Analog time adjustment for coincidence detection electronics

• US 6,232,604 B1
• Filed: 11/06/1998
• Issued: 05/15/2001
• Est. Priority Date: 11/06/1998
• Status: Expired due to Fees

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: McDaniel, David L., Scarlett, James E.
• Primary Examiner(s): Hannaher, Constantine
• Assistant Examiner(s): Gabor, Otilia
• Application Number:
  US09/187,170
• Time in Patent Office: 921 Days
• Field of Search: 250/363.03, 250/363.04, 250/369
• US Class Current: 250/363.03
• CPC Class Codes: G01T 1/172 with coincidence circuit arrangements G01T1/178 takes precedence ; combination of detectors, see G01T1/1603, G01T1/30, G01T1/361

Abstract

A method for correcting the temporal relationships between event detection pulses generated by a PET scanner system, the method including, for each pulse, identifying the impact point of an associated photon on a scanner surface area and based on the impact point, selecting a compensation delay for the pulse and delaying the pulse by the compensation delay. The invention also includes an apparatus for practicing the method.

Claims

1. A method to be used with a PET scanner which includes a plurality of detector units, each detector unit including a detection surface area, when a photon impacts a detection surface area at a detection point and an event time, the scanner generating an event detection pulse (EDP), scanner hardware which processes impacting photons causing varying delays between event times and corresponding EDPs, the detector delay corresponding to each detector unit varying as a function of detection point, the method for modifying the EDPs so that the timing of each EDP is essentially temporally accurate relative to all other EDPs, the method comprising the steps of:

for each EDP;

identifying the detection point;

selecting a compensation factor as a function of the detection point and the generating detector; and

modifying the EDP as a function of the compensation factor.

2. The method of claim 1 wherein the compensation delay includes a coarse delay and a fine delay, the step of selecting includes selecting a coarse delay and a fine delay and the step of delaying the EDP includes first delaying the EDP by the coarse delay to generate a coarsely delayed EDP and then delaying the coarsely delayed EDP by the fine delay to generate a corrected EDP.

3. The method of claim 1 wherein each detector unit includes a plurality of crystals arrayed across the detector surface area, each crystal, when a photon is absorbed thereby at an event time, generating light which is sensed by other detector unit hardware, the other hardware generating the EDP, the step of determining a detection point including determining which crystal absorbed a photon, the step of selecting including selecting a compensation delay which corresponds to the generating detector unit and the absorbing crystal.

4. The method of claim 3 wherein the step of selecting includes selecting the coarse delay as a function of the generating detector unit and selecting the fine delay as a function of the absorbing crystal.

5. The method of claim 3 wherein the other detector unit hardware includes a plurality of photo-multiplier tubes (PMTs) and wherein, when light is generated by a crystal, the light is sensed by the PMTs which generate PMT signals and the method further includes the steps of, prior to identifying the impact point, identifying an EDP by summing PMT signals to generate a total energy signal, comparing the total energy signal to a threshold signal and, when the total energy signal exceeds the threshold signal, identifying an EDP.

6. An apparatus to be used with a PET scanner which includes processing circuitry and a plurality of detector units which, each detector unit including a detection surface area, when a photon impacts a detection surface area at a detection point and an event time, the scanner generating an event detection pulse (EDP), a scanner hardware which processes impacting photons causing varying delays between event times and corresponding EDPs, the detector delay corresponding to each detector unit varying as a function of detection point, the apparatus for modifying the EDPs so that the timing of each EDP is essentially temporally accurate relative to all other EDPs, the apparatus comprising:

a detection point identifier for identifying detection points;

a selector which selects a compensation factor as a function of the detection point and the generating detector; and

a modifier which modifies the EDP as a function of the compensation factor.

7. The apparatus of claim 6 wherein the modifier includes both a coarse delay module and a fine delay module and the compensation delay includes a coarse delay and a fine delay, the selector selects both a coarse delay and a fine delay and the coarse delay module delays the event signal by the coarse delay to generate a coarsely delayed EDP and then the fine delay module delays the coarsely delayed EDP by the fine delay to generate a corrected EDP.

8. The apparatus of claim 6 wherein each detector unit includes a plurality of crystals arrayed across the detector surface area, each crystal, when a photon is absorbed thereby at an event time, generating light which is sensed by other detector unit hardware, the other hardware generating the EDP, the identifier determining a detection point by determining which crystal absorbed a photon, the selector selecting a compensation delay which corresponds to the generating detector unit and the absorbing crystal.

9. The apparatus of claim 8 wherein the selector selects the coarse delay as a function of the generating detector unit and selects the fine delay as a function of the absorbing crystal.

