Ferroelectric flat panel displays

• US 6,198,225 B1
• Filed: 06/07/1999
• Issued: 03/06/2001
• Est. Priority Date: 06/07/1999
• Status: Expired due to Fees

• Current Assignee: Matsushita Electric Industrial Company Limited (Panasonic Holdings Corporation), Symetrix Corporation
• Original Assignee: Matsushita Electric Corporation (Panasonic Holdings Corporation), Symetrix Corporation
• Inventors: Shimada, Yasuhiro, Paz de Araujo, Carlos A., Arita, Koji, Hayashi, Shinichiro, McMillan, Larry D., Cuchiaro, Joseph D., Kano, Gota
• Primary Examiner(s): Wong, Don
• Assistant Examiner(s): TRAN, CHUC
• Application Number:
  US09/326,838
• Time in Patent Office: 638 Days
• Field of Search: 315/169.3, 315/169.1, 313/459, 313/500, 313/502, 313/505, 345/74, 345/75, 345/76, 345/79
• US Class Current: 315/169.3
• CPC Class Codes: G09G 3/22 using controlled light sources
• CPC Class Codes: G09G 3/367 with a nonlinear element in series with the liquid crystal cell, e.g. a diode, or M.I.M. element
• CPC Class Codes: H01J 1/30 Cold cathodes, e.g. field-emissive cathode
• CPC Class Codes: H01J 2201/306 Ferroelectric cathodes
• CPC Class Codes: H01J 2329/00 Electron emission display panels, e.g. field emission display panels

Abstract

A thin film of ferroelectric layered superlattice material in a flat panel display device is energized to selectively influence the display image. In one embodiment, a voltage pulse causes the layered superlattice material to emit electrons that impinge upon a phosphor, causing the phosphor to emit light. In another embodiment, an electric potential creates a remanent polarization in the layered superlattice material, which exerts an electric field in liquid crystal layer, thereby influencing the transmissivity of light through the liquid crystal. The layered superlattice material is a metal oxide formed using an inventive liquid precursor containing an alkoxycarboxylate. The thin film thickness is preferably in the range 50-140 nm, so that polarizabilty and transparency of the thin film is enhanced. A display element may comprise a varistor device to prevent cross-talk between pixels and to enable sudden polarization switching. A functional gradient in the ferroelectric thin film enhances electron emission. Two ferroelectric elements, one on either side of the phosphor may be used to enhance luminescence. A phosphor can be sandwiched between a dielectric and a ferroelectric to enhance emission.

Claims

1. An optical display device comprising:

a ferroelectric thin film, said ferroelectric thin film having a polarization that can be changed by application of a voltage bias;

a variable voltage source for providing a voltage bias for changing said polarization;

a phosphor layer that is selectively operable for optical effects by influence of ferroelectric electron emission, said phosphor layer located on said ferroelectric thin film; and

a varistor device for modifying said voltage bias, said varistor device electrically connected or connectable to said variable voltage source.

2. An optical display device as in claim 1, wherein said varistor device comprises a switching electrode, a varistor electrode and a nonohmic thin film disposed between said switching electrode and said varistor electrode.

3. An optical display device as in claim 2, wherein said nonohmic thin film has a thickness not exceeding 500 nm.

4. An optical display device as in claim 2, wherein said nonohmic thin film includes a zinc oxide portion as a majority portion of said nonohmic thin film.

5. An optical display device as in claim 4, wherein said nonohmic thin film further includes a dopant selected from the group consisting of bismuth, yttrium, praseodymium, cobalt, antimony, manganese, silicon, chromium, titanium, potassium, nickel boron, aluminum, dysprosium, cesium, cerium, iron, and mixtures thereof.

6. An optical display device as in claim 2, further comprising a substrate, a first switching electrode on said substrate, and a second switching electrode, said nonohmic thin film located between said first switching electrode and said varistor electrode, said ferroelectric thin film located on said varistor electrode, said second switching electrode located above said ferroelectric thin film, and said phosphor layer located on said ferroelectric thin film.

7. An optical display device as in claim 2, further comprising a substrate, a first switching electrode and a second switching electrode, said nonohmic thin film located between said second switching electrode and said varistor electrode, said ferroelectric thin film located between said first switching electrode and said varistor electrode, and said phosphor layer located on said ferroelectric thin film and on said varistor electrode.

8. An optical display device as in claim 1, wherein said ferroelectric thin film is a ferroelectric FGM thin film.

9. An optical display device having a luminescent layer that is selectively operable for optical effects by influence of ferroelectric electron emission, and a ferroelectric FGM thin film located proximate said luminescent layer for selective operation thereof.

10. An optical display device as in claim 9 wherein said ferroelectric FGM thin film contains moieties of first metal atoms in relative molar proportions corresponding to a stoichiometric formula of a ferroelectric compound and moieties of second metal atoms in relative molar proportions corresponding to a stoichiometric formula of a dielectric compound, and said ferroelectric FGM thin film having a functional gradient of said moieties of first metal atoms and second metal atoms.

