Non-contact board inspection probe

• US 6,201,398 B1
• Filed: 02/06/1997
• Issued: 03/13/2001
• Est. Priority Date: 03/28/1996
• Status: Expired due to Fees

• Current Assignee: OHT (Shanghai), Inc. (V Technology Co., Ltd.)
• Original Assignee: OHT (Shanghai), Inc. (V Technology Co., Ltd.)
• Inventors: Takada, Naoya
• Primary Examiner(s): Metjahic, Safet
• Assistant Examiner(s): KOBERT, RUSSELL MARC
• Application Number:
  US08/795,859
• Time in Patent Office: 1,496 Days
• Field of Search: 324/538, 324/690, 324/95, 324/537
• US Class Current: 324/537
• CPC Class Codes: G01R 31/309 of printed or hybrid circuits or circuit substrates

Abstract

A board inspection probe for inspecting pattern lines on a circuit board for defects in a non-contact manner. The probe has an electrode for radiating an electrical signal or receiving an electrical signal radiated from a first pattern line. The probe also has a shield to prevent, from reaching the electrode, unwanted radiant waves emitted from pattern lines located in a region except a board region immediately below an electrode surface of the electrode. This shield is terminates near the electrode surface of the electrode, so that radiant waves from only pattern lines located on the board region immediately below the electrode are received.

Claims

1. A bare-board inspection system for inspecting a bare circuit board, prior to being subjected to part mounting, on which are provided a plurality of electrode terminals and a plurality of rows of conductive pattern lines, said plurality of rows of conductive pattern lines having a narrow width and narrow pitch, said apparatus comprising:

a plurality of contact probes each contacting a respective one of said plurality of electrode terminals;

a sensor body having a sensing surface and a grounded shield;

means for bringing said sensing surface toward said plurality of rows of conductive pattern lines including a first row of said conductive pattern lines in a non-contact manner;

contacting means for contacting a first electrode terminal with a contact probe to feed an inspection signal to said first row of said conductive pattern lines connecting to the first electrode terminal, while contacting second electrode terminals other than the first electrode terminal with contact probes fed to ground to second rows of conductive pattern lines connected to the second electrode terminals, said inspection signal having an alternating current component; and

means for evaluating a detected radiant wave to inspect the circuit board for a defect,

wherein said sensing surface comprises a longitudinal length which covers said plurality of rows of conductive pattern lines in a direction of the columns thereof, and

said shield is arranged so that the shield prevents radiant waves radiated from any parts of said first row of said conductive pattern lines between said first electrode terminal and a portion of said first row of said conductive pattern lines that is beneath said shield, from being received by said sensing surface.

2. The system according to claim 1, wherein

said sensor body has vertical and horizontal surfaces substantially perpendicular and parallel to a surface of said board;

said sensing surface of said sensor body is formed substantially parallel to said horizontal surface, and

said shield has a shield surface which vertically and horizontally extends to cover at least part of said vertical surface of said sensor body.

3. The system according to claim 2, wherein said shield surface vertically and horizontally extends to entirely cover said vertical surface of said sensor body.

4. The system according to claim 2, wherein

said shield surface is divided into a first region and a second region in a direction perpendicular to said sensing surface of said sensor body,

said shield surface within the first region shields radiation from or to said plurality of rows of conductive pattern lines on said board, and

said shield surface within the second region shields electromagnetic interference coming from above said board.

5. The according to claim 1, wherein pattern lines having a pitch of several decade μ

m are formed on said board.

6. The system according to claim 1, wherein said sensing surface has an area substantially equal to that of a circuit part to be mounted on said bare board in a planar direction.

7. The system according to claim 1, wherein said sensing surface has a size of several mm² to several cm².

8. The system according to claim 1, wherein said shield comprising a two-dimensionally spread flat conductive member surrounding said sensing surface of said sensor body so that said sensing surface is shielded from radiation waves from surrounding directions.

9. The system according to claim 1, wherein said plurality of rows of conductive pattern lines are terminated at respective pads, and said sensing surface of said sensor body are above the pads when the sensor body is brought toward the board.

10. The system according to claim 1, wherein said plurality of rows of conductive pattern lines are terminated at respective pads which are arranged to form a rectangle, and ends of said sensing surface of said sensor body are above the pads when the sensor body is brought toward the board.

11. The system according to claim 10, wherein said shield surrounds said ends of said sensing surface.

12. The system according to claim 11, wherein an insulator of a rectangular form is provided between said shield and a metal of said sensing surface.

