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Testing system for evaluating integrated circuits, a burn-in testing system, and a method for testing an integrated circuit

  • US 6,189,120 B1
  • Filed: 02/29/2000
  • Issued: 02/13/2001
  • Est. Priority Date: 01/21/1998
  • Status: Expired due to Term
First Claim
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1. A burn-in testing system for evaluating a circuit under test, the system comprising:

  • a burn-in board having a plurality of receptacles, at least one of which is configured to receive the circuit under test and to supply power thereto;

    test interface circuitry supported by the burn-in board and coupled to the receptacles, the test interface circuitry including a transmitter and is a receiver;

    a test compartment selectively receiving the burn-in board; and

    an interrogator unit supported by the test compartment and having a radio communication range extending to the test interface circuitry, the interrogator unit being configured to send commands through the receiver to the test interface circuitry to exercise the circuit under test via radio communication and to receive responses to the commands from the transmitter via radio communication.

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