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Beam deflector and scanner

  • US 6,169,594 B1
  • Filed: 08/24/1998
  • Issued: 01/02/2001
  • Est. Priority Date: 08/24/1998
  • Status: Expired due to Term
First Claim
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1. A beam deflector for deflecting a beam of electromagnetic energy comprising:

  • a plurality of first prisms having a pitch of between 20 μ

    m and 100 μ

    m and (1) a refractive index capable of varying in the presence of an electric or magnetic field, (2) a first face through which the beam enters the plurality of first prisms, and (3) a second face through which the beam exits the plurality of first prisms;

    a plurality of second prisms having (1) a refractive index that remains substantially constant, (2) a first face through which the beam enters the plurality of second prisms, and (3) a second face through which the beam exits the plurality of second prisms;

    wherein the plurality of first prisms and plurality of second prisms are mated such that the second face of the plurality of first prisms is disposed adjacent the first face of the plurality of second prisms;

    a source of an electric or magnetic field constructed and arranged such that the field extends at least through the plurality of first prisms; and

    a first conductive layer disposed adjacent the first face of the plurality of first prisms and a second conductive layer disposed adjacent the second face of the plurality of second prisms and a voltage source electrically connected to the first conductive layer and the second conductive layer for providing the electric field or the magnetic field through the plurality of first prisms when a voltage from the voltage source is applied to the first conductive layer and the second conductive layer;

    wherein changes in the flux of the electric field or the magnetic field change the refractive index of the plurality of first prisms thereby changing the angle at which the beam is deflected when passing through the plurality of first prisms and plurality of second prisms.

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