13. The system according to claim 1, further comprising means for moving said sensing surface in an arbitrary direction.

14. The system according to claim 1, wherein said plurality of rows of pattern lines are a pitch of several decade μ

m.

15. The system according to claim 1, wherein said sensing surface of said sensor body is electrically shielded from the board.

16. The system according to claim 1, wherein said sensing surface of said sensor body has an area substantially equal to that of a circuit part to be mounted on said bare board.

17. A board inspection system for inspecting a bare circuit board, prior to being subjected to part mounting on which are provided a plurality of electrode terminals and a plurality of rows of conductive pattern lines, said plural rows of conductive pattern lines having a narrow width and narrow pitch, said system comprising:

a plurality of contact probes each contacting a respective one of said plurality of electrode terminals;

a sensor body having a sensing surface and a grounded shield;

means for bringing said sensing surface toward said plurality of rows of conductive pattern lines including a first row of said conductive pattern lines in a non-contact manner to feed an inspection signal to said sensing surface to radiate a radiant wave therefrom toward said plural rows of conductive pattern lines, said inspection signal having an alternating current component;

contacting means for contacting with a contact probe a first electrode terminal connecting to said first row of said conductive pattern lines to detect a signal due to the radiant wave at said first row of said conductive pattern lines, while contacting with contact probes electrode terminals other than the first electrode terminal to feed a ground signal to rows of conductive pattern lines other than said first row of said conductive pattern line; and

means for evaluating a detected signal to inspect the circuit board for defect,

wherein said sensing surface comprises a longitudinal length which covers said plural rows of conductive pattern lines in a direction of the columns thereof, and

said shield is arranged so that the shield prevents radiant waves from said sensing surface from reaching any parts of said first row of said conductive pattern lines between said first electrode terminal and a portion of said first row of conductive pattern line that is beneath said shield.

18. A board inspection system for inspecting a circuit board, prior to being subjected to part mounting, on which are provided a plurality of electrode terminals and a plurality of rows of conductive pattern lines, said plural rows of conductive pattern lines having a narrow width and narrow pitch, said system comprising:

a plurality of contact probes each contacting a respective one of said plurality of electrode terminals;

a sensor body having a sensing surface and a grounded shield;

means for bringing said sensing surface toward said plurality of rows of conductive pattern lines in a non-contact manner;

contacting means for contacting a first electrode terminal with a contact probe to feed an inspection signal to said first row of said conductive pattern lines connecting to the first electrode terminal, said inspection signal having an alternating current component; and

means for evaluating a detected radiant wave to inspect the circuit board for a defect,

wherein said sensing surface comprises a planar metal surface having an elongated form and being provided at a side of said board, said metal surface having a longitudinal length to cover terminal ends of said plurality of rows of conductive pattern lines in a direction of the columns thereof, and

said shield is arranged so that the shield prevents radiant waves radiated from any parts of said first row of said conductive pattern lines between said first electrode terminal and a portion of said first row of conductive pattern line that is beneath said shield, from being received by said sensing surface.

19. A board inspection system for inspecting a bare circuit board, prior to being subjected to part mounting, on which are provided a plurality of electrode terminals and a plurality of rows of conductive pattern lines, said plurality of rows of conductive pattern lines having a narrow width and narrow pitch, said system comprising:

a plurality of contact probes each contacting a respective one of said plurality of electrode terminals;

a sensor body having a sensing surface and a grounded shield;

means for bringing said sensing surface toward said plurality of rows of conductive pattern lines including a first row of said conductive pattern lines to feed an inspection signal to said sensing surface to radiate a radiant wave therefrom toward said plurality of rows of conductive pattern lines, said inspection signal having an alternating current component;

enabling means for contacting with a contact probe a first electrode terminal connecting to said first row of said conductive pattern lines to detect a signal due to the radiant wave at said first row of said conductive pattern lines; and

means for evaluating a detected signal to inspect the circuit board for defect,

wherein said sensing surface comprises a planar metal surface having an elongated form and being provided at a side of said board, said metal surface having a longitudinal length to cover terminal ends of said plurality of rows of conductive pattern lines in a direction of the columns thereof, and

said shield is arranged so that the shield prevents radiant waves from said sensing surface from reaching any parts of said first row of said conductive pattern lines between said first electrode terminal and a portion of said first row of said conductive pattern lines that is beneath said shield.