Digital offset corrector

• US 6,274,869 B1
• Filed: 05/26/1998
• Issued: 08/14/2001
• Est. Priority Date: 06/28/1996
• Status: Expired due to Term

• Current Assignee: Lockheed Martin IR Imaging Systems, Inc. (Martin Marietta Corporation)
• Original Assignee: Lockheed Martin IR Imaging Systems, Inc. (Martin Marietta Corporation)
• Inventors: Butler, Neal R.
• Primary Examiner(s): Hannaher, Constantine
• Assistant Examiner(s): GAGLIARDI, ALBERT J
• Application Number:
  US08/981,109
• Time in Patent Office: 1,176 Days
• Field of Search: 250/338.1, 250/338.3, 250/378.4, 250/332, 250/252.1
• US Class Current: 250/338.1
• CPC Class Codes: G01J 5/061 by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
• CPC Class Codes: G01J 5/22 Electrical features thereof
• CPC Class Codes: G01J 5/80 Calibration using comparison with reference sources G01J5/52
• CPC Class Codes: H04N 25/671 for non-uniformity detection or correction
• CPC Class Codes: H04N 25/673 by using reference sources
• CPC Class Codes: H04N 5/33 Transforming infrared radiation cameras or camera modules for generating image signals from infrared radiation H04N23/20; circuitry of SSIS for transforming infrared radiation into image signals H04N25/20

Abstract

An offset corrector for a focal plane array. A bolometer array configured in a row and column readout format has dedicated column circuits to measure the resistance of each bolometer in the column. A high speed on-chip analog to digital converter converts the analog sensor signal to a digital representation. Since the response of each bolometer varies, an offset controller, connected to the output of the analog to digital converter, corrects the digital representation for variations in individual bolometer response. Each pixel has a corresponding dynamically computed offset stored in the memory. The offset is computed when a chopper or shutter blocks radiation from the focal plane array. The focal plane array is temperature stabilized to a predetermined temperature to keep bolometer response within a predetermined bandwidth.

Claims

1. Apparatus comprising:

at least one sensor to detect radiation and to output image signals based on the detected radiation; and

offset correction circuitry to compensate errors in the image signals and to output corrected image signals,

wherein the sensor and at least a portion of the offset correction circuitry are monolithically integrated on a single semiconductor substrate, and

wherein the offset correction circuitry further includes means for providing a time-varying compensation signal for each at least one sensor to compensate the errors in the image signals.

2. The apparatus of claim 1, wherein the at least one sensor includes a plurality of microbolometer elements.

3. The apparatus of claims 1, further including an analog to digital converter to output digital image data based on the corrected image signals.

4. The apparatus of claim 1, wherein the means for providing a time-varying compensation signal includes means for providing a different time-varying compensation signal for each sensor.

5. The apparatus of claim 1, wherein the means for providing the time-varying compensation includes means for receiving digital data.

6. The apparatus of claim 1, wherein the means for providing a time-varying compensation signal include a nonlinear compensating voltage supply to compensate changes in the image signals due to current-induced heating of the at least one sensor.

7. The apparatus of claim 1, wherein the offset correction circuitry includes means for receiving digital offset data.

8. The apparatus of claim 7, wherein:

the at least one sensor includes a plurality of sensors; and

the offset correction circuitry includes a digital to analog converter to compensate non-uniformities of the sensors.

9. The apparatus of claim 8, wherein:

the plurality of sensors includes a plurality of microbolometer elements; and

the digital to analog converter compensates resistance non-uniformities of the microbolometer elements.

10. The apparatus of claim 8, wherein the digital to analog converter includes:

a plurality of compensating resistors connected in series; and

a corresponding plurality of compensating resistor switches, each compensating resistor switch connected across a respective compensating resistor and responsive to the digital offset data, to selectively short the respective compensating resistor based on the digital offset data.

11. The apparatus of claim 8, further including an analog to digital converter to output digital image data based on the corrected image signals.

12. The apparatus of claim 7, wherein the means for receiving digital offset data includes a digital to analog converter.

13. Apparatus comprising:

at least one sensor to detect radiation and to output image signals based on the detected radiation; and

offset correction circuitry to compensate errors in the image signals and to output corrected image signals,

wherein the sensor and at least a portion of the offset correction circuitry are monolithically integrated on a single semiconductor substrate,

wherein the offset correction circuitry includes means for receiving digital offset data, wherein;

the at least one sensor includes a plurality of sensors; and

the offset correction circuitry includes a digital to analog converter to compensate non-uniformities of the sensors, and

wherein the offset correction circuitry further includes a nonlinear compensating voltage supply to compensate changes in the image signals due to current-induced heating of the at least one sensor.

14. The apparatus of claim 13, wherein the offset correction circuitry further includes an analog to digital converter to output digital image data based on the corrected image signals.

15. Apparatus comprising:

at least one sensor to detect radiation and to output image signals based on the detected radiation; and

offset correction circuitry to compensate errors in the image signals and to output corrected image signals,

wherein the sensor and at least a portion of the offset correction circuitry are monolithically integrated on a single semiconductor substrate,

wherein the offset correction circuitry includes means for receiving digital offset data,

wherein the means for receiving digital offset data includes a digital to analog converter, and

wherein the offset correction circuitry further includes;

an amplifier to receive the image signals and to output amplified image signals; and

an offset capacitor, coupled to an output of the amplifier and responsive to an analog signal output from the digital to analog converter, to add an offset signal to the amplified image signals so as to provide the corrected image signals.

16. The apparatus of claim 15, wherein the offset signal is a time-varying compensation signal based on a charging and a discharging of the offset capacitor.

17. The apparatus of claim 15, wherein the offset correction circuitry further includes:

an integration capacitor to receive the corrected image signals and to provide integrated corrected image signals; and

means for discharging the integration capacitor when the integrated corrected image signals exceed a predetermined threshold.

18. The apparatus of claim 17, wherein the offset correction circuitry further includes:

an overflow counter to output digital overflow data based on a number of times the means for discharging the integration capacitor discharges the integration capacitor; and

an analog to digital converter to convert the integrated corrected image signals to digital image data.

19. The apparatus of claim 18, wherein the offset correction circuitry further includes an output driver to concatenate the digital overflow data and the digital image data so as to provide a digital data output.