Nonvolatile memory array having local program load line repeaters

• US 6,175,520 B1
• Filed: 05/30/1997
• Issued: 01/16/2001
• Est. Priority Date: 05/30/1997
• Status: Expired due to Term

• Current Assignee: Acacia Patent Acquisition Corporation (Acacia Research Corporation)
• Original Assignee: Alliance Semiconductor Corporation
• Inventors: Ray, Abhijit, Reddy, T. Damodar
• Primary Examiner(s): Nelms, David
• Assistant Examiner(s): TRAN, MICHAEL THANH
• Application Number:
  US08/866,094
• Time in Patent Office: 1,327 Days
• Field of Search: 365/185.08, 365/185.13
• US Class Current: 365/185.08
• CPC Class Codes: H03M 1/007 among different resolutions
• CPC Class Codes: H03M 1/206 using a logic interpolation circuit
• CPC Class Codes: H03M 1/365 the voltage divider being a single resistor string

Abstract

A flash EPROM device (100) is disclosed. During a programming operation, a primary programming voltage circuit (116) drives I/O lines (110) to a programming voltage (Vp) according to input data values. Secondary programming voltage circuits (118) are located remotely from the primary programming voltage circuit (116) and further drive I/O lines to Vp in response to the voltage levels on the I/O lines. This arrangement reduces the effect on the load line response of the impedance intermediate the primary programming voltage circuit (116) and the secondary programming voltage circuits (118).

Claims

1. A non-volatile memory device, comprising

a plurality of memory cell arrays, each memory cell array including a plurality of electrically programmable non-volatile memory cells arranged in rows and columns, each memory cell having a terminal for receiving a programming voltage in a programming mode to place the non-volatile memory in a first state, the terminals of memory cells in the same column within an array being commonly coupled to at least one bit line;

a selector associated with each array, each said selector coupling a bit line of its associated array to a data line;

a primary voltage supply circuit for selectively providing the programming voltage to the data line in the programming mode;

at least one secondary voltage supply circuit associated with the data line, the secondary voltage supply circuit providing the programming voltage to the data line in conjunction with said primary voltage supply circuit providing the programming voltage to the data line.

2. The non-volatile memory device of claim 1, wherein:

each electrically programmable non-volatile memory cell is a one-transistor electrically programmable read only memory cell.

3. A non-volatile memory device, comprising

a plurality of memory cell arrays, each memory cell array including a plurality electrically programmable non-volatile memory cells arranged in rows and columns, each memory cell having a terminal for receiving a predetermined voltage in a first mode to place the non-volatile memory in a first state, the terminals of memory cells in the same column within an array being commonly coupled to at least one bit line;

a selector associated with each array, each said selector coupling a bit line of its associated array to a data line;

a primary voltage supply circuit for selectively providing a predetermined voltage to the data line in the first mode;

at least one secondary voltage supply circuit associated with the data line, the secondary voltage supply circuit providing the predetermined voltage to the data line in conjunction with said primary voltage supply circuit providing the predetermined voltage to the data line, and wherein the secondary voltage supply circuit provides the predetermined voltage to the data line in response to at least the voltage level on the data line.

4. The non-volatile memory device of claim 3, wherein:

the primary voltage supply circuit provides the predetermined voltage to the data line in response to at least one input data value.

5. The non-volatile memory device of claim 3, wherein:

the primary voltage supply circuit provides the predetermined voltage to data line in response to at least one primary enable signal.

6. The non-volatile memory device of claim 3, wherein:

the secondary voltage supply circuit provides the predetermined voltage to the data line in response to at least one secondary enable signal.

7. The non-volatile memory device of claim 6, wherein:

the primary voltage supply circuit provides the predetermined voltage to the data line in response to at least one primary enable signal that precedes the secondary enable signal.

8. In a non-volatile memory device having a plurality of memory cells, each memory cell being programmed by applying a program voltage to at least one terminal of the memory cell, a programming architecture, comprising:

a plurality of data input/output (I/O) lines;

a first program load circuit responsive to input data values for coupling selected data I/O, lines to a program voltage; and

a second program load circuit associated with at least one of said data I/O lines for coupling its respective data I/O line to the program voltage in response to the first program load line circuit coupling said data I/O line to the programming voltage.

9. The programming architecture of claim 8, wherein:

the non-volatile memory device receives a positive power supply voltage; and

the program voltage is equivalent the positive power supply voltage.

