Apparatus and method to limit the life span of a diagnostic medical ultrasound probe

• US 6,270,460 B1
• Filed: 06/24/1999
• Issued: 08/07/2001
• Est. Priority Date: 06/24/1999
• Status: Expired due to Term

• Current Assignee: Siemens Medical Solutions USA Incorporated (Siemens AG)
• Original Assignee: Acuson Corporation (Siemens AG)
• Inventors: Marshall, John D., Reynolds, Gregory A., McCartan, Dermot
• Primary Examiner(s): Lateef, Marvin M.
• Assistant Examiner(s): Imam, Ali M.
• Application Number:
  US09/344,313
• Time in Patent Office: 775 Days
• Field of Search: 600/437, 600/443, 600/447, 600/459, 736/18, 736/20--21
• US Class Current: 600/459
• CPC Class Codes: A61B 2560/0276 Determining malfunction
• CPC Class Codes: A61B 8/12 in body cavities or body tracts, e.g. by using catheters catheters per se A61M25/00
• CPC Class Codes: A61B 8/4438 Means for identifying the diagnostic device, e.g. barcodes
• CPC Class Codes: A61B 8/58 Testing, adjusting or calibrating the diagnostic device

Abstract

An ultrasound probe for diagnostic medical ultrasound imaging, including an ultrasound transducer and a circuit having a plurality of states to limit the use of the ultrasound probe. Ultrasound probe use can be limited based on a unique identification number (e.g., selected by means of electrically programmable fuses) assigned to each ultrasound probe. Alternatively, the ultrasound system software monitors and updates the number of times that the ultrasound probe has been used. Another aspect of the invention is directed to an ultrasound system, including an ultrasound probe with multiple states, a circuit to program and to receive state data from the ultrasound probe and interpret the state data, and a cable to communicate state data between the ultrasound probe and the processor. Another aspect of the invention is directed to a method for using a limited use ultrasound probe, including the steps of determining the state of a circuit in the limited use ultrasound probe and determining if the ultrasound probe can be used.

Claims

1. An ultrasound probe, comprising:

a housing, said housing including;

an ultrasound transducer; and

a circuit having a plurality of states to limit the use of the ultrasound probe; and

wherein the circuit comprises an element that disables the probe as a function of said plurality of states.

2. The ultrasound probe of claim 1 wherein said housing further comprises a programmable memory that indicates the ultrasound probe is inoperable.

3. The ultrasound probe of claim 1, wherein said plurality of states further includes a state that indicates the ultrasound probe is inoperable.

4. The ultrasound probe of claim 1, wherein the circuit includes a plurality of fuses.

5. The ultrasound probe of claim 1, wherein the circuit causes a thermal fault to prevent further use of the ultrasound probe.

6. The ultrasound probe of claim 1, wherein said circuit operates independently of an ultrasound system coupled with said ultrasound probe.

7. An ultrasound probe, comprising:

an ultrasound transducer; and

a circuit having at least one discrete state to limit the use of the ultrasound probe to a fixed number of uses, wherein each of said at least one discrete state represents one of said fixed number of uses; and

wherein expiration of all of said at least one discrete state renders said ultrasound probe unusable.

8. The ultrasound probe of claim 7, further comprising means for expiring one of said at least one discrete state.

9. The ultrasound probe of claim 7, wherein the circuit includes at least one fuse.

10. The ultrasound probe of claim 9, wherein one of the at least one fuse is permanently open-circuited upon each power-on of the ultrasound probe.

11. The ultrasound probe of claim 7, wherein the circuit comprises an element that disables the probe after one use.

12. An ultrasound probe, comprising:

an ultrasound transducer; and

a circuit having at least one discrete state to limit the use of the ultrasound probe to a fixed number of uses, wherein each of said at least one discrete state represents one of said fixed number of uses; and

wherein expiration of all of said at least one discrete state causes said ultrasound probe to indicate a thermal fault to an ultrasound system coupled with said ultrasound probe.

13. The ultrasound probe of claim 12, further comprising means for expiring one of said at least one discrete state.

14. The ultrasound probe of claim 12, wherein the circuit includes at least one fuse.

15. The ultrasound probe of claim 14, wherein one of the at least one fuse is permanently open-circuited upon each power-on of the ultrasound probe.

16. The ultrasound probe of claim 12, wherein the circuit comprises an clement that disables the probe after one use.

17. A method of limiting the use of an ultrasound probe comprising:

(a) providing a circuit with at least one discrete state within said ultrasound probe representing one of a fixed number of uses of said ultrasound probe;

(b) expiring one of said at least one discrete state upon power on of said ultrasound probe;

(c) allowing use of said ultrasound probe, by said circuit, when at least one of said at least one discrete state remains unexpired; and

(d) preventing use of said ultrasound probe, by said circuit, when all of said at least one discrete state are expired.

18. The method of claim 17 further comprising:

(e) simulating a thermal fault within said ultrasound probe, by said circuit, when all of said at least one discrete state are expired.

19. The method of claim 17 wherein said at least one discrete state comprises at least one fuse, the method further comprising

(e) open circuiting, permanently, said at least one fuse upon power on of said ultrasound probe.