11. An optical display device as in claim 10, wherein said ferroelectric compound is a ferroelectric metal oxide.

12. An optical display device as in claim 11, wherein said ferroelectric metal oxide is a ferroelectric layered superlattice material.

13. An optical display device as in claim 12, wherein said ferroelectric FGM thin film comprises at least two metals selected from the group consisting of strontium, calcium, barium, cadmium, lead, tantalum, hafnium, tungsten, niobium, zirconium, bismuth, scandium, yttrium, lanthanum, antimony, chromium, molybdenum, vanadium, ruthenium and thallium.

14. An optical display device as in claim 12, wherein said first metal atoms include the metals strontium, bismuth, tantalum, and niobium.

15. An optical display device as in claim 12, wherein said first metal atoms include the metals strontium, bismuth and tantalum in relative molar proportions corresponding to a stoichiometric formula SrBi_2+y(Ta₁₋

x,Nb_x)₂O₉, wherein 0≦

x≦

1 and 0≦

y≦

0.20.

16. An optical display device as in claim 11, wherein said ferroelectric metal oxide is an ABO₃-type perovskite.

17. An optical display device as in claim 16, wherein said first metal atoms include lead, zirconium and titanium.

18. An optical display device as in claim 17, wherein said first metal atoms include lead, zirconium and tantalum in relative molar proportions represented by a generalized stoichiometric formula Pb_1+y(Zr₁₋

xTi_x)O₃, wherein 0≦

x≦

1 and 0≦

y≦

0.1.

19. An optical display device as in claim 10, wherein said dielectric compound comprises an oxide selected from the group consisting of CeO₂.

20. An optical display device as in claim 9, wherein said ferroelectric FGM thin film is a FGF thin film, said FGF thin film containing moieties of a plurality of types of metal atoms in relative molar proportions corresponding to stoichiometric formulas of ferroelectric compounds, said FGM thin film having a functional gradient of said moieties of metal atoms.

21. An optical display device as in claim 20, wherein said ferroelectric compounds are ferroelectric metal oxides.

22. An optical display device as in claim 21, wherein said ferroelectric metal oxides are ABO₃-type perovskites.

23. An optical display device as in claim 22, wherein said types of metal atoms are lead, zirconium and tantalum, and said stoichiometric formulas are represented by a generalized stoichiometric formula Pb(Zr₁₋

xTi_x)O₃, wherein x varies in correspondence with said functional gradient and 0≦

x≦

1.

24. An optical display device as in claim 21, wherein said ferroelectric metal oxides are layered superlattice materials.

25. An optical display device as in claim 24, wherein said FGF thin film comprises at least two metals selected from the group consisting of strontium, calcium, barium, cadmium, lead, tantalum, hafnium, tungsten, niobium, zirconium, bismuth, scandium, yttrium, lanthanum, antimony, chromium, molybdenum, vanadium, ruthenium and thallium.

26. An optical display device as in claim 25, wherein said types of metal atoms include strontium, bismuth, tantalum and niobium.

27. An optical display device as in claim 24, wherein said stoichiometric formulas are represented by a generalized stoichiometric formula SrBi₂(Ta₁₋

xNb_x))₂O₉, wherein x varies in correspondence with said functional gradient and 0≦

x≦

1.

28. An optical display device as in claim 9, further comprising a first switching electrode and a second switching electrode, said ferroelectric thin film located above said first switching electrode, said luminescent layer located on said ferroelectric thin film, and said second switching electrode located on said luminescent layer.

29. An optical display device comprising a luminescent layer that is selectively operable for optical effects by influence of ferroelectric electron emission, a ferroelectric thin film located proximate said luminescent layer for selective operation thereof, a first switching electrode and a second switching electrode, said ferroelectric thin film located above said first switching electrode, said luminescent layer located on said ferroelectric thin film, and said second switching electrode located on said luminescent layer.

30. An optical display device comprising a luminescent layer that is selectively operable for optical effects by influence of ferroelectric electron emission, a first switching electrode and a second switching electrode, a bottom ground electrode and a top ground electrode, and a first ferroelectric thin film and a second ferroelectric thin film, said first ferroelectric thin film located between said first switching electrode and said bottom ground electrode, said second ferroelectric thin film located between said top ground electrode and said second switching electrode, and said luminescent layer located between said bottom ground electrode and said top ground electrode.

31. An optical display device comprising a luminescent layer that is selectively operable for optical effects, a bottom first switching electrode and a bottom second switching electrode, a top first switching electrode and a top second switching electrode, a bottom ferroelectric thin film and a top ferroelectric thin film, and a variable voltage source for providing a voltage bias to said switching electrodes, said bottom ferroelectric thin film located between said bottom first switching electrode and said bottom second switching electrode, said top ferroelectric thin film located between said top second switching electrode and said top-first switching electrode, and said luminescent layer located between said bottom second switching electrode and said top second switching electrode, wherein said voltage bias applied to said top first switching electrode and said bottom second switching electrode is the same, and said voltage bias applied to said top second switching electrode and said bottom first switching electrode is the same.

