Broadband impedance matching probe

• US 6,229,327 B1
• Filed: 05/30/1997
• Issued: 05/08/2001
• Est. Priority Date: 05/30/1997
• Status: Expired due to Term

• Current Assignee: GCB Industries, Inc.
• Original Assignee: GCB Industries, Inc.
• Inventors: Boll, Harry J., Boll, Gregory G.
• Primary Examiner(s): Ballato, Josie
• Assistant Examiner(s): KOBERT, RUSSELL MARC
• Application Number:
  US08/866,081
• Time in Patent Office: 1,439 Days
• Field of Search: 324/754, 324/761, 324/762, 324/765, 324/95, 333/32, 333/33, 333/34
• US Class Current: 324/755.02
• CPC Class Codes: G01R 1/06772 High frequency probes

Abstract

A probe for testing integrated circuits at microwave frequencies employs a tapered coaxial transmission line to transform the impedance at the probe tips to the impedance of the test instruments. Mechanically resilient probe tip structures allow reliable probing of non-planar circuits and the elastic probe body allows large overprobing without damage to the test circuit. Novel insulator structures for the coaxial line allow easy and accurate assembly and high performance.

Claims

1. A broad band impedance matching probe for testing electronic devices having a first end adapted for contacting a device to be tested, a second end adapted for connection to test instruments, a probe body having an inner electrical conductor, said inner electrical conductor being surrounded by an insulator, said insulator being surrounded by an electrically conducting shield, said inner conductor is tapered along the length of the probe body to provide an impedance that transforms the impedance of the test instruments at said second end to a different impedance at said first end, wherein said second end constitutes means for connection to said test instruments by the use of a coaxial connector.

2. A broad band impedance matching probe as recited in claim 1 in which said tapered inner conductor at said first end extends beyond said insulator and said shield and has means for making contact with the device to be tested.

3. A broad band impedance matching probe as recited in claim 2 in which a portion of said extension of said inner conductor is thinned to render the said extension mechanically resilient when contacting the device under test.

4. A broad band impedance matching probe as recited in claim 1 in which an electrically conducting extension or portion of said shield constitutes means for contacting said device to be tested.

5. A broad band impedance matching probe as recited in claim 4 in which said electrically conducting extension is thinned to render the said extension mechanically resilient when contacting said device under test.

12. A broad band impedance matching probe according to claims 1 or 6 in which said insulator is an insulating filament wrapped around said center conductor.

13. A broad band impedance matching probe according to claims 1 or 6 in which said insulator is a solid dielectric.

14. A broad band impedance matching probe according to claims 1 or 6 in which said insulator is a molded structure with a solid dielectric at the outer periphery and at least a part of the inner portion being an insulating rib to hold said inner conductor in a fixed position inside said outer shield.

15. A broad band impedance matching probe according to claims 1 or 6 in which said insulator has the form of a multitude of fibers extending inwardly from the inside of said shield and said fibers contact said inner electrical conductor to retain said inner electrical conductor in substantially a fixed position inside said shield.

16. A broad band impedance matching probe according to claims 1 or 6 in which said inner conductor is held in a fixed position inside said shield by a short section of rigid insulating material at one end thereof.

17. A broad band impedance matching probe according to claims 1 or 7 in which said insulator is a foam dielectric material.

6. A broad band impedance matching probe for testing electronic circuits having means on a first end for contacting a device to be tested, a second end having means for connection to test instruments, a probe body with an inner electrical conductor, said inner conductor being surrounded by an insulator, said insulator being surrounded by an electrically conducting shield, said shield having an inside dimension that is tapered along the length of the probe body to provide an impedance that transforms the impedance of the test instruments at said second end to a different impedance at said first end.

7. A broad band impedance matching probe as recited in claim 6 in which said inner electrical conductor at said first end extends beyond said insulator and said shield and has means for making contact with the device to be tested.

8. A broad band impedance matching probe as recited in claim 6 in which a portion of said extension of said inner conductor is thinned to render said extension mechanically resilient when contacting the device to be tested.

9. A broad band impedance matching probe according to claim 6 in which an electrically conducting extension of said shield has means for contacting said device to be tested.

10. A broad band impedance matching probe according to claim 9 in which said electrically conducting extension is thinned to render said extension mechanically resilient when contacting said device to be tested.

11. A broad band impedance matching probe according to claim 6 in which said second end has means for connection to said test instruments by attachment of a coaxial connector.