Methods and apparatus for high speed longitudinal scanning in imaging systems

• US 6,191,862 B1
• Filed: 01/20/1999
• Issued: 02/20/2001
• Est. Priority Date: 01/20/1999
• Status: Expired due to Term

• Current Assignee: LightLab Imaging, Inc. (Abbott Laboratories Incorporated)
• Original Assignee: Lightlab Imaging, LLC
• Inventors: Petersen, Christopher L., Swanson, Eric A.
• Primary Examiner(s): Font, Frank G.
• Assistant Examiner(s): NATIVIDAD, PHILIP SANA
• Application Number:
  US09/233,421
• Time in Patent Office: 762 Days
• Field of Search: 356/345, 356/347
• US Class Current: 356/479
• CPC Class Codes: A61B 5/0066 Optical coherence imaging
• CPC Class Codes: A61B 5/0084 for introduction into the body, e.g. by catheters A61B5/1459 takes precedence
• CPC Class Codes: G01B 11/2441 using interferometry
• CPC Class Codes: G01B 2290/35 Mechanical variable delay line
• CPC Class Codes: G01B 9/02002 using two or more frequencies
• CPC Class Codes: G01B 9/02028 Two or more reference or object arms in one interferometer
• CPC Class Codes: G01B 9/02064 by particular adjustment of coherence gate, i.e. adjusting position of zero path difference in low coherence interferometry
• CPC Class Codes: G01B 9/02069 Synchronization of light source or manipulator and detector
• CPC Class Codes: G01B 9/02074 of the detector
• CPC Class Codes: G01B 9/02083 characterised by particular signal processing and presentation
• CPC Class Codes: G01B 9/02091 Tomographic interferometers, e.g. based on optical coherence
• CPC Class Codes: G01N 21/4795 spatially resolved investigating of object in scattering medium in vivo A61B

Abstract

An imaging system wherein an optical signal is transmitted to both a sample to be measured and a rotating element which is calibrated to the system. A return signal is detected by the system, and a scan analyzer and correction unit uses the system calibration information along with synchronization information to correct for return signal degradation or errors due to imperfections in the rotating element in real time. This allows for an accurate measurement of the sample. The system can also include a coarse path-length adjustment unit to allow the system to track a region of interest within a sample to further allow for accurate sample measurement.

Claims

1. An apparatus, comprising:

an interferometer which receives broadband light and outputs a reference output signal and a probe signal directed to a sample which produces a sample return signal;

an optical path-length scanning unit which receives the reference output signal from the interferometer and outputs a reference return signal to said interferometer, said interferometer combining the reference return signal and the sample return signal and outputting an interferometer output signal;

a detector unit which receives the interferometer output signal and outputs a detector output signal;

a scan analyzer and correction unit coupled to said detector unit that receives the detector output signal; and

a scanning unit controller coupled to an optical path-length scanning unit, said scanning unit controller controls said optical path-length scanning unit and outputs a controller signal to said scan analyzer and correction unit, wherein said scan analyzer and correction unit analyzes the controller signal and the detector output signal and determines scan correction information.

2. The apparatus of claim 1, wherein said scan analyzer and correction unit comprises an optical path-length position unit which receives the controller signal and detector output signal and generates scan correcting data.

3. The apparatus of claim 2, wherein said optical path-length position unit comprises a scan correction unit and a marker detector, wherein said marker detector receives said controller signal and outputs marker information to said scan correction unit which analyzes said detector output signal and said marker information and outputs said scan correction data.

4. The apparatus of claim 3, wherein said scan analyzer and correction unit further comprises a signal correction processor which receives said scan correction data and modifies said detector output signal using said scan correction data and outputs scan corrected sample data.

5. The apparatus of claim 1, wherein the optical path-length scanning unit comprises a rotating element.

6. The apparatus of claim 5, wherein said rotating element comprises a CAM.

7. The apparatus of claim 1, wherein said optical path-length scanning unit comprises a reflecting surface and said scanning unit controller includes a galvanometric motor.

8. The apparatus of claim 1, wherein said interferometer comprises a double-pass unit.

9. The apparatus of claim 1, wherein said optical path-length scanning unit comprises a rotating helical mirror.

10. The apparatus of claim 9, wherein said rotating helical mirror has a depth which varies approximately linearly in time when driven at an approximate constant rotational speed.

11. The apparatus of claim 1, wherein said optical path-length scanning unit comprises a rotating disc.

12. The apparatus of claim 11, wherein said rotating disc is transmissive.

13. The apparatus of claim 11, wherein said rotating disc is reflective.

14. The apparatus of claim 11, wherein said rotating disc has an index-of-refraction that varies with angle of rotation.

15. The apparatus of claim 1, wherein the said optical path-length scanning unit comprises a translational element.

16. The apparatus of claim 1, wherein the said optical path-length scanning unit comprises a rotating element and a translational element.

17. The apparatus of claim 1, wherein said optical path-length scanning unit comprises a reflective surface mechanically coupled to a rotating belt.

18. The apparatus of claim 1, further comprising a coarse path-length adjustment mechanism.

20. The apparatus according to claim 1, wherein the optical path length scanning unit substantially retro-reflects the reference output signal received from the interferometer to output a reference return signal to said interferometer.

22. The apparatus according to claim 5, wherein the rotating element comprises micro retro-reflectors.

19. An apparatus, comprising:

an interferometer which receives broadband light and outputs a reference output signal and a probe signal directed to a sample which produces a sample return signal;

a rotating optical path-length scanning unit which receives the reference output signal and outputs a reference return signal to said interferometer, said interferometer combining the reference return signal and the sample return signal and outputting an interferometer output signal;

a detector unit for receiving the interferometer output signal and outputting a detector output signal;

scan analyzer and correction unit coupled to said detector unit including an optical path-length position unit for receiving the detector output signal; and

scanning unit controller coupled to said rotating optical path-length scanning unit, for controlling said rotating optical path-length scanning unit and for outputting a controller signal to said scan analyzer and correction unit, wherein said scan analyzer and correction unit analyzes the controller signal and the detector output signal and determines scan correction information.

21. The apparatus according to claim 19, wherein the rotating optical path length scanning unit substantially retro-reflects the reference output signal received from the interferometer to output a reference return signal to said interferometer.

23. The apparatus according to claim 19, wherein the rotating optical path-length scanning unit comprises a rotating element having micro retro-reflectors.