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Methods, apparatus and computer program products for performing post-layout verification of microelectronic circuits using best and worst case delay models for nets therein

  • US 6,286,126 B1
  • Filed: 04/13/1999
  • Issued: 09/04/2001
  • Est. Priority Date: 08/30/1996
  • Status: Expired due to Term
First Claim
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1. A method of extracting nets interconnecting active devices in an integrated circuit, comprising the steps of:

  • extracting first estimates of the resistance of each of a first plurality of nets in the integrated circuit;

    extracting first estimates of the capacitance of each of the first plurality of nets in the integrated circuit;

    determining for each of the first plurality of nets, a respective maximum delay model that attributes all of the first estimate of the resistance of the respective net to a front-end of the net and all of the first estimate of the capacitance of the respective net to a back-end of the net;

    determining for each of the first plurality of nets, a respective minimum delay model that attributes all of the first estimate of the resistance of the respective net to the back-end of the net and all of the first estimate of the capacitance of the respective net to a front-end of the net;

    determining based on the minimum and maximum delay models of each of the first plurality of nets, a second plurality of nets in the integrated circuit which require more accurate modeling; and

    modeling each of the second plurality of nets as a respective distributed RC network.

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