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Axis alignment method

  • US 6,276,203 B1
  • Filed: 06/02/1999
  • Issued: 08/21/2001
  • Est. Priority Date: 02/08/1991
  • Status: Expired due to Fees
First Claim
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1. An apparatus for measuring the specific force and angular rotation rate of a moving body, comprising:

  • a) a monolithic substrate having first and second substantially planar surfaces disposed substantially parallel to each other and an epitaxial layer adhered to at least one of said first and second planar surfaces;

    b) a first accelerometer formed of said substrate and having a first force sensing axis for producing a first output signal indicative of the acceleration of the moving body along said first force sensing axis, said first accelerometer having a proof mass, a support frame, and at least one flexure connecting said proof mass to said support frame;

    c) a second accelerometer formed of said substrate and having a second force sensing axis for producing a second output signal indicative of the acceleration of the moving body along said second force sensing axis, said second accelerometer having a proof mass, a support frame, and at least one flexure connecting said proof mass to said support frame;

    d) a dither frame formed of said substrate;

    e) a first pair of S-bend flexures connected between said support frame of said first accelerometer and said dither frame, and a second pair of S-bend flexures connected between said support frame of said second accelerometer and said dither frame, said S-bend flexures being formed of said substrate for mounting said first and second accelerometers such that said first and second force sensing axes are both oriented at substantially the same angle with respect to said first and second surfaces and such that said first and second accelerometers can be moved along a vibration axis substantially perpendicular to each of said first and second sensing axes;

    f) a drive circuit coupled to each of said first and second accelerometers for imparting a dithering motion thereto of a predetermined frequency along said vibration axis;

    g) said substrate having a rate axis substantially perpendicular to each of said first and second force sensing axes and said vibration axis; and

    h) first and second axis alignment features, said first axis alignment feature disposed between said first accelerometer and said dither frame and rotating one of said first pair of S-bend flexures in response to a first rotational drive signal and said second axis alignment feature disposed between said second accelerometer and said dither frame and rotating one of said second pair of S-bend flexures in response to a second rotational drive signal, whereby said dithering motion is orthogonally aligned with said rate axis and said first and second output signals have a Coriolis component indicative of the angular rotation of the moving body about said rate axis.

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