10. The apparatus of claim 8 wherein the other detector unit hardware includes a plurality of photo-multiplier tubes (PMTs) and wherein, when light is generated by a crystal, the light is sensed by the PMTs which generate PMT signals and the apparatus further includes, for each detector unit, a summer which sums the PMT signals to generate a total energy signal, a timing pick-off circuit for comparing the total energy signal to a threshold signal and, when the total energy signal exceeds the threshold signal, identifying an EDP.

11. The apparatus of claim 8 wherein the modifier includes both a coarse delay module and a fine delay module, the compensation delay includes a coarse delay and a fine delay and the coarse delay module delays the EDP by the coarse delay to generate a coarsely delayed EDP and then the fine delay module delays the coarsely delayed EDP by the fine delay to generate a corrected EDP.

12. A programmed data processor for use with a PET scanner system including processing circuitry, and a plurality of detector units, each detector unit including a detection surface area, when a photon impacts a detection surface area at a detection point and an event time, the scanner generating an event detection pulse (EDP), scanner hardware which processes impacting photons causing varying delays between event times and corresponding EDPs, the detector delay corresponding to each detector unit varying as a function of detection point, the processor for modifying the EDPs so that the timing of each EDP is essentially temporally accurate relative to all other EDPs, the processor performing the steps of:

for each EDP;

identifying detection point;

selecting a compensation factor as a function of the detection point and the generating detector; and

modifying the EDP as a function of the compensation factor.

13. The processor of claim 12 wherein the compensation delay includes a coarse delay and a fine delay, the step of selecting includes selecting a coarse delay and a fine delay and the step of delaying the EDP includes first delaying the EDP by the coarse delay to generate a coarsely delayed EDP and then delaying the coarsely delayed EDP by the fine delay to generate a corrected EDP.

14. The processor of claim 12 wherein each detector unit includes a plurality of crystals arrayed across the detector surface area, each crystal, when a photon is absorbed thereby at an event time, generating light which is sensed by other detector unit hardware, the other hardware generating the EDP, the step of determining a detection point including determining which crystal absorbed a photon, the step of selecting including selecting a compensation delay which corresponds to the generating detector unit and the absorbing crystal.

15. The processor of claim 14 wherein the step of selecting includes selecting the coarse delay as a function of the generating detector unit and selecting the fine delay as a function of the absorbing crystal.

16. The processor of claim 14 wherein the other detector unit hardware includes a plurality of photo-multiplier tubes (PMTs) and wherein, when light is generated by a crystal, the light is sensed by the PMTs which generate PMT signals and the processor further performing the steps of, prior to identifying the impact point, identifying an EDP by summing PMT signals to generate a total energy signal, comparing the total energy signal to a threshold signal and, when the total energy signal exceeds the threshold signal, identifying an EDP.

17. An apparatus to be used with a PET scanner that includes a plurality of detector modules, each detector module including at least two detector units that together form a surface area, when a photon impacts the surface area at an impact point and an event time, one of the detector units generating an event detection pulse (EDP), scanner hardware that processes impacting photons causing varying delay between event times and corresponding EDPs, the apparatus for modifying the EDPs so that the timing of each EDP is essentially accurate relative to all other EDPs, the apparatus comprising:

a timing pick-off circuit linked to the detector module for identifying the time of an EDP;

a detector unit identifier that identifies the detector unit that generates an EDP;

a multiplexer linked to the identifier and that includes a separate input for each of the detector units and a single output, the multiplexer passing the EDP to the output;

a delay unit linked to the multiplexer output and the identifier, the delay unit selecting a compensation delay as a function of the detector unit and delaying the EDP by the compensation delay to generate a delayed EDP.

18. The apparatus of claim 17 wherein each detector unit includes a plurality of absorbing crystals that form the surface area and wherein the apparatus further includes a crystal identifier for identifying the crystal within the detector unit that a photon impacts, the crystal identifier also linked to the delay unit, the delay unit selecting the compensation factor as a function of the detector unit and the impacted crystal.

19. The apparatus of claim 18 wherein the delay unit selects a compensation delay by selecting both a coarse delay and a fine delay and the delay unit delays the EDP by first delaying the EDP by the coarse delay and then delaying the EDP by the fine delay.

20. The apparatus of claim 19 wherein the delay unit selects the coarse delay as a function of the detector unit and selects the fine delay as a function of the crystal.

21. The apparatus of claim 18 wherein each detector unit includes 36 separate crystals.

22. The apparatus of claim 17 wherein the at least two detector units include six detector units.