Electronic circuit testing methods and apparatus

• US 6,195,772 B1
• Filed: 05/02/1997
• Issued: 02/27/2001
• Est. Priority Date: 06/21/1996
• Status: Expired due to Fees

• Current Assignee: Altera Corporation (Intel Corporation)
• Original Assignee: Altera Corporation (Intel Corporation)
• Inventors: Marshall, Howard, Ito, Ken A., Althouse, Lee R., Swan, Richard, Mielke, Bruce F., Hendricks, Matthew C.
• Primary Examiner(s): MOISE, EMMANUEL LIONEL
• Application Number:
  US08/850,790
• Time in Patent Office: 1,397 Days
• Field of Search: 714/744, 714/724, 714/725, 714/733, 714/734, 714/735, 714/736, 714/738, 714/815, 714/742, 324/73.1
• US Class Current: 714/724
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736
• CPC Class Codes: G01R 31/3016 Delay or race condition test, e.g. race hazard test
• CPC Class Codes: G01R 31/31727 Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks G01R31/31725 takes precedence; concerning scan test G01R31/318552, for tester hardware G01R31/31922
• CPC Class Codes: G01R 31/31907 Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
• CPC Class Codes: G01R 31/31922 Timing generation or clock distribution G01R31/3191 takes precedence

Abstract

An electronic circuit tester (e.g., for testing integrated circuit wafers or packaged integrated circuits) is provided. The tester is preferably based on a relatively inexpensive computer system such as a personal computer and includes at least one high-precision clock circuit that is programmable with respect to frequency and number of clock pulses. The high-precision clock circuit is connectable to the circuit being tested to permit certain timing-critical tests to be performed, even though a large number of other data channels in the tester are controlled by a relatively low speed clock circuit. The tester also includes analog circuitry that can be programmed to provide various analog signals suitable for performing parametric testing on an electronic device under test.

Claims

1. A tester configured to test an electronic circuit under test comprising:

a high speed clock channel configured to selectively output a high speed clock signal for application to said electronic circuit under test;

a plurality of data channels configured to selectively convey data signals to and from said electronic circuit under test;

a low speed clock signal circuit configured to control the timing of operations of said data channels;

wherein said high speed clock signal is of a higher speed and is more precise relative to said low speed clock signal;

analog circuitry configured to selectively generate and apply parametric test signals to said circuit under test; and

programmable interconnection circuitry coupled to a plurality of leads on said circuit under test that allow at least one data signal and at least one parametric signal to be simultaneously applied to different leads on said circuit under test.

2. The tester defined in claim 1 further comprising:

a computer, wherein said low speed clock signal circuit is part of said computer which at least partly controls said tester, said low speed clock signal circuit controlling at least some operations of said computer.

3. The tester defined in claim 2 wherein said low speed clock signal circuit is the clock circuit of an interface bus of said computer.

4. The tester defined in claim 2 wherein said interface bus is a peripheral component interface (PCI) bus.

5. The tester defined in claim 1 further comprising control circuitry configured to sequentially (1) cause one of said data channels to output a data signal for application to said electronic circuit under test, (2) operate said high speed clock channel, and (3) cause one of said data channels to input a data signal from said electronic circuit under test.

6. The tester defined in claim 5 wherein said control circuitry is controlled by said low speed clock signal circuit with respect to the timing of said events (1), (2), and (3).

7. The tester defined in claim 1 wherein said high speed clock channel is programmable with respect to the speed of said high speed clock signal.

8. The tester defined in claim 1 wherein said high speed clock channel is programmable with respect to the duration of said high speed clock signal.

9. The tester defined in claim 1 wherein said high speed clock channel is programmable with respect to the number of cycles of said high speed clock signal.

10. The tester defined in claim 1 wherein said low speed clock signal circuit has a fixed frequency of operation.

11. The tester defined in claim 1 wherein said data signals are logic-type signals.

12. The tester defined in claim 1 wherein said parametric signals comprise

an analog signal having any one of a plurality of different analog signal characteristic values for application to said electronic circuit under test via one of said channels.

