High-speed connection method

• US 6,212,643 B1
• Filed: 05/07/1998
• Issued: 04/03/2001
• Est. Priority Date: 11/08/1995
• Status: Expired due to Term

• Current Assignee: Siemens Nixdorf Informationssysteme AG (Siemens AG)
• Original Assignee: Siemens Nixdorf Informationssysteme AG (Siemens AG)
• Inventors: Pielsticker, Ulrich, Ademmer, Heinz
• Primary Examiner(s): Sheikh, Ayaz R.
• Assistant Examiner(s): Vo, Tim
• Application Number:
  US09/068,351
• Time in Patent Office: 1,062 Days
• Field of Search: 713/300, 713/310, 713/320, 713/321, 713/322, 713/323, 713/324, 713/330, 713/340, 713/1, 713/2, 713/100, 710/8, 710/10, 710/102, 710/103
• US Class Current: 713/324
• CPC Class Codes: G06F 11/22 Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

Abstract

Energy-saving operating method, in which the disconnecting device records in a nonvolatile memory that temporary disconnection occurred, and thereupon does not execute test and diagnostic routines upon reactivation or does so to a reduced extent.

Claims

1. An energy-saving operating method for a first device which can be switched on and off electronically, and carries out test routines after activation, comprising the steps of:

providing a nonvolatile memory accessable by said first device;

providing a second device connected to be capable of switching on said first device;

sending a message from the second device to the first device that an imminent disconnection of the first device is a temporary disconnection;

storing information that the imminent disconnection of the first device is a temporary disconnection in the nonvolatile memory;

disconnecting a voltage supply of the first device;

the second device effecting reactivation of the first device on a basis of a predetermined event;

shortening an initialization phase for reactivating the first device based on the information stored in the nonvolatile memory that a temporary disconnection occurred.

2. A method as claimed in claim 1, wherein said first device is a modular part of a larger device.

3. A method as claimed in claim 1, wherein said predetermined event is a period of time having elapsed.

4. A method as claimed in claim 1, wherein said predetermined event is an external event.

5. A method as claimed in claim 1, wherein said shortening an initialization phase for reactivating the first device bypasses execution of test routines serving to check functionality of individual components.

6. A method as claimed in claim 1, wherein said shortening an initialization phase for reactivating the first device executes test routines serving to check functionality of individual components to a reduced extent.

7. A method as claimed in claim 1, wherein said shortening an initialization phase for reactivating the first device bypasses execution of test routines serving to check stored configuration data.

8. A method as claimed in claim 1, wherein said shortening an initialization phase for reactivating the first device executes test routines serving to check stored configuration data to a reduced extent.

9. An energy-saving operating method as claimed in claim 1, wherein said disconnecting step is performed by said first device.

10. An energy-saving operating method as claimed in claim 1, wherein said disconnecting step is performed by said second device.

11. An energy-saving operating method as claimed in claim 9, wherein said first device performs an operation check prior to said disconnecting step and performs said disconnecting step only if said operation check determines a normal operating state.

12. An energy-saving operating method for a device which can be switched on and off electronically, and which carries out test routines after activation, comprising the steps of:

providing a nonvolatile memory accessible by the device;

providing a clock which is independent of a power supply for the device;

if the device is in an operating intermission, storing information regarding the operating intermission at regular intervals together with a time detail from the clock in the nonvolatile memory,

if the device leaves an operating intermission, erasing the stored time information;

after activation, checking to see whether the nonvolatile memory contains a valid time detail which is not out of date compared with a predetermined limit, and, if within the predetermined limit shortening an initialization of the device.

13. A method as claimed in claim 12, wherein the shortening an initialization of the device bypasses execution of test routines serving to check the functionality of individual components.

14. A method as claimed in claim 12, wherein the shortening an initialization of the device executes test routines serving to check the functionality of individual components to a reduced extent.

15. A method as claimed in claim 12, wherein the shortening an initialization of the device bypasses execution of test routines serving to check stored configuration data.

16. A method as claimed in claim 12, wherein the shortening an initialization of the device executes test routines serving to check stored configuration data to a reduced extent.