Parallel signature compression circuit and method for designing the same
First Claim
1. A compression circuit for compressing response data from an electronic circuit under test, said compression circuit comprising:
- a first multiple input signature register (MISR) that compresses the response data to generate a first signature;
a second MISR coupled to said first MISR that compresses the first signature to generate a second signature and a third MISR coupled to said second MISR that compresses the second signature to generate a third signature.
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Accused Products
Abstract
A parallel signature compression circuit includes two or more MISRs (multiple input signature registers) coupled in series. The signature compression circuit allows the error effect of at least one of two repetitive error patterns to be transferred to a cell other than the cell where the error effect is counterbalanced. In an embodiment, a signature compression circuit has two MISRs and prevents the error masking due to the repetitive error patterns of the odd-numbered distances. In another embodiment, in order to reduce the error masking by the repetitive error patterns with even-numbered distances, the repetitive error patterns are compressed as many times as possible within the range of design rule.
33 Citations
8 Claims
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1. A compression circuit for compressing response data from an electronic circuit under test, said compression circuit comprising:
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a first multiple input signature register (MISR) that compresses the response data to generate a first signature;
a second MISR coupled to said first MISR that compresses the first signature to generate a second signature and a third MISR coupled to said second MISR that compresses the second signature to generate a third signature. - View Dependent Claims (2)
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3. A method for designing a compression circuit which includes at least two multiple input signature registers (MISRs) coupled in series and compresses response data from an electronic circuit under test, the method comprising the steps of:
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seeking a maximum distance between possible repetitive error patterns;
performing a series of compression processes for the repetitive error patterns;
calculating the number of compression processes with no signature error masking for the repetitive error patterns;
checking the number of the repetitive error patterns for the respective compression processes without error masking; and
determining the number of said MISRs depending on the number of the repetitive error patterns. - View Dependent Claims (4)
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5. A compression circuit for compressing a series of response patterns generated by an electronic circuit under test, the series of response patterns having a maximum distance between repetitive error patterns, the compression circuit comprising:
at least three serially-connected multiple input signature registers (MISRs) that receive input patterns and produce signatures therefrom, wherein a first MISR of the MISRs compresses the series of response patterns from the circuit under test, wherein respective other ones of the other MISRs compress signatures generated by a preceding MISR, and wherein the number of the at least three MISRs is sufficient to prevent error masking for distances between repetitive error patterns that are less than the maximum distance between repetitive error patterns. - View Dependent Claims (6)
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7. A method of generating signatures from a series of response patterns generated by a circuit under test, the method comprising:
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determining one or more selected distances between possible repetitive error patterns in the series of response patterns for which it is desired to prevent error masking;
determining a number of serial compressions that prevent error masking for the determined one or more selected distances; and
serially compressing the series of response patterns the number of serial compressions to generate a series of signatures. - View Dependent Claims (8)
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Specification