×

Multi-axis acceleration sensor and manufacturing method thereof

  • US 6,201,284 B1
  • Filed: 02/18/1998
  • Issued: 03/13/2001
  • Est. Priority Date: 08/08/1997
  • Status: Expired due to Fees
First Claim
Patent Images

1. A multi-axis acceleration sensor for detecting acceleration along directions of plural axes comprising:

  • at least one mass body made of a single crystal silicon wafer and arranged on a plane of said silicon wafer;

    at least two cantilever beams arranged in parallel to each other capable of displacing said mass body along a plurality of directions and of holding said mass body in such a manner that direction of displacement of said mass body is defined to be parallel with respect to the plane of said wafer and one end of each of said cantilever beams, said one end being connected with respective end of said mass body and another end of each of said cantilever beams being supported by a supporting unit;

    at least one fixed electrode which is electrically insulated from said cantilever beams and said mass body and is arranged each direction, opposite to each other via a constant space every acceleration detecting direction of said mass body so as to detect displacement of said mass body caused by the acceleration along the plural directions; and

    displacement detecting means for detecting the displacement of said mass body by applying a constant voltage between said fixed electrode and said mass body, wherein;

    said multi-axis acceleration sensor includes a mass body “

    a”

    displaced with respect to one axis within the wafer plane, and a beam structure holding this mass body “

    a”

    ;

    an edge portion of this beam structure is connected to a mass body “

    b”

    formed at a peripheral portion of said mass body “

    a”

    ;

    the beam structure for holding the mass body “

    b”

    owns such a structure that said beam structure is displaced perpendicular to a displacement direction of said mass body “

    a”

    ;

    more than one fixed electrodes are provided via a constant space and positioned opposite to the acceleration detecting directions within the wafer plane of the respective mass bodies; and

    the respective fixed electrodes are electrically insulated from the beam and the mass bodies to thereby detect the acceleration of two axes along the detecting directions within the wafer plane.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×