Master automotive sensor tester

• US 6,204,770 B1
• Filed: 06/11/1998
• Issued: 03/20/2001
• Est. Priority Date: 06/11/1998
• Status: Expired due to Fees

• Current Assignee: Standard Motor Products Incorporated
• Original Assignee: Echlin, Inc. (Dana, Inc.)
• Inventors: Johnson, Arthur D.
• Primary Examiner(s): Wu, Daniel J.
• Assistant Examiner(s): LA, ANH V
• Application Number:
  US09/095,778
• Time in Patent Office: 1,013 Days
• Field of Search: 123/339.14, 123/406.38, 123/406.35, 123/406.36, 123/406.16, 340/660, 73/350.3, 324/537, 324/765, 324/555, 324/556, 324/727, 324/388, 324/384
• US Class Current: 340/660
• CPC Class Codes: F02D 2400/11 After-sales modification devices designed to be used to modify an engine afterwards
• CPC Class Codes: F02D 35/027 using knock sensors
• CPC Class Codes: F02D 41/222 relating to the failure of sensors or parameter detection devices
• CPC Class Codes: F02P 17/00 Testing of ignition installations, e.g. in combination with adjusting testing fuel injection apparatus F02M65/00; testing ignition installations in general F23Q23/00; Testing of ignition timing in compression-ignition engines
• CPC Class Codes: G01R 31/72 Testing of electric windings testing of transformers G01R31/62
• CPC Class Codes: Y02T 10/40 Engine management systems

Abstract

A sensor tester for testing multiple vehicle sensors is provided comprising: a circuit for testing a vehicle piezoelectric knock sensor; a circuit for testing a vehicle speed sensor; and a circuit for testing ignition coils. The circuit for testing piezoelectric knock sensors comprises: an integrated circuit electrically connectable to a power source, the integrated circuit having a multiple step voltage divider, a connector for connecting the integrated circuit to the knock sensor; and a plurality of light emitting diodes electrically connected to the voltage divider of the integrated circuit. The circuit for testing vehicle speed sensors comprises: a voltage divider for limiting the voltage of a power source to a reference voltage; a voltage comparator having a first input, a second input and an output, the first input electrically connected to the voltage divider, the second input electrically connected to the speed sensor; and a voltage transition detector for detecting a voltage transition from the output of the voltage comparator. The circuit for testing ignition coils that have a primary coil and a secondary coil comprises: capacitance means electrically connectable in a loop with a power source and the primary coil; a first voltage indicator electrically connected in series with a side of the secondary winding and electrically connectable to the power source; a second voltage indicator for detecting a voltage across the capacitance means; a current interrupter electrically connected in parallel with the capacitance means; a first connector for connecting the power source in series with the primary coil; and a second connector for connecting the power source in series with the secondary coil.

Claims

1. A master sensor tester for testing multiple vehicle sensors, comprising:

a circuit for testing a piezoelectric knock sensor, comprising;

a multiple step voltage divider electrically connectable to a power source and electrically connectable to the knock sensor; and

a plurality of voltage indicators electrically connected to the voltage divider;

a circuit for testing a vehicle speed sensor, comprising;

a voltage divider for limiting the voltage of the power source to a reference voltage;

a voltage comparator having a first input, a second input and an output, said first input electrically connected to the reference voltage of said voltage divider, said second input electrically connected to the speed sensor; and

a voltage transition detector for detecting a voltage transition from said output of the voltage comparator;

a circuit for testing for ignition coils having a primary coil and a secondary coil, comprising;

capacitance means electrically connectable in a loop with the power source and the primary coil;

a first voltage indicator electrically connected in series with a side of the secondary winding and electrically connectable in series to the power source;

a voltage meter for detecting a voltage across said capacitance means;

a current interrupter electrically connected in parallel with the capacitance means;

a first connector for connecting the power source in series with the primary coil; and

a second connector for connecting the power source in series with the secondary coil.

2. A circuit for testing a piezoelectric knock sensor comprising:

a multiple step voltage divider electrically connectable to a power source and electrically connectable to the knock sensor; and

a plurality of voltage indicators electrically connected to the voltage divider of an integrated circuit,

wherein said multiple step voltage divider is housed in said integrated circuit that has an adjustable output voltage, and further comprising a current limiter for setting the output reference voltage of said integrated circuit and the light emitting diode current to approximately ten milliamps.

3. The circuit for testing a piezoelectric knock sensor of claim 2 wherein said current limiter comprises a grounded resistor electrically connected to said integrated circuit.

4. The circuit for testing a piezoelectric knock sensor of claim 2 further comprising an input signal buffer for buffering the input signal so as to prevent over saturation of said integrated circuit.

5. The circuit for testing a piezoelectric knock sensor of claim 4 wherein said input signal buffer comprises a grounded resistor electrically connected to said integrated circuit and the knock sensor.

6. The circuit for testing a piezoelectric knock sensor of claim 2 further comprising electrical oscillation dampener for dampening electrical oscillations from the power source.

7. The circuit for testing a piezoelectric knock sensor of claim 6 wherein said electrical oscillation dampener comprises a capacitor having an anode and a cathode, said capacitor anode being electrically connectable to the power source, said cathode being electrically connected to ground.

8. The circuit for testing a piezoelectric knock sensor of claim 2 wherein the multiple step voltage divider comprises a ten step voltage divider and wherein said plurality of voltage indicators comprises ten light emitting diodes.

9. A circuit for testing a piezoelectric knock sensor comprising:

an integrated circuit being electrically connectable to a power source, the integrated circuit having an adjustable voltage reference and a multiple step voltage divider;

a connector for electrically connecting said integrated circuit to the knock sensor;

an input signal buffer as to prevent over saturation of said circuit;

a plurality of light emitting diodes electrically connected to the voltage divider of said integrated circuit;

a means for setting the output reference voltage of said integrated circuit and the light emitting diode current to approximately ten milliamps; and

a power source voltage oscillation dampener connectable to the power source.

10. The circuit for testing a piezoelectric knock sensor of claim 9 further comprising a first grounded resistor electrically connected to said integrated circuit and the knock sensor for buffering the input signal so as to prevent over saturation of said integrated circuit.

11. The circuit for testing a piezoelectric knock sensor of claim 10 further comprising a second grounded resistor electrically connected to said integrated circuit for setting the output reference voltage of said integrated circuit and the light emitting diode current to approximately ten milliamps;

and

a grounded capacitor electrically connected to said integrated circuit and to said plurality of light emitting diodes for dampening electrical oscillations in said plurality of light emitting diodes.

12. The circuit for testing a piezoelectric knock sensor of claim 11 wherein the multiple step voltage divider comprises a ten step voltage divider and wherein said plurality of light emitting diodes comprises ten light emitting diodes.