Use of converging beams for transmitting electromagnetic energy to power devices for die testing

• US 6,184,696 B1
• Filed: 03/23/1998
• Issued: 02/06/2001
• Est. Priority Date: 03/23/1998
• Status: Expired due to Fees

• Current Assignee: Newport Fab, LLC (Tower Semiconductor Limited)
• Original Assignee: Conexant Systems Incorporated (Synaptics Incorporated)
• Inventors: Johnston, James W., Henderson, P. Michael, White, Stanley A., Walley, Kenneth S., Hale, Kelly H., Siann, Jonathan I., Andrews, Warner B. Jr.
• Primary Examiner(s): Metjahic, Safet
• Assistant Examiner(s): TANG, MINH NHUT
• Application Number:
  US09/046,010
• Time in Patent Office: 1,051 Days
• Field of Search: 324/750, 324/751, 324/158.1, 250/310, 250/311, 250/492.2
• US Class Current: 324/754.22
• CPC Class Codes: G01R 31/3025 Wireless interface with the DUT
• CPC Class Codes: G01R 31/303 of integrated circuits G01R31/305 - G01R31/315 take precedence
• CPC Class Codes: G01R 31/307 of integrated circuits
• CPC Class Codes: G01R 31/311 of integrated circuits G01R31/31728 takes precedence
• CPC Class Codes: G01R 31/315 by inductive methods

Abstract

The described method and apparatus wirelessly test individual integrated circuit die on a wafer containing multiple die. The method incorporates activating a selected die on the wafer by wirelessly impacting the die with at least two beams of electromagnetic radiation so that the die receives radiation energy having at least a first energy level, thereby activating the die by causing a current to flow in the die. Each beam of electromagnetic energy individually has less than the first energy level required to activate the die. The beams of electromagnetic energy are directed so that they at least partially overlap on the selected die. In the region of overlap, the two beams together impact the die with an energy level at least equal to the first energy level required to activate the die. The method may additionally include detecting electromagnetic radiation emitted by the die in response to the electromagnetic energy received from the beams of electromagnetic energy. The apparatus includes an integrated circuit wafer and test apparatus. The integrated circuit wafer contains a plurality of individual die. Each die can be activated by directing electromagnetic energy having at least a first energy level onto that die. The test apparatus includes first and second sources of electromagnetic energy. Each source directs to a selected die on the wafer a beam of electromagnetic energy having an energy level less than the first energy level. The beams at least partially overlap on the selected die so that together they couple to the die energy of at least the first energy level.

Claims

1. A method of wirelessly activating a selected die on a wafer having a plurality of die, wherein said selected die is activated by being impacted by electromagnetic energy having at least a first energy level, the method comprising:

directing a first beam of electromagnetic energy toward said selected die, wherein said first beam of electromagnetic energy impacts said selected die with less than said first energy level;

directing a second beam of electromagnetic energy toward said selected die, wherein said second beam of electromagnetic energy impacts said selected die with less than said first energy level; and

directing said first and second beams of electromagnetic energy so that said first and second beams of electromagnetic energy at least partially overlap on said selected die, wherein said first and second beams together impact said first die with an energy level at least equal to said first energy level.

2. The method of claim 1, wherein said steps of directing said first and second beams of electromagnetic energy comprise directing said first and second beams of electromagnetic energy to a conductive loop on said selected die so that a current is generated in said conductive loop.

3. The method of claim 1, further comprising the steps of:

providing a first electron beam, wherein said first electron beam is modulated at a predetermined frequency by a first intensity modulator such that a time-varying electric field surrounds said electron beam; and

providing a second electron beam wherein said second electron beam is modulated at a predetermined frequency by a second intensity modulator such that a time-varying electric field surrounds said electron beam;

wherein

said first and second beams of the electromagnetic energy comprise the first and second electron beams.

4. The method of claim 3, wherein said steps of directing said first and second beams of electromagnetic energy comprise directing said first and second electron beams with electrically charged deflection plates.

5. The method of claim 1, wherein said selected die radiates an electromagnetic signal when it is activated by being impacted by electromagnetic radiation having an energy level at least equal to said first energy level, and wherein said method additionally comprises detecting said radiated electromagnetic signal.

6. The method of claim 1, wherein said first and second beams of electromagnetic energy are mutually coherent at the point at which they contact the die.