13. The tester defined in claim 12 wherein said analog signal characteristic is voltage.

14. The tester defined in claim 13 wherein said analog circuitry includes analog measurement circuitry configured to measure the current of said analog signal when said analog signal is applied to said electronic circuit under test.

15. The tester defined in claim 12 wherein said analog signal characteristic is current.

16. The tester defined in claim 15 wherein said analog circuitry includes analog measurement circuitry configured to measure the voltage of said analog signal when said analog signal is applied to said electronic circuit under test.

17. The tester defined in claim 1 further comprising:

a programmable computer configured to at least partly control said channels.

18. The tester defined in claim 17 wherein said computer is of the personal computer class.

19. The tester defined in claim 17 wherein said channels are part of interface circuitry between said computer and said electronic circuit under test.

20. The tester defined in claim 19 wherein said interface circuitry is programmable by said computer.

21. The tester defined in claim 20 wherein said interface circuitry comprises programmable logic devices.

22. The tester defined in claim 20 wherein said interface circuitry includes signal sequence generating circuitry configured to generate a succession of data signals which said data channels apply to said electronic circuit under test.

23. The tester defined in claim 22 wherein said low speed clock signal circuit is part of said computer, and wherein said signal sequence generating circuitry is responsive to said low speed clock signal circuit so that said succession of data signals has a frequency related to the frequency of said low speed clock signal circuit.

24. The tester defined in claim 23 wherein said low speed clock signal circuit is an interface bus clock circuit of said computer.

25. The tester defined in claim 24 wherein said interface bus clock circuit is a PCI bus clock circuit.

26. The tester defined in claim 19 further comprising a memory for data indicative of corresponding data signals that are to be conveyed to said electronic circuit under test via said data channels, and wherein said interface circuitry includes bus master circuitry configured to selectively control retrieval of said data from said memory in order to cause said data channels to apply said corresponding data signals to said electronic circuit under test.

27. The tester defined in claim 19 wherein said interface circuitry includes comparison circuitry configured to compare data signals conveyed from said electronic circuit under test via said data channels to data signals expected from said electronic circuit under test in response to data signals conveyed to said electronic circuit under test via said data channels.

28. The tester defined in claim 27 wherein said comparison circuitry includes latch circuitry configured to store a test result signal produced by said comparison circuitry to indicate whether or not data signals conveyed from said electronic circuit under test are the same as data signals expected from said electronic circuit under test.

29. The tester defined in claim 28 wherein said latch circuitry is addressable by said computer to allow said computer to read said test result signal.

30. The tester defined in claim 17 further comprising a memory for data indicative of corresponding data signals that are to be conveyed to said electronic circuit under test via said data channels, and wherein said computer includes a processor configured to selectively control retrieval of said data from said memory in order to cause said data channels to apply said corresponding data signals to said electronic circuit under test.

31. Apparatus configured to test an electronic circuit under test which has a plurality of electrical signal terminals comprising:

a programmable computer including a memory and an interface bus configured to transmit signals at a predetermined bus clock rate, said memory storing test vector data indicative of input signals to be applied to terminals of said electronic circuit under test and output signals expected from said electronic circuit under test in response to said input signals, said test vector data including data indicative of a number of bus clock cycles to allow between application of said input signals and testing for said output signals;

interface circuitry connected to said bus and coupled between said computer and said electronic circuit under test and configured to receive said test vector data and respond to said test vector data by applying to terminals of said electronic circuit under test the input signals indicated by said test vector data and by testing for output signals of said electronic circuit under test indicated by said test vector data when said number of bus clock cycles have elapsed after application of said input signals; and

analog circuitry coupled to said interface circuitry configured to selectively generate analog signals having any one of a plurality of different analog signal characteristic values;

said interface circuitry optionally using said analog signals as an input applied to at least one terminal of said electronic circuit under test while simultaneously using said test vector data as input to at least one different terminal of said electronic circuit under test.

32. The apparatus defined in claim 31 wherein said bus transmits a cyclical bus clock signal having periodic signal level transitions at said bus clock rate, and wherein said interface circuitry is responsive to said bus clock signal by applying said input signals to terminals of said electronic circuit under test in synchronism with a first transition in said bus clock signal and for testing for said output signals of said electronic circuit under test in synchronism with a second transition in said bus clock signal, said second transition being separated from said first transition by said number of bus clock cycles.

