SIMOX using controlled water vapor for oxygen implants
First Claim
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1. A method of processing a silicon substrate, comprising:
- placing the substrate into a vacuum chamber;
evacuating the vacuum chamber to a first pressure;
introducing a fluid other than molecular oxygen into the vacuum chamber; and
implanting ions into the substrate to form a buried oxide layer under a top silicon layer, wherein the fluid inhibits formations of threading dislocations in the top silicon layer for reducing a defect density of the processed substrate.
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Abstract
An ion implantation system for producing silicon wafers having relatively low defect densities, e.g., below about 1×106/cm2, includes a fluid port in the ion implantation chamber for introducing a background gas into the chamber during the ion implantation process. The introduced gas, such as water vapor, reduces the defect density of the top silicon layer that is separated from the buried silicon dioxide layer.
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Citations
13 Claims
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1. A method of processing a silicon substrate, comprising:
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placing the substrate into a vacuum chamber;
evacuating the vacuum chamber to a first pressure;
introducing a fluid other than molecular oxygen into the vacuum chamber; and
implanting ions into the substrate to form a buried oxide layer under a top silicon layer, wherein the fluid inhibits formations of threading dislocations in the top silicon layer for reducing a defect density of the processed substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method of processing a substrate, comprising:
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placing the substrate into a vacuum chamber;
evacuating the vacuum chamber to a first pressure;
introducing a fluid into the vacuum chamber; and
implanting ions into the substrate using an ion beam to form a buried oxide layer under a top silicon layer;
measuring a decrease in the ion beam current level due to the fluid in the chamber; and
adjusting the fluid level based upon the measured ion beam current level. - View Dependent Claims (13)
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Specification