Method and apparatus for evaluating software programs for semiconductor circuits

• US 6,223,144 B1
• Filed: 03/24/1998
• Issued: 04/24/2001
• Est. Priority Date: 03/24/1998
• Status: Expired due to Fees

• Current Assignee: Silicon Storage Technology Incorporated (Microchip Technology Incorporated)
• Original Assignee: Advanced Technology Materials, Inc. (Entegris Incorporated)
• Inventors: Green, Andy, Barnett, Philip
• Primary Examiner(s): Teska, Kevin J.
• Assistant Examiner(s): Broda, Samuel
• Application Number:
  US09/047,809
• Time in Patent Office: 1,127 Days
• Field of Search: 395/500, 395/701, 714/47, 703/3, 703/13, 703/14, 703/19, 703/20, 703/21, 703/22, 703/23, 703/26
• US Class Current: 703/22
• CPC Class Codes: G06F 11/3664 Environments for testing or debugging software

Abstract

A microcontroller software testing tool is disclosed for testing and debugging software for a semiconductor circuit. The microcontroller software testing tool includes a simulator for simulating the execution of the software program on the target semiconductor circuit and an emulator to permit emulation before the actual silicon exists. The emulator utilizes the same high definition language specification, such as VHDL models, that define the silicon during the fabrication process plus additional logic to model behavior of the emulated processor. In a simulation mode, the microcontroller software testing tool simulates the target semiconductor circuit on a general purpose computing device, by interpreting the instructions in the software using an instruction set of the target semiconductor circuit, and otherwise behaving like the target semiconductor circuit; and executes and evaluates the software on the simulated semiconductor circuit. The microcontroller software testing tool monitors the estimated time to execute the software on the semiconductor circuit. In an emulation mode, the microcontroller software testing tool utilizes a low-cost field programmable gate array programmed with a hardware description language description of the target semiconductor circuit. The microcontroller software testing tool is accessible by means of a data exchange protocol provided by the operating system. The microcontroller software testing tool preferably provides a modular configuration. The microcontroller software testing tool monitors the percentage of the code that is executed during testing.

Claims

1. A method of testing software for a semiconductor circuit, said method comprising the steps of:

simulating said semiconductor circuit including memory characteristics of said semiconductor circuit on a general purpose computing device;

executing said software on said simulated semiconductor circuit;

monitoring the estimated time to execute said software including hardware related timing on said semiconductor circuit such that said simulated execution of said software maintains timing considerations with an actual execution of said software on said semiconductor circuit; and

evaluating the operation of said software.

2. The method according to claim 1, wherein said simulating step includes the step of decoding instructions in said software using an instruction set of said semiconductor circuit.

3. The method according to claim 1, wherein said simulating step includes the step of behaving like said semiconductor circuit.

4. The method according to claim 1, wherein said estimated time includes the time to execute each instruction as well as hardware access times.

5. The method according to claim 1, further comprising the step of determining the percentage of said software that is executed during said executing step.

6. The method according to claim 1, further comprising the step of determining data memory locations that are read.

7. The method according to claim 6, wherein said data memory locations are comprised of ferroelectric material.

8. The method according to claim 1, further comprising the step of determining data memory locations that are written to.

9. The method according to claim 8, wherein said data memory locations are comprised of ferroelectric material.

10. The method according to claim 9, further comprising the step of recording said results in a standard document.

11. The method according to claim 1, further comprising the step of initiating said method from a general-purpose program using a data exchange protocol.

12. The method according to claim 1, further comprising the step of interrogating said method for results from a general-purpose program using a data exchange protocol.

13. A method of testing software for a semiconductor circuit, said method comprising the steps of:

programming a field programmable gate array with a hardware description language description of said semiconductor circuit including memory characteristics of said semiconductor circuit;

emulating said semiconductor circuit using said programmed field programmable gate array;

executing said software on said emulated semiconductor circuit, wherein each instruction of said software is executed sequentially on said emulated semiconductor circuit in accordance with a clock that is a rational factor of a clock on said semiconductor circuit; and

evaluating the accuracy of said software.

14. The method according to claim 13, further comprising the step of initiating said method from a general-purpose program using a data exchange protocol.

15. The method according to claim 13, further comprising the step of interrogating said method for results from a general-purpose program using a data exchange protocol.

16. The method according to claim 15, further comprising the step of recording said results in a standard document.

17. A tool for testing software for a semiconductor circuit, comprising:

a software model of said semiconductor circuit, said software model including memory characteristics of said semiconductor circuit;

a processor for executing said software using said software model of said semiconductor circuit;

a counter for monitoring the estimated time to execute said software including hardware related timing on said semiconductor circuit such that said simulated execution of said software maintains timing considerations with an actual execution of said software on said semiconductor circuit; and

means for evaluating the operation of said software.

18. The software testing tool according to claim 17, further comprising an instruction set of said semiconductor circuit for decoding instructions in said software.

19. The software testing tool according to claim 17, wherein said testing tool behaves like said semiconductor circuit.

20. The software testing tool according to claim 18, wherein said estimated time includes the time to execute each instruction as well as hardware access times.

21. The software testing tool according to claim 17, wherein said processor determines the percentage of said software that is executed.

22. The software testing tool according to claim 17, wherein said processor determines data memory locations that are read.

23. The software testing tool according to claim 22, wherein said data memory locations are comprised of ferroelectric material.

24. The software testing tool according to claim 17, wherein said processor determines data memory locations that are written to.

25. The software testing tool according to claim 24, wherein said data memory locations are comprised of ferroelectric material.

26. The software testing tool according to claim 17, further comprising a data exchange protocol for communicating with general-purpose programs.

27. The software testing tool according to claim 26, further comprising means for initiating said software testing tool based on a command received from a general-purpose program.

28. The software testing tool according to claim 26, further comprising means for providing results to a general-purpose program using a data exchange protocol.

29. A tool for testing software for a semiconductor circuit, comprising:

an emulator comprised of a field programmable gate array programmed with a hardware description language description of said semiconductor circuit including memory characteristics of said semiconductor circuit;

a processor for controlling instruction of said software on said emulated semiconductor circuit, wherein each instruction of said software is executed sequentially on said emulated semiconductor circuit in accordance with a clock that is a rational factor of a clock on said semiconductor circuit; and

means for evaluating the accuracy of said software.

30. The software testing tool according to claim 29, further comprising a data exchange protocol for communicating with general-purpose programs.

31. The software testing tool according to claim 30, further comprising means for initiating said software testing tool based on a command received from a general-purpose program.

32. The software testing tool according to claim 29, further comprising means for providing results to a general-purpose program using a data exchange protocol.

33. A method of testing software for a semiconductor circuit, said method comprising the steps of:

simulating said semiconductor circuit including memory characteristics of said semiconductor circuit on a general purpose computing device;

executing said software on said simulated semiconductor circuit;

monitoring the estimated time to execute said software including hardware related timing on said semiconductor circuit such that said simulated execution of said software maintains timing considerations with an actual execution of said software on said semiconductor circuit; and

determining the percentage of said software that is executed during said executing step.

34. The method according to claim 33, further comprising the step of indicating portions of said software that are not executed.

35. The method according to claim 33, wherein said determining step does not alter said software.

36. The method according to claim 33, wherein said determining step evaluates an assembly language version of said software.

37. The method according to claim 33, wherein said determining step sets a flag upon executing each byte of memory storing said software.