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On-chip test circuit for evaluating an on-chip signal using an external test signal

  • US 6,163,862 A
  • Filed: 12/01/1997
  • Issued: 12/19/2000
  • Est. Priority Date: 12/01/1997
  • Status: Expired due to Term
First Claim
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1. A semiconductor chip comprising:

  • an on-chip signal;

    said on-chip signal having an analog voltage to be evaluated; and

    a test circuit that receives an off-chip test signal having an analog voltage and detects the relative magnitude of said analog voltage of said on-chip signal and said analog voltage of said test signal to evaluate the voltage level of the on-chip signal.

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