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Method and apparatus for automatically adjusting the measurement range of admittance level sensors

  • US 6,259,259 B1
  • Filed: 04/21/1999
  • Issued: 07/10/2001
  • Est. Priority Date: 04/21/1998
  • Status: Expired due to Fees
First Claim
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1. Method for evaluating an admittance of a variable capacitance, comprising:

  • supplying an oscillator voltage to the capacitance, the oscillator voltage having an oscillator frequency; and

    evaluating the admittance of the capacitance with an evaluation circuit which includes a synchronous demodulator and produces a measurement signal corresponding to the admittance of the capacitance, wherein the synchronous demodulator is controlled by a switching signal derived from the oscillator voltage, and the switching signal is toggled between the oscillator frequency and at least a second frequency which is different from the oscillator frequency, so as to adjust a rectifying factor of the synchronous demodulator.

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