Seed metal delete process for thin film repair solutions using direct UV laser
First Claim
1. A method of forming a multilayer thin film structure (MLTF) which comprises a series of layers comprising a dielectric having metal thereon in the form of wiring and via interconnections and a top surface layer of the structure which has vias, chip connection pads, via-pad connection straps for only non-defective vias and a plurality of orthogonal X conductor lines and Y conductor lines and defined metal strap repair lines thereon comprising the steps of:
- building the MLTF layer by layer up to a layer adjacent the top surface metal layer of the structure;
electrically testing and/or inspecting the layer adjacent to the top surface metal layer and determining faulty interconnections;
determining the interconnection defects at the thin film layer below and adjacent to the top surface layer of the MLTF structure;
defining the top surface connections needed to repair the defective interconnections based on the defects uncovered to determine the best metal line repair routes on the top surface layer;
applying a dielectric layer and forming vias in the layer;
applying a metal conducting layer on the dielectric layer and in the vias;
deleting the metal conducting layer for via-pad connection straps for vias determined to be defective and for X-Y orthogonal line intersections for X and/or Y lines which are determined to be top surface metal repair connections;
defining by a photoresist technique the top surface layer to form the top surface metallization as if no defects existed including a plurality of orthogonal X-Y repair lines;
defining metal routes for connecting pads of defective vias (nets) needing repair by first metal connecting line straps from the pad to an X repair line and/or a Y repair line and then connecting the connected X and/or Y repair line using the defined X and/or Y lines to a desired second pad by second metal connecting line straps from the X or Y repair line to the second pad by exposing the photoresist layer based on the defects uncovered to define the first and second metal connecting line straps; and
then developing and plating the top surface metallization layer to form the wiring including vias, chip connection pads, via-pad connection straps for only non-defective vias and a plurality of orthogonal X conductor lines and Y conductor lines and defined metal strap repair lines.
1 Assignment
0 Petitions
Accused Products
Abstract
A multilayer thin film structure (MLTF) is provided having no extraneous via-pad connection strap plated metallurgy for defective vias needing removal. The method for making or repairing the MLTF comprises determining interconnection defects in the MLTF at a thin film layer adjacent to the top metal layer of the structure, applying a top surface dielectric layer and forming vias in the layer, applying a metal conducting layer and removing the metal conducting layer for via-pad connection straps of defective vias and at the intersection of XY lines used in the repair, defining the top surface metallization including a series of orthogonal X conductor repair lines and Y conductor repair lines using a photoresist and lithography and then using a phototool to selectively expose the photoresist to define top surface strap connections needed to repair the interconnections and/or make EC'"'"'s, and forming the top surface metallization using additive or subtractive metallization techniques.
33 Citations
9 Claims
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1. A method of forming a multilayer thin film structure (MLTF) which comprises a series of layers comprising a dielectric having metal thereon in the form of wiring and via interconnections and a top surface layer of the structure which has vias, chip connection pads, via-pad connection straps for only non-defective vias and a plurality of orthogonal X conductor lines and Y conductor lines and defined metal strap repair lines thereon comprising the steps of:
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building the MLTF layer by layer up to a layer adjacent the top surface metal layer of the structure;
electrically testing and/or inspecting the layer adjacent to the top surface metal layer and determining faulty interconnections;
determining the interconnection defects at the thin film layer below and adjacent to the top surface layer of the MLTF structure;
defining the top surface connections needed to repair the defective interconnections based on the defects uncovered to determine the best metal line repair routes on the top surface layer;
applying a dielectric layer and forming vias in the layer;
applying a metal conducting layer on the dielectric layer and in the vias;
deleting the metal conducting layer for via-pad connection straps for vias determined to be defective and for X-Y orthogonal line intersections for X and/or Y lines which are determined to be top surface metal repair connections;
defining by a photoresist technique the top surface layer to form the top surface metallization as if no defects existed including a plurality of orthogonal X-Y repair lines;
defining metal routes for connecting pads of defective vias (nets) needing repair by first metal connecting line straps from the pad to an X repair line and/or a Y repair line and then connecting the connected X and/or Y repair line using the defined X and/or Y lines to a desired second pad by second metal connecting line straps from the X or Y repair line to the second pad by exposing the photoresist layer based on the defects uncovered to define the first and second metal connecting line straps; and
then developing and plating the top surface metallization layer to form the wiring including vias, chip connection pads, via-pad connection straps for only non-defective vias and a plurality of orthogonal X conductor lines and Y conductor lines and defined metal strap repair lines. - View Dependent Claims (2, 3, 4)
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5. A method for repairing defective via interconnections of multilayer thin film structures (MLTF) or making engineering changes (EC'"'"'s) to the structures which structures comprise a series of layers comprising a dielectric layer having plated metal thereon in the form of wiring and via interconnections to the next layer and a top layer of the structure which has interconnecting vias to the lower layers and corresponding chip connection pads connected to the vias by straps comprising the steps of:
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building the MLTF layer by layer up to a layer adjacent the top surface metal layer of the structure;
electrically testing and/or inspecting the layer adjacent to the top surface metal layer and determining faulty interconnections;
determining the interconnection defects at the thin film layer below and adjacent to the top surface layer of the MLTF structure;
defining the top surface connections needed to repair the defective interconnections based on the defects uncovered and/or EC'"'"'s desired to determine the best metal line repair routes on the top surface layer;
applying a dielectric layer and forming vias in the layer;
applying a metal conducting layer on the dielectric layer and in the vias;
deleting the metal conducting layer for via-pad connection straps for vias determined to be defective and for X-Y orthogonal line intersections for X and/or Y lines which are determined to be top surface metal repair connections;
defining by a photoresist technique the top surface layer to form the top surface metallization as if no defects existed including a plurality of orthogonal X-Y repair lines;
defining metal routes for connecting pads of defective vias (nets) needing repair by first metal connecting line straps from the pad to an X repair line and/or a Y repair line and then connecting the connected X and/or Y repair line using the defined X and/or Y lines to a desired second pad by second metal connecting line straps from the X or Y repair line to the second pad by exposing the photoresist layer based on the defects uncovered and/or EC changes to define the first and second metal connecting line straps; and
then developing and plating the top surface metallization layer to form the wiring including vias, chip connection pads, via-pad connection straps for only non-defective vias and a plurality of orthogonal X conductor lines and Y conductor lines and defined metal strap repair lines. - View Dependent Claims (6, 7, 8, 9)
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Specification