structure secured to the substrate to the movable area of the beam structure so that the etching of the sacrificial layer is controlled in such a way that the portion of the sacrificial layer arranged below the movable area of the beam structure is etched faster than the portion of the sacrificial layer arranged in the area of the anchoring region.
108 Citations
28 Claims
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1. A method of producing a micromechanical relay comprising the steps of:
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a) providing a substrate including a conductive fixed electrode in or on said substrate; b) applying a sacrificial layer; c) applying a conductive layer and structuring said conductive layer so as to define a beam structure as a movable counterelectrode opposite said fixed electrode, and applying a contact area, the conductive layer extending between an anchoring region and the contact area and being insulated from said contact area; and d) removing the sacrificial layer by means of etching so as to produce the beam structure comprising a movable area and an area secured to the anchoring region on the substrate, wherein the beam structure is defined such that etch access openings in said beam structure are structured such that the size of the area covered by the etch access openings used for etching the sacrificial layer increases from the area of the beam structure secured to the substrate to the movable area of the beam structure so that the etching of the sacrificial layer is controlled in such a way that the portion of the sacrificial layer arranged below the movable area of the beam structure is etched faster than the portion of the sacrificial layer arranged in the area of the anchoring region. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28)
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Specification