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Apparatus for thermally testing an electronic device

  • US 6,227,701 B1
  • Filed: 08/05/1999
  • Issued: 05/08/2001
  • Est. Priority Date: 06/08/1998
  • Status: Expired due to Term
First Claim
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1. An apparatus for thermally testing a running electronic device, comprising:

  • a main body formed with a first chamber for receiving said electronic device and a second chamber located around and communicating with said first chamber, wherein said second chamber has an opening communicating said first chamber to the outside of said body;

    a pallet receivable into said main body through said opening for closing off said first chamber from the outside of said main body, said pallet having a base for supporting said electronic device within said first chamber and a window for inspecting said electronic device therein;

    a heat source located in said second chamber;

    means for blowing the heat flow generated by said heat source to circulate between said first chamber and said second chamber;

    means for forming a turbulent effect to average the temperature within said first chamber and said second chamber, located in said second chamber and installed near said heat source.

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