10. An electrically programmable read-only memory device (EPROM), comprising:

at least one memory cell array;

means for coupling selected memory cells of said memory cell array to a plurality of programming lines;

primary programming means for driving selected programming lines to a programming voltage in response to input data write values; and

secondary programming means for coupling programming lines to the programming voltage in response to the programming lines being driven to the programming voltage by said primary program means.

11. The EPROM of claim 10, wherein:

said EPROM includes a plurality of memory cell arrays;

said means for coupling couples selected memory cells of selected arrays to the plurality of programming lines; and

said secondary programming means are proximate each memory cell array.

12. The EPROM of claim 10, wherein:

said memory cell array includes memory cells arranged in rows and columns, a plurality of memory cells in a given column being coupled to a bit line; and

said means for coupling includes a column selector for coupling selected bit lines to the plurality of programming lines.

13. The EPROM of claim 10, wherein:

said primary programming means includes program voltage coupling means associated with each data line for coupling the data line to the programming voltage in response to an input data write value and a primary enable signal.

14. The EPROM of claim 10, wherein:

said secondary programming means includes detect means for detecting the voltage level on each programming line.

15. A non-volatile memory device, comprising

a plurality of memory cell arrays, each memory cell array including a plurality electrically programmable non-volatile memory cells arranged in rows and columns, each memory cell having a terminal for receiving a predetermined voltage in a first mode to place the non-volatile memory in a first state, the terminals of memory cells in the same column within an array being commonly coupled to at least one bit line;

a selector associated with each array, each said selector coupling a bit line of its associated array to a data line;

a primary voltage supply circuit for selectively providing a predetermined voltage to the data line in the first mode;

at least one secondary voltage supply circuit associated with the data line, the secondary voltage supply circuit providing the predetermined voltage to the data line in conjunction with said primary voltage supply circuit providing the predetermined voltage to the data line, and wherein

the memory cells in each memory cell array are divided into a number of input/output (I/O) groups;

a data line is associated with each I/O group; and

a second voltage supply circuit is coupled to each data line.

16. In a non-volatile memory device having a plurality of memory cells, each memory cell being programmed by applying a program voltage to at least one terminal of the memory cell, a programming architecture, comprising:

a plurality of data input/output (I/O) lines;

a first program load circuit responsive to input data values for coupling selected data I/O lines to a program voltage; and

a second program load circuit associated with at least one of said data I/O lines for coupling its respective data I/O line to the program voltage in response to the first program load line circuit coupling said data I/O line to the programming voltage, and wherein

said first program load circuit couples selected data I/O lines to the program voltage when in an enabled state, said first program load circuit being placed in an enabled state by a primary enable signal.

17. In a non-volatile memory device having a plurality of memory cells, each memory cell being programmed by applying a program voltage to at least one terminal of the memory cell, a programming architecture, comprising:

a plurality of data input/output (I/O) lines;

a first program load circuit responsive to input data values for coupling selected data I/O lines to a program voltage; and

a second program load circuit associated with at least one of said data I/O lines for coupling its respective data I/O line to the program voltage in response to the first program load line circuit coupling said data I/O line to the programming voltage, and wherein

said second program load circuit coupling its respective data I/O line to the program voltage when in an enabled state, said second program load circuit being placed in an enabled state by a secondary enable signal that is delayed with respect to the first enable signal.

18. In a non-volatile memory device having a plurality of memory cells, each memory cell being programmed by applying a program voltage to at least one terminal of the memory cell, a programming architecture, comprising:

a plurality of data input/output (I/O) lines;

a first program load circuit responsive to input data values for coupling selected data I/O lines to a program voltage; and

a second program load circuit associated with at least one of said data I/O lines for coupling its respective data I/O line to the program voltage in response to the first program load line circuit coupling said data I/O line to the programming voltage, and wherein

said first program load circuit includes

a primary program voltage node for supplying the program voltage, and

a primary pull-up device for each data I/O line, each primary pull-up device being responsive to a data input value; and

said second program load circuits each include

a secondary program voltage node for supplying the program voltage, and

a secondary pull-up device responsive to the voltage level on its associated data I/O line of its respective second program load circuit.

19. In a non-volatile memory device having a plurality of memory cells, each memory cell being programmed by applying a program voltage to at least one terminal of the memory cell, a programming architecture, comprising:

a plurality of data input/output (I/O) lines;

a first program load circuit responsive to input data values for coupling selected data I/O lines to a program voltage; and

a second program load circuit associated with at least one of said data I/O lines for coupling its respective data I/O line to the program voltage in response to the first program load line circuit coupling said data I/O line to the programming voltage, and wherein the non-volatile memory device receives a positive power supply voltage; and

the program voltage is equivalent to the positive power supply voltage.