Method and apparatus for reading invisible symbol

• US 6,168,081 B1
• Filed: 03/22/1999
• Issued: 01/02/2001
• Est. Priority Date: 03/23/1998
• Status: Expired due to Fees

• Current Assignee: Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Original Assignee: Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Inventors: Sano, Kenji, Nagai, Hideo, Domon, Tomokazu, Fukuda, Hironori, Urano, Taeko I.
• Primary Examiner(s): Hajec, Donald
• Assistant Examiner(s): St. Cyr, Daniel
• Application Number:
  US09/273,276
• Time in Patent Office: 652 Days
• Field of Search: 235/462.05, 235/462.08, 235/462.25, 235/462.27, 235/468, 235/491, 235/494
• US Class Current: 235/462.27
• CPC Class Codes: G06K 7/14 using light without selection of wavelength, e.g. sensing reflected white light G06K7/10831 - G06K7/1097 take precedence

Abstract

An invisible symbol reading apparatus includes a heating unit for heating an invisible symbol formed on a sample and containing a material which emits infrared light when heated, a detecting unit for detecting infrared light emitted from the invisible symbol, and an arithmetic operation unit for binarizing a detection signal from the detecting unit. The arithmetic operation unit calculates a differential coefficient of the detection signal, that corresponds to a position on the sample. On the basis of upper and lower threshold values set for the differential coefficient, the arithmetic operation unit determines a maximum value of the differential coefficient in a region exceeding the upper threshold value and a minimum value of the differential coefficient in a region smaller than the lower threshold value. The arithmetic operation unit binarizes the detection signal by using the maximum or minimum value as a leading or trailing edge of a binary function.

Claims

1. A method for reading an invisible symbol comprising the steps of:

heating an invisible symbol formed on a sample and containing a material which emits infrared light when heated;

detecting infrared light emitted from the invisible symbol;

calculating a differential coefficient of a detection signal corresponding to a position on the sample;

determining, based on upper and lower threshold values set for the differential coefficient, a maximum value of the differential coefficient in a region exceeding the upper threshold value and a minimum value of the differential coefficient in a region smaller than the lower threshold value; and

binarizing the detection signal by using the maximum or minimum value as a leading or trailing edge of a binary function.

2. The method according to claim 1, wherein the step of detecting infrared light emitted from:

the invisible symbol is performed in a process of cooling the sample.

3. The method according to claim 1, wherein the invisible symbol is a linear barcode, a basic width of the linear barcode is calculated from the binary function, and the binary function is corrected to an integral multiple of the basic width.

4. The method according to claim 1, wherein the invisible symbol is a linear barcode, a basic width of the linear barcode is calculated by detecting a reference code pattern, and a data character is read on the basis of the calculated basic width.

5. The method according to claim 1, wherein a signal level of an underlying substrate is used as a signal level of background to correct a signal level of the invisible symbol.

6. The method according to claim 1, wherein the invisible symbol is made from a polymer containing a cyano group.

7. The method according to claim 1, wherein the sample is heated to 60 to 100°

C.

8. An apparatus for reading an invisible symbol comprising:

a heater configured to heat an invisible symbol formed on a sample and containing a material which emits infrared light when heated;

a detector configured to detect infrared light emitted from the invisible symbol; and

an arithmetic operation unit configured to binarize a detection signal from said detector;

wherein said arithmetic operation unit calculates a differential coefficient of the detection signal corresponding to a position on the sample, determines, based on upper and lower threshold values set for the differential coefficient, a maximum value of the differential coefficient in a region exceeding the upper threshold value and a minimum value of the differential coefficient in a region smaller than the lower threshold value, and binarizes the detection signal by using the maximum or minimum value as a leading or trailing edge of a binary function.

9. The apparatus according to claim 8, wherein said heater heats the sample is installed in a position apart from said detector, and

said apparatus further comprises a conveyor configured to move the sample from a heating position of said heater to a detection position of said detector.

10. The apparatus according to claim 8, further comprising a controller configured to turn off said heater before detection by said detector.

11. The apparatus according to claim 8, further comprising:

an optical modulator configured to optically modulate the infrared light emitted from the invisible symbol; and

said detector comprising a phase detector configured to detect a phase of a detection signal.

12. The apparatus according to claim 8, further comprising a bandpass infrared filter for transmitting infrared light in a specific wavelength region of the infrared light emitted from the invisible symbol.

13. The apparatus according to claim 12, wherein said bandpass infrared filter transmits infrared light near 4.5 μ

m peculiar to a cyano group.

14. The apparatus according to claim 8, further comprising a calcium fluoride lens.

15. The apparatus according to claim 8, further comprising a Cassegrain lens.

16. The apparatus according to claim 8, wherein said detector is a mercury cadmium tellurium detector.

17. The apparatus according to claim 8, wherein said detector forms a focal plane array.

18. The apparatus according to claim 17, wherein an element constructing said focal plane array is made of a material selected from the group consisting of platinum silicide and indium antimony.