Connector contact fingers for testing integrated circuit packages

• US 6,211,687 B1
• Filed: 11/04/1997
• Issued: 04/03/2001
• Est. Priority Date: 12/02/1996
• Status: Expired due to Term

• Current Assignee: Tan Yin Leong
• Original Assignee: Tan Yin Leong
• Inventors: Leong, Tan Yin
• Primary Examiner(s): Metjahic, Safet
• Assistant Examiner(s): HOLLINGTON, JERMELE M
• Application Number:
  US08/963,783
• Time in Patent Office: 1,246 Days
• Field of Search: 324/756, 324/761, 324/762, 324/754, 324/538, 324/537, 439/55, 439/59, 439/152, 439/153, 439/155
• US Class Current: 324/756.04
• CPC Class Codes: G01R 1/0408 Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808
• CPC Class Codes: G01R 1/0425 Test clips, e.g. for IC's
• CPC Class Codes: G01R 1/0466 concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
• CPC Class Codes: H01R 13/2442 with a single cantilevered beam
• CPC Class Codes: H01R 2201/20 for testing or measuring purposes

Abstract

A connector contact fingers of a testing rig which overcomes the co-planarity, contact and alignment difficulties in the testing procedure of integrated circuit packages. The connector comprises a tongue extension to the ends of the fingers to increase the surface area from which contact can be made with the device lead, a lever extension to the retainer along one side of the fingers to prevent deflection of the fingers, and a shoulder structure in the connector which acts as an adaptor to secure a flexible printed circuit board to the legs.

Claims

1. A connector for facilitating the testing of integrated circuit packages comprising:

(a) a retainer for connecting said connector to a testing rig, said retainer having a recess disposed lengthwise for facilitating connection with said test rig, and

(b) a plurality of parallel conducting strips, each said conducting strip being embedded across said retainer such that one end protrudes as a leg across but within said recess, said leg adapted for electrical connection to said test rig, and the other end protrudes out as a finger from said retainer, each said finger further terminating at an angled finger tip, having a proximal portion proximal said retainer and a distal end portion extending therefrom, said distal portion further bent to form an angle such that the distal end points towards a first side, said tip further having a flat tongue portion with a planar surface and adapted for electrical contact with a lead of said integrated circuit package.

2. A connector as in claim 1 wherein said retainer comprises non-conducting material.

3. A connector as in claim 1 wherein said parallel conducting strips comprises metallic material.

4. A connector for facilitating the testing of integrated circuit packages comprising:

(a) a retainer for connecting said connector to a testing rig, said retainer having a recess disposed lengthwise for facilitating connection with said test rig,

(b) a plurality of parallel conducting strips, each said conducting strip being embedded across said retainer such that one end protrudes as a leg across but within said recess, said leg adapted for electrical connection to said test rig, and the other end protrudes out at a finger from said retainer, said finger adapted for electrical contact with a lead of said integrated circuit package; and

(c) a shoulder overhanging from each of the two ends of said recess of said retainer to define a slot, said slot indented within said shoulder wherein a card edge of a flexible printed circuit board may be inserted laterally within said slot and between said legs and said retainer, the height said slot being substantially the same as the thickness of the card end such that said card edge is prevented from causing deflection of said legs.

5. A connector as in claim 4 wherein said retainer comprises non-conducting material.

6. A connector as in claim 4 wherein said parallel conducting strips comprises metallic material.

7. A connector for facilitating the testing of integrated circuit packages comprising:

(a) a retainer for connecting said connector to a testing rig, said retainer having a recess disposed lengthwise for facilitating connection with said test rig,

(b) a plurality of parallel conducting strips, each said conducting strip being embedded across said retainer such that one end protrudes as a leg across but within said recess, said leg adapted for electrical connection to said test rig, and the other end protrudes out as a finger from said retainer, each said finger having a proximal portion proximal said retainer and a distal portion extending therefrom, said distal portion further bent to form an angle such that the distal end points towards a first side, said tip of said finger further adapted for electrical contact with a lead of said integrated circuit package; and

(c) a substantially immovable lever projecting out from said retainer along the length of the fingers adjacent a second side opposite said first side, said lever positioned to stop said fingers from deflecting towards said second side when said tip of said finger come into contact with said leads of said integrated circuit package.

