×

Method and apparatus for stress testing a semiconductor memory

  • US 6,169,696 B1
  • Filed: 10/12/1999
  • Issued: 01/02/2001
  • Est. Priority Date: 09/30/1997
  • Status: Expired due to Term
First Claim
Patent Images

1. A method of testing a semiconductor memory, the method comprising switchably coupling a sense device of the semiconductor memory to at least two pairs of complementary bit conductors in the same memory sub-array of the semiconductor memory at substantially the same time during a test of the semiconductor memory.

View all claims
  • 5 Assignments
Timeline View
Assignment View
    ×
    ×