Sensor arrangement with measurement error detection

• US 6,278,389 B1
• Filed: 12/15/1998
• Issued: 08/21/2001
• Est. Priority Date: 12/22/1997
• Status: Expired due to Term

• Current Assignee: NXP B.V. (NXP Semiconductors NV)
• Original Assignee: US Philips Corporation (Koninklijke Philips N.V.)
• Inventors: Lochmann, Hans-Ulrich, Pusch, Stefan
• Primary Examiner(s): JEAN PIERRE, PEGUY
• Application Number:
  US09/211,926
• Time in Patent Office: 980 Days
• Field of Search: 341/120, 341/150, 341/141, 341/155, 341/118
• US Class Current: 341/118
• CPC Class Codes: G01P 21/02 of speedometers

Abstract

A sensor arrangement comprising two sensors (1, 2) and processing unit (16) for deriving a measurement signal (M₁, M₂) from two sensor signals (S₁, S₂) which are each supplied by one sensor (1, 2). Such a sensor arrangement may comprise for example two angular-position sensors which measure the angular position of a measurement object with respect to the sensor arrangement. According to the invention, in order to enable detection of errors occurring in such a sensor arrangement, particularly at the input of the processing unit (16) during the conversion of the sensor signals in the A/D converter units (3, 4), switching means (11, 12) have been provided for switching to two switching states in such manner that in each switching state a sensor signal (S₁, S₂) is applied to each of the A/D converter units (3, 4) and that the allocation of the sensor signals (S₁, S₂) to the A/D converter units (3, 4) is different in the two switching states, and the processing unit (16) is constructed to derive an error signal (F) from two measurement signals (M₁, M₂) determined during each time one switching state.

Claims

1. A sensor arrangement comprising two sensors supplying respective sensor signals, and a processing unit having two A/D converter units at an input side of the processing unit, for deriving a measurement signal from the respective sensor signals,

characterized in that the sensor arrangement further comprises switching means arranged between said sensors and said A/D converter units, for switching between first and second switching states in such manner that in each switching state a sensor signal is applied to each of the A/D converter units and that the allocation of the sensor signals to the A/D converter units is different in the two switching states, and

said processing unit derives a first measurement signal during the first switching state, and a second measurement signal during the second switching state, and derives an error signal from said first and second measurement signals.

2. A sensor arrangement as claimed in claim 1, characterized in that the arrangement further comprises two further sensors each supplying a respective sensor signal, the switching means is constructed to switch to two further switching states in such a manner that in the further switching states the sensor signals of the two further sensors are processed, and

the processing unit derives four measurement signals respectively determined during each of the four switching states.

3. A sensor arrangement as claimed in claim 1, characterized in that the processing unit comprises two arithmetic units arranged after the A/D units, and further switching means to switch connections between the A/D converter units and the arithmetic units in such a manner that in the first switching state both A/D converter units are connected to a first of the two arithmetic units, and in the second switching state both A/D converter units are connected to the other of the two arithmetic units.

4. A sensor arrangement as claimed in claim 1, characterized in that that in the first switching state one of the sensor signals is applied to a first of the two A/D converter units and the other of the sensor signals is applied to the other of the A/D converters;

and in the second switching state said one of the sensor signals is applied to said other of the A/D converters, and said other of the sensor signals is applied to said first of the two A/D converter units.

5. A sensor arrangement as claimed in claim 1, characterized in that the arrangement further comprises memory means for storing said one of the sensor signals and said other of the sensor signals, and

the switching means is arranged in such a manner that, in the second switching state, the respective stored sensor signals are applied to the A/D converter units.

6. A sensor arrangement as claimed in claim 5, characterized in that the processing unit comprises two arithmetic units arranged after the A/D units, and further switching means to switch connections between the A/D converter units and the arithmetic units in such a manner that in the first switching state both A/D converter units are connected to a first of the two arithmetic units, and in the second switching state both A/D converter units are connected to the other of the two arithmetic units.

7. An angular-position sensor arrangement comprising two angular-position sensors which are angularly spaced from one another, supplying respective sensor signals, and a processing unit having two A/D converter units at an input side of the processing unit, for deriving a measurement signal from the respective sensor signals,

characterized in that the sensor arrangement further comprises switching means arranged between said angular-position sensors and said A/D converter units, for switching between first and second switching states in such manner that in each switching state a sensor signal is applied to each of the A/D converter units and that the allocation of the sensor signals to the A/D converter units is different in the two switching states, and

said processing unit derives a first measurement signal during the first switching state, and a second measurement signal during the second switching state and derives an error signal from said first and second measurement signals.

8. A sensor arrangement as claimed in claim 7, characterized in that that in the first switching state one of the sensor signals is applied to a first of the two A/D converter units and the other of the sensor signals is applied to the other of the A/D converters;

and in the second switching state said one of the sensor signals is applied to said other of the A/D converters, and said other of the sensor signals is applied to said first of the two A/D converter units.

9. A method of measurement-error detection in a sensor arrangement in which a measurement signal (M₁, M₂) is derived from two sensor signals (S₁, S₂) by means of a processing unit (16) comprising two A/D converter units (3, 4), characterized in that the two sensor signals (S₁, S₂) are converted by means of one A/D converter (3, 4), a first measurement signal (M₁) is derived from the output signals of said A/D converter units, the two sensor signals (S₁, S₂) are converted by means of the other A/D converter unit (4, 3), a second measurement signal (M₂) is derived from their output signals, and an error signal (F) is derived from the two measurement signals (M₁, M₂).