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Multiple detecting apparatus for physical phenomenon and/or chemical phenomenon

  • US 6,294,133 B1
  • Filed: 01/12/1999
  • Issued: 09/25/2001
  • Est. Priority Date: 01/14/1998
  • Status: Expired due to Fees
First Claim
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1. A detector assembly for detecting a plurality of different properties in a sample, comprising:

  • a semiconductor substrate;

    a first detector unit on the substrate for measuring a first property of the sample; and

    a second detector unit on the substrate for measuring a second property of the sample, each of the first detector unit and second detector unit share a common sensor element and provide electrical charge output signals representative of respectively the first property and the second property.

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