Charged particle beam irradiation apparatus

• US 6,172,364 B1
• Filed: 07/20/1998
• Issued: 01/09/2001
• Est. Priority Date: 07/29/1997
• Status: Expired due to Term

• Current Assignee: Safety Syringe Corp (Becton, Dickinson & Co)
• Original Assignee: Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Inventors: Yoshitake, Shusuke, Takamatsu, Jun, Itoh, Masamitsu, Shimomura, Naoharu, Abe, Takayuki, Ogasawara, Munehiro
• Primary Examiner(s): Anderson, Bruce C.
• Application Number:
  US09/118,924
• Time in Patent Office: 904 Days
• Field of Search: 250/310, 250/398, 250/505.1, 250/515.1
• US Class Current: 250/310
• CPC Class Codes: H01J 2237/0213 Avoiding deleterious effects due to interactions between particles and tube elements
• CPC Class Codes: H01J 3/40 Traps for removing or diverting unwanted particles, e.g. negative ions, fringing electrons; Arrangements for velocity or mass selection see provisionally also H01J29/46 - H01J29/84
• CPC Class Codes: H01J 37/02 Details

Abstract

A reflection prevention board of a charged particle beam irradiation apparatus of the present invention comprises a laminate sheet having a plurality of thin films and a plurality of microholes through the laminate sheet. According to the present invention the reflection prevention board can be manufactured at a lower cost, the reason being that it is easier to form microholes in the thin films and then laminate these thin films in an aligned relation than to drill holes through a thicker sheet. By doing so it is possible to achieve a better yield. Further, much deeper microholes, which might not otherwise be achieved on a thick sheet, can be formed by using more thin films and a reflection prevention effect can be improved by doing so.

Claims

1. A charged particle beam irradiation apparatus, comprising

an irradiating device configured to irradiate a sample with a charged particle beam;

and

a reflection prevention board configured to prevent the sample from being re-irradiated with reflected particles and/or secondary particles, the reflection prevention board comprising a laminated sheet of a plurality of thin films and a plurality of microholes through the laminated sheet, the microholes being formed in an inclined relation to the reflection prevention board.

2. The charged particle beam irradiation apparatus according to claim 1, wherein the microholes are so arranged as to have their center axes converge.

3. The charged particle beam irradiation apparatus according to claim 1, wherein the microholes are so formed as to define a cylindrical or prismatic configuration each.

4. The charged particle beam irradiation apparatus according to claim 1, wherein the microholes are so formed as to define a truncated conical or a truncated pyramidal configuration each, are arranged as to have their center axes converge.

5. The charged particle beam irradiation apparatus according to claim 1, wherein the reflection prevention board is curved.

6. The charged particle beam irradiation apparatus according to claim 1, wherein the thin films are joined by a plurality of pins in an aligned relation.

7. The charged particle beam irradiation apparatus according to claim 1, wherein at least one of the plurality of thin films is made of a material different from that of the remaining thin film or sheets.

8. The charged particle beam irradiation apparatus according to claim 1, wherein the irradiating device has an electron gun for generating the charged particle beam and an objective lens for focusing the generated charged particle beam onto the sample,

the reflection prevention board is arranged on a sample side of the objective lens and/or under the sample.

9. A charged particle beam irradiation apparatus comprising:

irradiating means for irradiating a sample with a charged particle beam; and

a reflection prevention board having a plurality of microholes, for preventing the sample which is irradiated with the charged particle beam from being re-irradiated with reflected particles/secondary particles, these microholes being inclined with respect to the reflection prevention board.

10. The charged particle beam irradiation apparatus according to claim 9, wherein the microholes are so arranged as to have their center axes converge.

11. The charged particle beam irradiation apparatus according to claim 9, wherein the microholes are so formed as to define a cylindrical or a prismatic configuration each.

12. The charged particle beam irradiation apparatus according to claim 9, wherein the microholes are so formed as to define a truncated conical or a truncated pyramidal configuration each, the center axes of these truncated conical and pyramidal configurations being arranged in a converging relation.

13. The charged particle beam irradiation apparatus according to claim 9, wherein said reflection prevention board is curved.

14. The charged particle beam irradiation apparatus according to claim 9, wherein the irradiating means has an electron gun for generating the charged particle beam and an objective lens for focusing the generated charged particle beam onto the sample and the reflection prevention board is arranged on a sample side of the objective lens and/or under the sample.

15. A charged particle beam irradiation apparatus comprising:

irradiation means for irradiating a sample with a charged particle beam; and

a reflection prevention board for preventing the sample from being re-irradiated with reflected particles and/or secondary particles, the reflection prevention board comprising a laminated sheet of a plurality of thin films in contact with each other and a plurality of microholes extending continuously through the laminated sheet.