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Method and apparatus measuring parameters of material

  • US 6,242,927 B1
  • Filed: 02/23/1998
  • Issued: 06/05/2001
  • Est. Priority Date: 04/09/1997
  • Status: Expired due to Term
First Claim
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1. An apparatus for measuring at least one parameter of material comprising:

  • a frequency generating circuit configured to generate a combined frequency signal having a plurality of frequency components selected in response to a plurality of frequency control signals;

    a sensing circuit coupled to the frequency generating circuit and including a sensing element coupled to the material being measured, wherein the combined frequency signal is applied as an excitation signal to the sensing element and the sensing element generates output signals based upon the frequency response of the material at each of the frequencies;

    a signal conditioning circuit coupled to the sensing circuit and configured to determine the frequency response of the material at each of the frequencies based upon the output signals from the sensing element; and

    a signal processing circuit coupled to the conditioning circuit and configured to analyze the frequency response of the material to determine the at least one parameter of the material.

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