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Connector contact fingers for testing integrated circuit packages

  • US 6,211,687 B1
  • Filed: 11/04/1997
  • Issued: 04/03/2001
  • Est. Priority Date: 12/02/1996
  • Status: Expired due to Term
First Claim
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1. A connector for facilitating the testing of integrated circuit packages comprising:

  • (a) a retainer for connecting said connector to a testing rig, said retainer having a recess disposed lengthwise for facilitating connection with said test rig, and (b) a plurality of parallel conducting strips, each said conducting strip being embedded across said retainer such that one end protrudes as a leg across but within said recess, said leg adapted for electrical connection to said test rig, and the other end protrudes out as a finger from said retainer, each said finger further terminating at an angled finger tip, having a proximal portion proximal said retainer and a distal end portion extending therefrom, said distal portion further bent to form an angle such that the distal end points towards a first side, said tip further having a flat tongue portion with a planar surface and adapted for electrical contact with a lead of said integrated circuit package.

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