32. An optical display device comprising a luminescent layer that is selectively operable for optical effects, a bottom switching electrode, a bottom ground electrode, a top switching electrode, a ferroelectric thin film, a dielectric thin film, a variable high-voltage alternating current source for providing a voltage bias to said top switching electrode, and a variable low-voltage source for providing a voltage bias to said bottom switching electrode, said ferroelectric thin film located between said bottom switching electrode and said bottom ground electrode, said luminescent layer located between said ferroelectric thin film and said dielectric thin film, and said top switching electrode located on said dielectric thin film.

33. A method of fabricating a ferroelectric FGM thin film in a ferroelectric flat panel display, comprising steps of:

preparing a substrate; and

forming a ferroelectric FGM thin film;

wherein said step of forming a ferroelectric FGM thin film includes;

providing a first precursor mixture and a second precursor mixture;

applying said first precursor mixture to said substrate;

applying said second precursor mixture to said substrate; and

treating said substrate to form said ferroelectric FGM thin film.

34. A method of fabricating a ferroelectric FGM thin film as in claim 33, wherein said first precursor mixture comprises primary relative amounts of precursors for a ferroelectric compound and a dielectric compound, and said second precursor mixture comprises secondary relative amounts of precursors for said ferroelectric compound and said dielectric compound, said primary relative amounts being different from said secondary relative amounts.

35. A method as in claim 34, wherein said ferroelectric compound is a ferroelectric metal oxide.

36. A method as in claim 35, wherein said ferroelectric metal oxide is a layered superlattice material.

37. A method as in claim 36, wherein said fist precursor mixture and said second precursor mixture comprise at least two metals selected from the group consisting of strontium, calcium, barium, cadmium, lead, tantalum, hafnium, tungsten, niobium, zirconium, bismuth, scandium, yttrium, lanthanum, antimony, chromium, molybdenum, vanadium, ruthenium and thallium.

38. A method as in claim 37, wherein said first precursor mixture and said second precursor mixture comprise precursor compounds selected from the group consisting of metal alkoxycarboxylates.

39. A method as in claim 37, wherein said first precursor mixture and said second precursor mixture comprise at least three metals selected from the group consisting of strontium, bismuth, tantalum and niobium.

40. A method as in claim 39, wherein said first precursor mixture and said second precursor mixture comprise the metals strontium, bismuth, tantalum and niobium in relative molar proportions corresponding to a stoichiometric formula SrBi_2+y(Ta₁₋

xNb_x)₂O₉, wherein 0≦

x≦

1 and 0≦

y≦

0.20.

41. A method as in claim 35, wherein said ferroelectric metal oxide is an ABO₃-type perovskite.

42. A method as in claim 41, wherein said first precursor mixture and said second precursor mixture comprise lead, zirconium and titanium in relative molar proportions represented by a generalized stoichiometric formula Pb_1+y(Zr₁₋

xTi_x)O₃, wherein 0≦

x≦

1 and 0≦

y≦

0.1.

43. A method as in claim 34, wherein said dielectric compound is an oxide selected from the group consisting of ZrO₂, CeO₂, Y₂O₃ and Ce₁₋

xZr_xO₂, where 0≦

x≦

1.

44. A method as in claim 43, wherein said first precursor mixture contains primary relative amounts of metal atoms for a first ferroelectric compound, and said second precursor mixture contains secondary relative amounts of metal atoms for a second ferroelectric compound, said primary relative amounts being different from said secondary relative amounts.

45. A method as in claim 44, wherein said first ferroelectric compound and said second ferroelectric compound are ferroelectric metal oxides.

46. A method as in claim 45, wherein said first precursor mixture and said second precursor mixture contain metal atoms for forming perovskite compounds represented by a generalized stoichiometric formula A(B₁₋

xC_x)O₃, where 0≦

x≦

1, in which the value of x varies in correspondence with a functional gradient.

47. A method as in claim 45, wherein said first precursor mixture and said second precursor mixture contain lead, zirconium and titanium in relative amounts represented by a generalized stoichiometric formula Pb_1+y(Zr₁₋

xTi_x)O₃, wherein 0≦

x≦

1 and 0≦

y≦

0.1, and in which the value of x varies in correspondence with a functional gradient.

48. A method as in claim 44, wherein said first precursor mixture and said second precursor mixture contain metal atoms for forming layered superlattice material compounds.

49. A method as in claim 48, wherein said first precursor mixture and said second precursor mixture contain strontium, bismuth, tantalum and niobium in relative proportions represented by a generalized stoichiometric formula SrBi₂(Ta₁₋

xNb_x)₂O₉, where 0≦

x≦

1, in which the value of x varies in correspondence to a functional gradient.

50. A method as in claim 33, wherein a plurality of precursor mixtures are applied to said substrate, each of said precursor mixtures containing amounts of metal atoms in relative molar proportions for forming a metal oxide compound, said relative proportions of metal atoms not being identical in all of said precursor mixtures.

51. A method as in claim 50, wherein said metal oxide compound is a ferroelectric layered superlattice material.

52. A method as in claim 50, wherein said metal oxide compound is a ferroelectric perovskite compound.