System and method for normalizing and calibrating a sensor array

• US 6,252,393 B1
• Filed: 06/10/1999
• Issued: 06/26/2001
• Est. Priority Date: 06/23/1998
• Status: Expired due to Fees

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Hedengren, Kristina Helena Valborg
• Primary Examiner(s): Strecker, Gerard R.
• Application Number:
  US09/330,108
• Time in Patent Office: 747 Days
• Field of Search: 324/202, 324/227, 324/232, 324/242, 324/262, 73/18.6
• US Class Current: 324/202
• CPC Class Codes: G01B 21/042 Calibration or calibration artifacts G01B3/30, G01B9/02072 take precedence
• CPC Class Codes: G01N 27/9086 Calibrating of recording device

Abstract

The invention provides a system and method for normalizing and calibrating a sensor array. The sensor array can comprise differential element sensors, such as for example eddy current sensors, or absolute sensors. A single test specimen is used to normalize and calibrate the sensor array using one or more scans of the test specimen. Notably, only one alignment of the sensor array to the test specimen is required. The test specimen is preferably made of the same or similar type of material as the part to be tested and is of a similar geometric shape that can have a simple flat surface or a more complex surface. A linear feature and several notches are machined into the surface of the specimen by using, for example, electro-discharge machining methods, to provide the necessary signals when scanned by the sensor array. Signals from the linear feature on the test specimen are used to remove any bias and to normalize the dynamic ranges of all of the sensors in the array. Signals from the notches are used to establish the gain settings for the sensors in the array.

Claims

1. A method for simultaneously normalizing and calibrating a sensor array, the sensor array for use in scanning a work piece to detect discontinuities in the work piece, said method comprising the steps of:

providing a sensor array having multiple sensors capable of producing an electrical signal indicative of a discontinuity in a work piece;

providing a test specimen comprising at least one linear feature and at least two notches;

scanning said test specimen using said sensor array to produce multiple electrical signal traces indicative of said linear feature and said at least two notches; and

using said multiple electrical signal traces to adjust each said sensors of said sensor array to obtain uniform electrical signal from each said sensor.

2. The method of claim 1, further comprising the step of:

aligning said sensor array to said test specimen.

3. The method of claim 2, wherein said sensor array comprises two staggered rows of sensors;

wherein said step of aligning said array of sensors to said test specimen further comprises;

aligning said sensors with said linear feature such that said linear feature covers the scanning area of said sensor array;

aligning a first sensor from said first row of said sensor array such that said first sensor passes over said notches during scanning; and

aligning a second sensor from said second row of said sensor array such that said second sensor passes over said notches during scanning.

4. The method of claim 1, wherein said sensor array comprises eddy current sensors.

5. The method of claim 1, wherein said sensor array comprises sensors comprising absolute elements.

6. The method of claim 1, wherein said test specimen comprises the substantially same material as the work piece.

7. The method of claim 1, wherein said linear feature is slanted relative to the scanning direction of the sensor array.

8. The method of claim 1, wherein said linear feature is perpendicular relative to the scanning direction of the sensor array.

9. The method of claim 1, wherein said step of using the multiple electrical signal traces to adjust each said sensor of said sensor array to obtain uniform electrical signal from each said sensor further comprises the step of:

normalizing said sensor array using the electrical signals produced by said sensors as a result of detecting said linear feature.

10. The method of claim 1, wherein said step of using the multiple electrical signal traces to adjust each said sensor of said sensor array to obtain uniform electrical signal from each said sensor further comprises the step of:

calibrating said sensor array using the electrical signals produced by said sensors as a result of detecting said at least two notches.

11. The method of claim 1, wherein said step of using the multiple electrical signal traces to adjust each said sensor of said sensor array to obtain uniform electrical signal from each said sensor further comprises the step of:

determining the dynamic range for each said sensor in said sensor array from the maximum and minimum electrical signals produced by each sensor as a result of detecting said linear feature.

12. The method of claim 11, further comprising the step of:

using the dynamic range determined to normalize the electrical signals produced by each said sensor.

13. The method of claim 1, wherein said step of using the multiple electrical signal traces to adjust each said sensor of said sensor array to obtain uniform electrical signal from each said sensor further comprises the step of:

determining the DC bias for each said sensor from the offset of the electrical signals produced by each said sensor as a result of detecting said linear feature.

14. The method of claim 13, further comprising the step of:

removing the DC bias from each electrical signal produced by each said sensor as a result of detecting the linear feature.

15. The method of claim 1, wherein said step of using the multiple electrical signal traces to adjust each said sensor of said sensor array to obtain uniform electrical signal from each said sensor further comprises the step of:

determining the maximum notch response from the maximum electrical signals produced by each said sensor as a result of detecting said at least two notches.

16. The method of claim 15, further comprising the step of:

establishing the desired system gain from the maximum notch response.

17. The method of claim 1, wherein said step of using the multiple electrical signal traces to adjust each said sensor of said sensor array to obtain uniform electrical signal from each said sensor further comprises the step of:

determining the maximum notch response from estimation using signals produced by said sensors adjacent to said sensors detecting said at least two notches.

18. A system for simultaneously normalizing and calibrating a sensor array, the sensor array for use in scanning a work piece to detect discontinuities in the work piece, said system comprising:

a sensor array having multiple sensors capable of producing an electrical signal indicative of a discontinuity in a work piece;

a test specimen comprising at least one linear feature and at least two notches;

wherein said test specimen is scanned using said array to produce multiple electrical signal traces indicative of said linear feature and said at least two notches; and

wherein said multiple electrical signal traces are used to adjust each said sensor of said sensor array to obtain uniform electrical signal from each said sensor by normalizing the sensor array using the electrical signals produced by the sensor array as a result of detecting said linear feature and calibrating the sensor array using the electrical signals produced by the sensor array as a result of detecting said at least two notches.