33. The apparatus defined in claim 31 wherein said electronic circuit under test includes a clock signal input terminal, and wherein said interface circuitry includes a high speed clock signal generating circuit configured to selectively generate a high speed clock signal that is applied to said clock signal input terminal, said high speed clock signal having a frequency that is higher than said bus clock rate.

34. The apparatus defined in claim 33 wherein said high speed clock signal generating circuit is programmable to generate said high speed clock signal with any one of a plurality of different frequencies.

35. The apparatus defined in claim 34 wherein said plurality of different frequencies are independent of said bus clock rate.

36. The apparatus defined in claim 33 wherein said high speed clock signal generating circuit is programmable to generate any one of a plurality of different numbers of cycles of said high speed clock signal.

37. The apparatus defined in claim 31 wherein said electronic circuit under test includes logic circuitry, at least some of said terminals being terminals of said logic circuitry, and wherein said input signals applied to terminals of said logic circuitry by said interface circuitry are logic-type input signals.

38. The apparatus defined in claim 37 wherein said interface circuitry tests output signals of terminals of said logic circuitry as logic-type output signals.

39. The apparatus defined in claim 31 wherein said analog signal characteristic is voltage.

40. The apparatus defined in claim 39 wherein said analog circuitry includes analog measurement circuitry configured to measure the current of said analog signal when said analog signal is used as an input signal applied to a terminal of said electronic circuit under test.

41. The apparatus defined in claim 31 wherein said analog signal characteristic is current.

42. The apparatus defined in claim 41 wherein said analog circuitry includes analog measurement circuitry configured to measure the voltage of said analog signal when said analog signal is used as an input signal applied to a terminal of said electronic circuit under test.

43. The apparatus defined in claim 31 wherein said interface circuitry includes a programmable logic device which is programmable by said computer to associate any one of a plurality of physical locations in said interface circuitry with each of said terminals of said electronic circuit under test, each of said physical locations being a source of one of said input signals or a receiver of one of said output signals.

44. The apparatus defined in claim 31 wherein said interface circuitry includes signal sequence generating circuitry configured to respond to certain test vector data and said bus clock signals by producing a succession of said input signals synchronized with said bus clock signal without the need for additional test vector data during said succession.

45. The apparatus defined in claim 31 wherein said interface circuitry includes a programmable logic device which is programmable by said computer with respect to the manner in which said interface circuitry responds to test vector data.

46. The apparatus defined in claim 45 wherein said programmable logic device is reprogrammable by said computer.

47. The apparatus defined in claim 31 wherein said computer additionally includes a processor configured to selectively control retrieval of said test vector data from said memory and transmission of retrieved test vector data to said interface circuitry via said bus.

48. The apparatus defined in claim 47 wherein said interface circuitry includes bus master circuitry configured to selectively use said bus to directly access said memory for said test vector data without using said processor for such memory access.

49. The apparatus defined in claim 31 wherein said interface circuit includes comparison circuitry configured to compare output signals of said electronic circuit under test indicated by said test vector data to said output signals expected from said electronic circuit under test in response to said input signals.

50. The apparatus defined in claim 49 wherein said comparison circuitry includes latch circuitry configured to store a test result signal produced by said comparison circuitry to indicate whether or not said output signals of said electronic circuit under test indicated by said test vector data are the same as said output signals expected from said electronic circuit under test in response to said input signals.

51. The apparatus defined in claim 50 wherein said latch circuitry is addressable by said computer to allow said computer to read said test result signal.

