Method to reduce reset noise in photodiode based CMOS image sensors
First Claim
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1. A method comprising:
- asserting a sample signal and a reset signal to generate a reset voltage at a storage node of each photocell in a first group of photocells in an image sensor array; and
then deasserting the reset signal prior to deasserting the sample signal so that the reset voltage is captured at the storage node; and
then asserting a first address signal to read the captured reset voltage at the storage node;
waiting an integration period after deasserting the reset signal and before reading an exposed voltage at the storage node; and
generating a difference between the exposed voltage and the captured reset voltage.
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Abstract
A method for controlling a sensor to reduce reset noise is disclosed. The method including the steps of providing a reset command including a RESET signal and a first SAMPLE signal. The method also includes the steps of providing a read command including a first ADDRESS signal, a second SAMPLE signal, and a second ADDRESS signal. An apparatus including a system controller and a sensor controlled by the system controller is also disclosed. In one embodiment, the method and apparatus is provided for a sensor in a sensor array that is read-out in a pipelined fashion.
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Citations
14 Claims
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1. A method comprising:
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asserting a sample signal and a reset signal to generate a reset voltage at a storage node of each photocell in a first group of photocells in an image sensor array; and
thendeasserting the reset signal prior to deasserting the sample signal so that the reset voltage is captured at the storage node; and
thenasserting a first address signal to read the captured reset voltage at the storage node;
waiting an integration period after deasserting the reset signal and before reading an exposed voltage at the storage node; and
generating a difference between the exposed voltage and the captured reset voltage. - View Dependent Claims (2, 3, 4, 5)
repeatedly performing the operations of claim 1 upon the image sensor array to read an image, in a pipelined manner.
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6. An apparatus comprising:
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a sensor array having a plurality of groups of photocells, each group of photocells being coupled to provide output voltages on a respective bitline, each photocell in a group having a reset device coupled to reset a photodetector in response to a reset signal being asserted, a sample device coupled to provide a low impedance path between the photodetector and a storage device, and a readout circuit coupled between the storage device and the respective bitline to provide an output voltage in response to an address signal being asserted; and
a controller coupled to control the sensor array by asserting a sample signal and a reset signal to generate a reset voltage at a storage node of each photocell in a first group of photocells in the sensor array; and
thendeasserting the reset signal prior to deasserting the sample signal so that the reset voltage is captured at the storage node; and
thenasserting a first address signal to read the captured reset voltage at the storage node, waiting an integration period after deasserting the reset signal and before reading an exposed voltage at the storage node, and generating a difference between the exposed voltage and the captured reset voltage. - View Dependent Claims (7, 8, 9, 10, 11, 12)
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13. An article of manufacture comprising:
a machine-readable medium having instructions stored therein which, when executed by a processor, cause an imaging system to electronically capture an image by asserting a sample signal and a reset signal to generate a reset voltage at a storage node of each photocell in a first group of photocells in an image sensor array, and then deasserting the reset signal prior to deasserting the sample signal so that the reset voltage is captured at the storage node, and then asserting a first address signal to read the captured reset voltage at the storage node, waiting an integration period after deasserting the reset signal and before reading an exposed voltage at the storage node, and generating a difference between the exposed voltage and the captured reset voltage. - View Dependent Claims (14)
Specification