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IC tester simultaneously testing plural ICS

  • US 6,198,273 B1
  • Filed: 11/10/1997
  • Issued: 03/06/2001
  • Est. Priority Date: 11/12/1996
  • Status: Expired due to Term
First Claim
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1. An integrated-circuit tester comprising:

  • a handler for automatically transferring plural ICs under test;

    a tester head mounted on said handler;

    plural contacts mounted on said tester head, for electric connections to said plural ICs;

    a testing device electrically connected to said tester head to actuate said plural ICs, for deciding whether they are non-defective or defective;

    contact failure analysis/storage means for counting the numbers of times when ICs tested in contact with each of said plural contacts are decided by said testing device as defective and for storing failure count values thus counted in correspondence with each of said plural contacts, respectively;

    automatic stop means for stopping said handler from operation when it determines a stop condition preset therein for stopping the handler is met in accordance with the failure count values for the respective contacts stored in said contact failure analysis/storage means; and

    automatic turn-OFF means, when said automatic stop means controls said handler to stop its operation, for setting the feeding of ICs to be inhibited to such failing contacts as having met the stop condition for stopping said handler, and for automatically putting said failing contacts out of use.

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