52. The apparatus defined in claim 31 wherein said computer is of the personal computer class.

53. The tester defined in claim 31 wherein said interface bus is a peripheral component interface (PCI) bus.

54. The method of testing the operating speed of a circuit under test using a circuit tester which has a high speed clock channel configured to output a high speed a clock signal, and a plurality of data channels configured to convey data signals, said high speed clock signal being of higher speed and greater timing precision relative to said data signals, said circuit under test having an input terminal, an output terminal, and intermediate circuitry connected to said input terminal and configured to produce at said output terminal an output data signal that is dependent on response of said intermediate circuitry to the signal received via said input terminal, said method comprising:

connecting said high speed clock channel to said input terminal;

connecting a data channel to said output terminal;

operating said high speed clock channel to output said high speed clock signal to a predetermined extent, after which said high speed clock signal is stopped;

after said high speed clock signal has stopped, using said data channel that is connected to said output terminal to read out said output data signal;

comparing said data output signal that is read out via said data channel to a value that is associated with proper operation of said digital circuit under test; and

if said data output signal that is read out via said data channel compares favorably to said value, repeating said operating, using, and comparing with increased high speed clock signal speed.

55. The method defined in claim 54 wherein said repeating is performed with increased high speed clock signal speeds until said data output signal that is read out via said data channel no longer compares favorably to said value.

56. The method defined in claim 54 further comprising:

if said data output signal that is read out via said data channel does not compare favorably to said value, repeating said operating, using, and comparing with decreased high speed clock signal speed.

57. The method defined in claim 56 wherein said repeating is performed with decreased high speed clock signal speeds until said data output signal that is read out via said data channel compares favorably to said values.

58. The method defined in claim 54 wherein said operating and using are repeated using successive high speed clock signal speeds that are selected according to a binary test sequence.

59. The method defined in claim 54 wherein said digital circuit under test has a maximum possible speed which is to be determined but which is known to be in a range between a lower limit and an upper limit, and wherein in said operating said high speed clock channel is operated to produce said high speed clock signal at a first speed which is intermediate said lower and upper limits.

60. The method defined in claim 59 further comprising:

selecting a new speed for said high speed clock signal which is intermediate said first speed and said upper limit if said output data signal compares favorably to a value that is associated with proper operation of said digital circuit under test;

selecting a new speed for said high speed clock signal which is intermediate said first speed and said lower limit if said output data signal does not compare favorably to a value that is associated with proper operation of said digital circuit under test; and

repeating said operating with said high speed clock signal at said new speed.

61. The method defined in claim 60 wherein said first speed is midway between said lower and upper limits, and wherein said new speed is midway between said first speed and one of said lower and upper limits.

62. The method defined in claim 59 wherein said first speed is midway between said lower and upper limits.

63. The method defined in claim 54 wherein said intermediate circuitry includes a counter;

said method being characterized by configuring said counter to count pulses in the signal received via said input terminal wherein said data output signal is indicative of the count registered by said counter.

64. The method defined in claim 54 wherein said digital circuit under test also has a second input terminal configured to receive a data input signal, wherein said intermediate circuitry is also connected to said second input terminal, wherein said data output signal is also dependent on said data input signal, and wherein said method further comprises:

connecting a data channel to said second input terminal; and

prior to operating said high speed clock channel, employing said data channel that is connected to said second input terminal to apply said data input signal to said second input terminal.

65. The method defined in claim 64 wherein said intermediate circuitry includes first and second registers and medial circuitry, said first register having an input lead connected to said second input terminal, a clock lead connected to said input terminal, and an output lead connected to said output terminal, each of said registers storing and outputting the signal applied to its input lead in response to a high speed clock signal applied to its clock lead, and said medial circuitry producing at its output a signal indicative of the signal applied to its input, and wherein said method further comprises:

comparing said data output signal that is read out via said data channel to a value that is associated with proper operation of said medial circuitry in response to said data input signal.

66. The method defined in claim 65 further comprising:

if said data output signal that is read out via said data channel compares favorably to said value, repeating and operating, using, employing, and comparing with increased high speed clock signal speed.

67. The method defined in claim 66 wherein said repeating is performed with increased high speed clock speeds until said data output signal that is read out via said data channel no longer compares favorably to said value.

68. The method defined in claim 65 further comprising:

if said data output signal that is read out via said data channel does not compare favorably to said value, repeating said operating, using, employing, and comparing with decreased high speed clock signal speed.

69. The method defined in claim 68 wherein said repeating is performed with decreased high speed clock signal speeds until said data output signal that is read out via said data channel compares favorably to said value.