High temperature, conductive thin film diffusion barrier for ceramic/metal systems
First Claim
1. An interposer capacitor comprising:
- a multilayer ceramic substrate comprising a plurality of ceramic layers having therein metallized circuitry, interconnecting metallized vias and bottom to top vias;
a thin film structure electrically connected to the multilayer ceramic substrate, the thin film structure containing at least one capacitor comprising at least one lower first electrode comprising a layer of first conductive material and an upper second electrode comprising a layer of second conductive material with a dielectric material therebetween with each electrode layer being connected by wiring to a corresponding pad on the surface of the thin film structure; and
a barrier layer on the lower surface of the first conductive material, the barrier layer being between the first conductive material and the vias and metallized circuitry of the multilayer ceramic substrate.
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Abstract
A multilayer ceramic substrate having a thin film structure containing capacitor connected thereto is provided as an interposer capacitor, the capacitor employing platinum as the bottom electrode of the capacitor. In a preferred capacitor, a dielectric material such as barium titanate is used as the dielectric material between the capacitor electrodes. The fabrication of the interposer capacitor requires an in-situ or post deposition high temperature anneal and the use of such dielectrics requires heating of the capacitor structure in a non-reducing atmosphere. A layer of a high temperature, thin film diffusion barrier such as TaSiN on the lower platinum electrode between the electrode and underlying multilayer ceramic substrate prevents or minimizes oxidization of the metallization of the multilayer ceramic substrate to which the thin film structure is connected during the fabrication process. A method is also provided for fabricating an interposer capacitor with a multilayer ceramic substrate base and a thin film multilayer structure having at least one capacitor comprising at least one bottom platinum electrode.
140 Citations
15 Claims
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1. An interposer capacitor comprising:
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a multilayer ceramic substrate comprising a plurality of ceramic layers having therein metallized circuitry, interconnecting metallized vias and bottom to top vias;
a thin film structure electrically connected to the multilayer ceramic substrate, the thin film structure containing at least one capacitor comprising at least one lower first electrode comprising a layer of first conductive material and an upper second electrode comprising a layer of second conductive material with a dielectric material therebetween with each electrode layer being connected by wiring to a corresponding pad on the surface of the thin film structure; and
a barrier layer on the lower surface of the first conductive material, the barrier layer being between the first conductive material and the vias and metallized circuitry of the multilayer ceramic substrate.- View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 14)
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9. A method for fabricating an interposer capacitor comprising:
forming a thin film structure on the surface of a multilayer ceramic substrate having metallization therein, metal containing via interconnectings and bottom to top vias, the thin film structure containing at least one capacitor within said thin film structure comprising a first layer of conductive material as a lower first electrode, a dielectric material layer formed on the upper surface of the first electrode and an upper second layer of conductive material on the surface of the dielectric as a second electrode, the first electrode and second electrode being connected to corresponding pads on the surface of the thin film structure by separate wirings from each electrode, the lower first electrode having a barrier layer on the lower surface of the first electrode between the first electrode and the vias and metallization of the multilayer ceramic substrate. - View Dependent Claims (10, 11, 12, 13, 15)
Specification