Method and system for evaluating an electrochemical cell for use with an implantable medical device

• US 6,274,265 B1
• Filed: 07/21/1999
• Issued: 08/14/2001
• Est. Priority Date: 07/21/1999
• Status: Expired due to Term

• Current Assignee: Medtronic Incorporated (Medtronic Plc)
• Original Assignee: Medtronic Incorporated (Medtronic Plc)
• Inventors: Schmidt, Craig L., Merritt, Donald R., Skarstad, Paul M., Kraska, Robert E.
• Primary Examiner(s): Chaney, Carol
• Assistant Examiner(s): YUAN, DAH WEI D
• Application Number:
  US09/358,031
• Time in Patent Office: 755 Days
• Field of Search: 429/48, 429/90, 429/91, 324/426, 324/429, 324/431, 324/433
• US Class Current: 429/90
• CPC Class Codes: H01M 10/4285 Testing apparatus
• CPC Class Codes: Y02E 60/10 Energy storage using batteries

Abstract

A method of evaluating an electrochemical cell for a metallic contaminant-caused defect. The electrochemical cell is configured for use with an implantable medical device and includes an anode, a solid cathode and a liquid electrolyte. The method includes storing the cell at an elevated temperature following assembly for accelerating corrosion of possible metallic contaminants. A parameter of the cell related to cell voltage is then measured. An evaluation is made as to whether the cell is defective based upon this measured parameter.

Claims

1. A method of identifying a defective electrochemical cell after assembly, said cell having an anode, a solid cathode and a liquid electrolyte, comprising the steps of:

storing the cell without burn-in at an elevated temperature for a storage time;

testing the cell at the end of the storage time period by measuring a parameter of the cell related to cell voltage; and

determining whether the cell is defective based upon the measured parameter.

2. The method of claim 1, wherein the determination of whether the cell is defective is made based on an evaluation of a deviation of the measured parameter of the cell from a value for a non-defective cell.

3. The method of claim 1 further comprising the step of subjecting the cell to a burn-in procedure wherein the cell is actually discharged to confirm the integrity of the cell.

4. The method of claim 1, wherein the cell is stored at a temperature of less than 80°

C.

5. The method of claim 4, wherein the cell is stored at a temperature of greater than 25°

C.

6. The method of claim 1, wherein the cell is stored at a storage temperature in the range of approximately 30°

-70°

C.

7. The method of claim 6, wherein the storage temperature is in the range of approximately 37°

-60°

C.

8. The method of claim 7, wherein the storage temperature is approximately 60°

C.

9. The method of claim 1, wherein the cell is stored at an elevated temperature for a storage time period of less than 11 days.

10. The method of claim 1, wherein the storage time period is less than 7 days.

11. The method of claim 10, wherein the storage time period is in the range of 1-3 days.

12. The method of claim 1, wherein storing the cell at an elevated temperature includes storing the cell at an elevated potential.

13. The method of claim 12, wherein storing the cell at an elevated potential includes not subjecting the cell to burn-in.

14. The method of claim 1, wherein the cell is not at least partially discharged prior to storing at an elevated temperature.

15. The method of claim 1, wherein following assembly, the cell has a maximum cathode potential, and further wherein storing the cell at an elevated temperature occurs approximately at the maximum cathode potential.

16. The method of claim 1, wherein evaluating whether the cell is defective includes statistically analyzing measured parameters for a plurality of assembled and stored cells.

17. The method of claim 1, wherein the anode includes lithium metal.

18. The method of claim 1, wherein the anode includes a lithium ion containing body.

19. A method of evaluating an electrochemical cell for metallic contaminant-caused defect, the electrochemical cell configured for use with an implantable medical device and including an anode, a solid cathode and a liquid electrolyte, the method including:

following assembly of the cell, storing the cell without burn-in at a temperature of approximately 60°

C. for a storage time period in the range of approximately 1-3 days;

measuring a parameter of the cell related to cell voltage following the storage time period; and

evaluating whether the cell is defective based upon the measured parameter.

20. A method of manufacturing an electrochemical cell for use with an implantable medical device, the method including:

assembling the cell such that the cell includes an anode, a solid cathode and a liquid electrolyte;

storing the cell at an elevated temperature selected to accelerate corrosion of metallic contaminants;

measuring a parameter of the cell related to cell voltage, wherein the cell is not at least partially discharged prior to measuring the parameter; and

determining whether the cell is defective by evaluating whether the measured parameter is indicative of a presence of a metallic contaminant in the cell.

21. The method of claim 20, wherein the cell is stored at a temperature of less than 80°

C.

22. The method of claim 21, wherein the cell is stored at a temperature of greater than 25°

C.

