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Electrostatic capacitive sensor and method for manufacturing the same

  • US 6,265,238 B1
  • Filed: 02/08/2000
  • Issued: 07/24/2001
  • Est. Priority Date: 07/03/1996
  • Status: Expired due to Fees
First Claim
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1. A manufacturing method for an electrostatic capacitive sensor, comprising the steps of:

  • forming an electrically conductive region in part of a semiconductor single-crystal silicon layer which forms a silicon-on-insulator substrate;

    decreasing the thickness of a semiconductive region of said single-crystal silicon layer and the thickness of part of said electrically conductive region located adjacent to said semiconductive region;

    separating said semiconductive region and said electrically conductive region of said single-crystal silicon layer by forming a clearance at or in the vicinity of the interface therebetween;

    forming an insulating portion inside said clearance;

    forming a CV conversion circuit in said semiconductive region;

    electrically connecting an input terminal of said CV conversion circuit to said electrically conductive region via a lead line; and

    forming a sensing unit in said electrically conductive region, said sensing unit being electrically connected to said lead line.

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