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Circuitry, apparatus and method for embedding quantifiable test results within a circuit being tested

  • US 6,181,615 B1
  • Filed: 03/30/1998
  • Issued: 01/30/2001
  • Est. Priority Date: 03/30/1998
  • Status: Expired due to Term
First Claim
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1. An integrated circuit, comprising a non-volatile storage device formed in a first address location reserved for receiving information as to a first test result magnitude obtained by performing a first electrical test upon the integrated circuit.

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