23. The method of claim 20, wherein the cell is stored at a storage temperature in the range of approximately 30°

-70°

C.

24. The method of claim 23, wherein the storage temperature is in the range of approximately 37°

-60°

C.

25. The method of claim 24, wherein the storage temperature is approximately 60°

C.

26. The method of claim 20, wherein the cell is stored at an elevated temperature for a storage time period of less than 11 days.

27. The method of claim 26, wherein the storage time period is less than 7 days.

28. The method of claim 27, wherein the storage time period is in the range of 1-3 days.

29. The method of claim 20, wherein storing the cell at an elevated temperature includes storing the cell at an elevated potential.

30. The method of claim 29, wherein storing the cell at an elevated potential includes not subjecting the cell to a burn-in.

31. The method of claim 20, wherein the cell is not at least partially discharged prior to storing at an elevated temperature.

32. The method of claim 20, wherein following assembly, the cell has a maximum cathode potential, and further wherein storing the cell at an elevated temperature occurs approximately at the maximum cathode potential.

33. The method of claim 20, wherein a plurality of cells are assembled and stored at the elevated temperature, each of the plurality of cells having the parameter related to cell voltage measured, and wherein evaluating whether the cell is defective includes statistically analyzing the measured parameter for the plurality of cells.

34. The method of claim 20, wherein assembling the cell includes forming the anode to include a lithium metal.

35. The method of claim 20, wherein assembling the cell includes forming the anode to include a lithium ion containing body.

36. The method of claim 20, wherein assembling the cell includes forming the cathode to include silver vanadium oxide.

37. The method of claim 20, wherein assembling the cell includes forming the cathode to include a mixture of silver vanadium oxide and carbon monofluoride.

38. The method of claim 20, wherein assembling the cell includes forming the electrolyte to include an organic material.

39. A method of manufacturing an electrochemical cell for use with an implantable medical device, the method including:

assembling a cell such that the cell includes an anode, a solid cathode and a liquid electrolyte;

following assembly of the cell, storing the cell at a temperature of approximately 60°

for a time period in the range of approximately 1-3 days;

measuring a parameter of the cell related to cell voltage; and

evaluating whether the cell has a metallic contaminant-caused defect based upon the measured parameter.

40. An electrochemical cell testing system for detecting presence of a metallic contaminant-caused defect in an electrochemical cell configured for use with an implantable medical device, the electrochemical cell including an anode, a solid cathode and a liquid electrolyte, the system comprising:

means for storing the cell at an elevated temperature to accelerate corrosion of metallic contaminants;

means for sensing a parameter of the cell related to cell voltage following storage, said sensing means being configured to produce a value indicative of a presence of a metallic contaminant in the cell; and

means for evaluating whether the cell has a metallic contaminant-caused defect based upon the measured parameter.

41. The system of claim 40, wherein the means for storing the cell is configured to maintain the cell at a storage temperature in the range of 25°

-80°

C.

42. The system of claim 41, wherein the storage temperature is in the range of approximately 37°

-60°

C.

43. The system of claim 42, wherein the storage temperature is approximately 60°

C.

44. The system of claim 40, wherein the means for storing the cell is configured to maintain the cell for a storage time period of less than 11 days.

45. The system of claim 44, wherein the storage time period is less than 7 days.

46. The system of claim 45, wherein the storage time period is in the range of approximately 1-3 days.

47. The system of claim 40, wherein the means for evaluating is configured to perform a statistical analysis of sensed parameters for a plurality of cells.

48. An electrochemical cell testing system for detecting the presence of a metallic contaminant-caused defect in an electrochemical cell configured for use within an implantable medical device, the electrochemical cell including an anode, a solid cathode and a liquid electrolyte, the system comprising:

a storage device configured to store the cell at an elevated temperature for accelerating corrosion of metallic contaminants;

a sensor configured to sense a parameter of the cell related to cell voltage following storage and produce a value indicative of a presence of a metallic contaminant in the cell; and

an analyzer configured to determine the presence of a metallic contaminant-caused defect in the cell based upon the value produced by the sensor.

49. The system of claim 48, wherein the means for storing the cell is configured to maintain the cell at a storage temperature in the range of 25°

-80°

C.

50. The system of claim 49, wherein the storage temperature is in the range of approximately 37°

-60°

C.

51. The system of claim 50, wherein the storage temperature is approximately 60°

C.

52. The system of claim 48, wherein the means for storing the cell is configured to maintain the cell for a storage time period of less than 11 days.

53. The system of claim 52, wherein the storage time period is less than 7 days.

54. The system of claim 53, wherein the storage time period is in the range of 1-3 days.

55. The system of claim 48, wherein the analyzer is configured to perform a statistical analysis of sensed parameters for a plurality of cells.