Fan and pencil beams from a common source for x-ray inspection

• US 6,192,104 B1
• Filed: 11/24/1999
• Issued: 02/20/2001
• Est. Priority Date: 11/30/1998
• Status: Expired due to Term

• Current Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Original Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Inventors: Grodzins, Lee, Adams, William
• Primary Examiner(s): Bruce, David V.
• Assistant Examiner(s): Ho, Allen C
• Application Number:
  US09/448,717
• Time in Patent Office: 454 Days
• Field of Search: 378/51, 378/53, 378/54, 378/55, 378/57, 378/86, 378/88, 378/89, 378/90, 378/145, 378/146, 378/147, 378/149, 378/150, 378/160
• US Class Current: 378/90
• CPC Class Codes: G01N 23/203 Measuring back scattering
• CPC Class Codes: G01V 5/22 Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
• CPC Class Codes: G01V 5/222 measuring scattered radiation

Abstract

A system and method for inspecting an object, where both a fan beam and a pencil beam of penetrating radiation are used to illuminating the object concurrently. Both beams may be derived from a single source of penetrating radiation. The pencil beam is noncoplanar with the fan beam and may be scanned with respect to the object. Radiation scattered from the pencil beam within the object is detected, and the scatter signal thus generated is used in conjunction with a transmission signal which characterizes attenuation of the fan beam by the object.

Claims

1. An inspection system for inspecting an object, the system comprising:

(a) a source of penetrating radiation for providing a pencil beam and a fan beam, the pencil beam being noncoplanar with the fan beam;

(b) a first detector arrangement for detecting penetrating radiation from the fan beam transmitted through the object and generating a transmitted radiation signal;

(c) a second detector arrangement for detecting penetrating radiation from the pencil beam scattered by the object and generating a scattered radiation signal; and

(d) a controller for determining at least one characteristic of the object based at least on the transmitted and scattered radiation signals.

2. The inspection system as set forth in claim 1, wherein the source of penetrating radiation is an x-ray source.

3. The inspection system as set forth in claim 2, wherein the source of penetrating radiation is a pulsed x-ray source.

4. The inspection system as set forth in claim 2, wherein the source of penetrating radiation is an x-ray tube.

5. The inspection system as set forth in claim 2, wherein the source of penetrating radiation is a linear accelerator.

6. The inspection system as set forth in claim 1, further including a collimator for shaping the fan beam.

7. The inspection system as set forth in claim 1, further including a scanner arrangement for varying the orientation of the pencil beam with respect to the object.

8. The inspection system as set forth in claim 1, wherein the object is in motion with respect to at least one of the pencil and fan beams.

9. A method for characterizing an object, the method comprising:

(a) illuminating the object with penetrating radiation formed into a fan beam defining a plane and simultaneously into a pencil beam noncoplanar with the fan beam;

(b) detecting penetrating radiation from the fan beam transmitted through the object so as to generate a transmitted radiation signal;

(c) detecting penetrating radiation from the pencil beam scattered by the object so as to generate a scattered radiation signal; and

(d) determining at least one characteristic of the object based at least on the transmitted and scattered radiation signals.

10. A method according to claim 9, further including:

(e) varying the orientation of the pencil beam with respect to the enclosure.