8. A connector as in claim 7 wherein said retainer comprises non-conducting material.

9. A connector as in claim 7 wherein said parallel conducting strips comprises metallic material.

10. A connector for facilitating the testing of integrated circuit packages comprising:

(a) a retainer for connecting said connector to a testing rig, said retainer having a recess disposed lengthwise for facilitating connection with said test rig, and

(b) a plurality of parallel conducting strips, each said conducting strip being embedded across said retainer such that one end protrudes as a leg across but within said recess, said leg adapted for electrical connection to said test rig, and the other end protrudes out as a finger from said retainer, each said finger further terminating at an angled finger tip, said tip further having a flat tongue portion with a planar surface for electrical contact with said lead of an integrated circuit package; and

(c) a shoulder overhanging from each of the two ends of said recess of said retainer to define a slot, said slot indented within said shoulder wherein a card edge of a flexible printed circuit board may be inserted laterally within said slot and between said legs and said retainer, the height said slot being substantially the same as the thickness of the card end such that said card edge is prevented from causing deflection of said legs.

11. A connector as in claim 10 wherein said retainer comprises non-conducting material.

12. A connector as in claim 10 wherein said parallel conducting strips comprises metallic material.

13. A connector for facilitating the testing of integrated circuit packages comprising:

(a) a retainer for connecting said connector to a testing rig, said retainer having a recess disposed lengthwise for facilitating connection with said test rig,

(b) a plurality of parallel conducting strips, each said conducting strip being embedded across said retainer such that one end protrudes as a leg across but within said recess, said leg adapted for electrical connection to said test rig, and the other end protrudes out at a finger from said retainer, said finger adapted for electrical contact with a lead of said integrated circuit package;

(c) a shoulder overhanging from each of the two ends of said recess of said retainer to define a slot, said slot indented within said shoulder wherein a card edge of a flexible printed circuit board may be inserted laterally within said slot and between said legs and said retainer, the height said slot being substantially the same as the thickness of the card end such that said card edge is prevented from causing deflection of said legs; and

(d) a substantially immovable lever projecting out from said retainer along the length of the fingers, said lever positioned to stop said fingers from deflecting away from said leads upon contact with said leads of said integrated circuit package.

14. A connector as in claim 13 wherein said retainer comprises non-conducting material.

15. A connector as in claim 13 wherein said parallel conducting strips comprises metallic material.

16. A connector for facilitating the testing of integrated circuit packages comprising:

(a) a retainer for connecting said connector to a testing rig, said retainer having a recess disposed lengthwise for facilitating connection with said test rig, and

(b) a plurality of parallel conducting strips, each said conducting strip being embedded across said retainer such that one end protrudes as a leg across but within said recess, said leg adapted for electrical connection to said test rig, and the other end protrudes out as a finger from said retainer, each said finger further terminating at an angled finger tip, said tip further having a flat tongue portion with a planar surface for electrical contact with a lead of said integrated circuit package;

(c) a substantially immovable lever projecting out from said retainer along the length of the fingers, said lever positioned to stop said fingers from deflecting away from said leads upon contact with said leads of said integrated circuit package; and

(d) a shoulder overhanging from each of the two ends of said recess of said retainer to define a slot, said slot indented within said shoulder wherein a card edge of a flexible printed circuit board may be inserted laterally within said slot and between said legs and said retainer, the height said slot being substantially the same as the thickness of the card end such that said card edge is prevented from causing deflection of said legs.

17. A connector as in claim 16 wherein said retainer comprises non-conducting material.

18. A connector as in claim 16 wherein said parallel conducting strips comprises metallic material.